{"id":"https://openalex.org/W1943460993","doi":"https://doi.org/10.1109/test.2002.1041759","title":"On-chip repair and an ATE independent fusing methodology","display_name":"On-chip repair and an ATE independent fusing methodology","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W1943460993","doi":"https://doi.org/10.1109/test.2002.1041759","mag":"1943460993"},"language":"en","primary_location":{"id":"doi:10.1109/test.2002.1041759","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041759","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5076843867","display_name":"B. Cowan","orcid":null},"institutions":[{"id":"https://openalex.org/I32062511","display_name":"Heriot-Watt University","ror":"https://ror.org/04mghma93","country_code":"GB","type":"education","lineage":["https://openalex.org/I32062511"]},{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["GB","US"],"is_corresponding":true,"raw_author_name":"B. Cowan","raw_affiliation_strings":["Department of Physics, Heriot-Watt University, Edinburgh, UK","IBM, Essex Junction, VT, USA#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Physics, Heriot-Watt University, Edinburgh, UK","institution_ids":["https://openalex.org/I32062511"]},{"raw_affiliation_string":"IBM, Essex Junction, VT, USA#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049666459","display_name":"O. Farnsworth","orcid":null},"institutions":[{"id":"https://openalex.org/I4210134083","display_name":"Essex Westford School District","ror":"https://ror.org/03ze2q110","country_code":"US","type":"education","lineage":["https://openalex.org/I4210134083"]},{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"O. Farnsworth","raw_affiliation_strings":["Essex Junction, IBM, VT, USA","IBM, Essex Junction, VT, USA#TAB#"],"affiliations":[{"raw_affiliation_string":"Essex Junction, IBM, VT, USA","institution_ids":["https://openalex.org/I4210134083"]},{"raw_affiliation_string":"IBM, Essex Junction, VT, USA#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070477651","display_name":"P. Jakobsen","orcid":"https://orcid.org/0000-0002-6780-2441"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210134083","display_name":"Essex Westford School District","ror":"https://ror.org/03ze2q110","country_code":"US","type":"education","lineage":["https://openalex.org/I4210134083"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P. Jakobsen","raw_affiliation_strings":["Essex Junction, IBM, VT, USA","IBM, Essex Junction, VT, USA#TAB#"],"affiliations":[{"raw_affiliation_string":"Essex Junction, IBM, VT, USA","institution_ids":["https://openalex.org/I4210134083"]},{"raw_affiliation_string":"IBM, Essex Junction, VT, USA#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031569243","display_name":"S.F. Oakland","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210134083","display_name":"Essex Westford School District","ror":"https://ror.org/03ze2q110","country_code":"US","type":"education","lineage":["https://openalex.org/I4210134083"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. Oakland","raw_affiliation_strings":["Essex Junction, IBM, VT, USA","IBM, Essex Junction, VT, USA#TAB#"],"affiliations":[{"raw_affiliation_string":"Essex Junction, IBM, VT, USA","institution_ids":["https://openalex.org/I4210134083"]},{"raw_affiliation_string":"IBM, Essex Junction, VT, USA#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020892804","display_name":"M.R. Ouellette","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210134083","display_name":"Essex Westford School District","ror":"https://ror.org/03ze2q110","country_code":"US","type":"education","lineage":["https://openalex.org/I4210134083"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M.R. Ouellette","raw_affiliation_strings":["Essex Junction, IBM, VT, USA","IBM, Essex Junction, VT, USA#TAB#"],"affiliations":[{"raw_affiliation_string":"Essex Junction, IBM, VT, USA","institution_ids":["https://openalex.org/I4210134083"]},{"raw_affiliation_string":"IBM, Essex Junction, VT, USA#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063681732","display_name":"D.L. Wheater","orcid":null},"institutions":[{"id":"https://openalex.org/I230495080","display_name":"University of Limerick","ror":"https://ror.org/00a0n9e72","country_code":"IE","type":"education","lineage":["https://openalex.org/I230495080"]},{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["IE","US"],"is_corresponding":false,"raw_author_name":"D.L. Wheater","raw_affiliation_strings":["ECE Department, University of Limer Casteltroy, Limerick, Ireland","IBM, Essex Junction, VT, USA#TAB#"],"affiliations":[{"raw_affiliation_string":"ECE Department, University of Limer Casteltroy, Limerick, Ireland","institution_ids":["https://openalex.org/I230495080"]},{"raw_affiliation_string":"IBM, Essex Junction, VT, USA#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5076843867"],"corresponding_institution_ids":["https://openalex.org/I1341412227","https://openalex.org/I32062511"],"apc_list":null,"apc_paid":null,"fwci":1.7608,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.84997565,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"178","last_page":"186"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/application-specific-integrated-circuit","display_name":"Application-specific integrated circuit","score":0.7249545454978943},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6715989112854004},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.6500453948974609},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.597196638584137},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5765894651412964},{"id":"https://openalex.org/keywords/fuse","display_name":"Fuse (electrical)","score":0.5218366980552673},{"id":"https://openalex.org/keywords/system-testing","display_name":"System testing","score":0.4435507655143738},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.34801822900772095},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.28598886728286743},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.08017313480377197},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.07811316847801208}],"concepts":[{"id":"https://openalex.org/C77390884","wikidata":"https://www.wikidata.org/wiki/Q217302","display_name":"Application-specific integrated circuit","level":2,"score":0.7249545454978943},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6715989112854004},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.6500453948974609},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.597196638584137},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5765894651412964},{"id":"https://openalex.org/C141353440","wikidata":"https://www.wikidata.org/wiki/Q182221","display_name":"Fuse (electrical)","level":2,"score":0.5218366980552673},{"id":"https://openalex.org/C7166840","wikidata":"https://www.wikidata.org/wiki/Q1199682","display_name":"System testing","level":2,"score":0.4435507655143738},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.34801822900772095},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.28598886728286743},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08017313480377197},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.07811316847801208},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2002.1041759","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041759","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.4000000059604645,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1595937667","https://openalex.org/W2150714491","https://openalex.org/W2169094349","https://openalex.org/W2460195718","https://openalex.org/W6635700176","https://openalex.org/W6684430325"],"related_works":["https://openalex.org/W2368609622","https://openalex.org/W4395090620","https://openalex.org/W2290315036","https://openalex.org/W1828239946","https://openalex.org/W2065289416","https://openalex.org/W2017236304","https://openalex.org/W2136854845","https://openalex.org/W4402811721","https://openalex.org/W1978040115","https://openalex.org/W2128848828"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"a":[3,22],"novel":[4],"on":[5,14,31],"chip":[6,32],"repair":[7,40,50,66],"system":[8,29,61],"designed":[9],"for":[10,52],"ATE":[11],"independent":[12],"application":[13],"many":[15],"unique":[16],"very":[17],"dense":[18],"ASIC":[19],"devices":[20],"in":[21],"high":[23],"turnover":[24],"environment.":[25],"During":[26],"test,":[27],"the":[28,49,65,72,75],"controls":[30],"built-in":[33],"self-test":[34],"(BIST)":[35],"engines,":[36],"collects":[37],"and":[38,44,47,63],"compresses":[39],"data,":[41],"programs":[42],"fuses":[43],"finally":[45],"decompresses":[46,62],"reloads":[48],"data":[51,67],"post":[53],"fuse":[54],"testing.":[55],"In":[56],"end":[57],"use":[58],"applications":[59],"this":[60],"loads":[64],"at":[68,71],"power-up":[69],"or":[70],"request":[73],"of":[74],"system.":[76]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}