{"id":"https://openalex.org/W2109508018","doi":"https://doi.org/10.1109/test.2002.1041783","title":"A new algorithm for global fault collapsing into equivalence and dominance sets","display_name":"A new algorithm for global fault collapsing into equivalence and dominance sets","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W2109508018","doi":"https://doi.org/10.1109/test.2002.1041783","mag":"2109508018"},"language":"en","primary_location":{"id":"doi:10.1109/test.2002.1041783","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041783","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040353563","display_name":"A.V.S.S. Prasad","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"A.V.S.S. Prasad","raw_affiliation_strings":["Agere Systems, Bangalore, India","Agere Syst., Bangalore, India"],"affiliations":[{"raw_affiliation_string":"Agere Systems, Bangalore, India","institution_ids":[]},{"raw_affiliation_string":"Agere Syst., Bangalore, India","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084081268","display_name":"Vishwani D. Agrawal","orcid":"https://orcid.org/0000-0002-7121-5979"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"V.D. Agrawal","raw_affiliation_strings":["Agere Systems, Murray Hill, NJ, USA","Agere Syst., Bangalore, India"],"affiliations":[{"raw_affiliation_string":"Agere Systems, Murray Hill, NJ, USA","institution_ids":[]},{"raw_affiliation_string":"Agere Syst., Bangalore, India","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5012847569","display_name":"Medha Atre","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"M.V. Atre","raw_affiliation_strings":["Agere Systems, Bangalore, India","Agere Syst., Bangalore, India"],"affiliations":[{"raw_affiliation_string":"Agere Systems, Bangalore, India","institution_ids":[]},{"raw_affiliation_string":"Agere Syst., Bangalore, India","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5040353563"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":5.0309,"has_fulltext":false,"cited_by_count":50,"citation_normalized_percentile":{"value":0.9560643,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"391","last_page":"397"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transitive-closure","display_name":"Transitive closure","score":0.7000991106033325},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5104449987411499},{"id":"https://openalex.org/keywords/equivalence","display_name":"Equivalence (formal languages)","score":0.4748687446117401},{"id":"https://openalex.org/keywords/graph","display_name":"Graph","score":0.4745284616947174},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.44637545943260193},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.4368303716182709},{"id":"https://openalex.org/keywords/directed-graph","display_name":"Directed graph","score":0.43372589349746704},{"id":"https://openalex.org/keywords/discrete-mathematics","display_name":"Discrete mathematics","score":0.4318067133426666},{"id":"https://openalex.org/keywords/transitive-relation","display_name":"Transitive relation","score":0.41948771476745605},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.37273573875427246},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.3467039465904236},{"id":"https://openalex.org/keywords/combinatorics","display_name":"Combinatorics","score":0.3395078182220459}],"concepts":[{"id":"https://openalex.org/C128896722","wikidata":"https://www.wikidata.org/wiki/Q1501387","display_name":"Transitive closure","level":2,"score":0.7000991106033325},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5104449987411499},{"id":"https://openalex.org/C2780069185","wikidata":"https://www.wikidata.org/wiki/Q7977945","display_name":"Equivalence (formal languages)","level":2,"score":0.4748687446117401},{"id":"https://openalex.org/C132525143","wikidata":"https://www.wikidata.org/wiki/Q141488","display_name":"Graph","level":2,"score":0.4745284616947174},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.44637545943260193},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.4368303716182709},{"id":"https://openalex.org/C146380142","wikidata":"https://www.wikidata.org/wiki/Q1137726","display_name":"Directed graph","level":2,"score":0.43372589349746704},{"id":"https://openalex.org/C118615104","wikidata":"https://www.wikidata.org/wiki/Q121416","display_name":"Discrete mathematics","level":1,"score":0.4318067133426666},{"id":"https://openalex.org/C191399111","wikidata":"https://www.wikidata.org/wiki/Q64861","display_name":"Transitive relation","level":2,"score":0.41948771476745605},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.37273573875427246},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.3467039465904236},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.3395078182220459}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2002.1041783","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041783","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W168622005","https://openalex.org/W1595368737","https://openalex.org/W1655990431","https://openalex.org/W1938017208","https://openalex.org/W2083807469","https://openalex.org/W2135931142","https://openalex.org/W2148757937","https://openalex.org/W2753176400","https://openalex.org/W3019365222","https://openalex.org/W4230587734","https://openalex.org/W4302458519","https://openalex.org/W4376851360","https://openalex.org/W6606768204"],"related_works":["https://openalex.org/W1553139688","https://openalex.org/W2371151875","https://openalex.org/W2136009070","https://openalex.org/W2362009423","https://openalex.org/W2391133415","https://openalex.org/W2012063573","https://openalex.org/W2123627450","https://openalex.org/W1982015164","https://openalex.org/W203725150","https://openalex.org/W4230967508"],"abstract_inverted_index":{"Nodes":[0],"in":[1,67,91],"a":[2,8,92],"dominance":[3,61],"graph":[4,93],"represent":[5],"faults":[6,32],"of":[7,31,43,81,118,132],"circuit.":[9],"A":[10],"directed":[11],"edge":[12],"from":[13],"node":[14,18],"f/sub":[15,19,24,27,33,36,46,50,53,57],"i/":[16,34,47],"to":[17,128],"j/":[20,25,37,51,54],"means":[21],"that":[22,112],"fault":[23,76,79,97,104,134],"dominates":[26],"i/.":[28,58],"The":[29],"equivalence":[30,63],"and":[35,52,62,84,124],"is":[38],"indicated":[39],"by":[40,108,116],"the":[41,74,130],"presence":[42],"simultaneous":[44],"edges":[45],"/spl":[48,55],"rarr/":[49,56],"When":[59],"local":[60],"relations":[64],"are":[65,106,126],"included":[66],"this":[68],"graph,":[69],"its":[70],"transitive":[71],"closure":[72],"provides":[73],"collapsed":[75],"sets.":[77],"Pre-collapsed":[78],"sets":[80,105],"standard":[82],"cells":[83],"other":[85],"logic":[86],"blocks":[87],"can":[88,113],"be":[89,114],"stored":[90],"library":[94],"for":[95],"hierarchical":[96],"collapsing.":[98],"Examples":[99],"show":[100],"how":[101],"more":[102],"compact":[103],"obtained":[107],"using":[109],"functional":[110,133],"equivalences":[111],"found":[115],"analysis":[117],"small":[119],"cells.":[120,139],"Benchmark":[121],"circuits":[122],"c432":[123],"c499":[125],"used":[127],"illustrate":[129],"use":[131],"collapsing":[135],"within":[136],"their":[137],"exclusive-OR":[138]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":5},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}