{"id":"https://openalex.org/W2146210365","doi":"https://doi.org/10.1109/test.1994.527937","title":"MicroSPARC: a case-study of scan based debug","display_name":"MicroSPARC: a case-study of scan based debug","publication_year":2002,"publication_date":"2002-12-17","ids":{"openalex":"https://openalex.org/W2146210365","doi":"https://doi.org/10.1109/test.1994.527937","mag":"2146210365"},"language":"en","primary_location":{"id":"doi:10.1109/test.1994.527937","doi":"https://doi.org/10.1109/test.1994.527937","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.1994.527937","pdf_url":null,"source":{"id":"https://openalex.org/S4210209697","display_name":"Proceedings/Proceedings - International Test Conference","issn_l":"1089-3539","issn":["1089-3539","2378-2250"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings., International Test Conference","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052205396","display_name":"K. Holdbrook","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"K. Holdbrook","raw_affiliation_strings":["Sun MicroSystems, Inc.orporated, Mountain View, CA, USA","Sun Microsyst. Inc., Mountain View, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sun MicroSystems, Inc.orporated, Mountain View, CA, USA","institution_ids":[]},{"raw_affiliation_string":"Sun Microsyst. Inc., Mountain View, CA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":null,"display_name":"S. Joshi","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"S. Joshi","raw_affiliation_strings":["Sun MicroSystems, Inc.orporated, Mountain View, CA, USA","Sun Microsyst. Inc., Mountain View, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sun MicroSystems, Inc.orporated, Mountain View, CA, USA","institution_ids":[]},{"raw_affiliation_string":"Sun Microsyst. Inc., Mountain View, CA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058480142","display_name":"S. Mitra","orcid":"https://orcid.org/0009-0001-6977-9505","observed_orcids":["https://orcid.org/0009-0001-6977-9505"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"S. Mitra","raw_affiliation_strings":["Sun MicroSystems, Inc.orporated, Mountain View, CA, USA","Sun Microsyst. Inc., Mountain View, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sun MicroSystems, Inc.orporated, Mountain View, CA, USA","institution_ids":[]},{"raw_affiliation_string":"Sun Microsyst. Inc., Mountain View, CA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037984848","display_name":"Joseph Petolino","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"J. Petolino","raw_affiliation_strings":["Sun MicroSystems, Inc.orporated, Mountain View, CA, USA","Sun Microsyst. Inc., Mountain View, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sun MicroSystems, Inc.orporated, Mountain View, CA, USA","institution_ids":[]},{"raw_affiliation_string":"Sun Microsyst. Inc., Mountain View, CA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060550468","display_name":"Raghavan Raman","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"R. Raman","raw_affiliation_strings":["Sun MicroSystems, Inc.orporated, Mountain View, CA, USA","Sun Microsyst. Inc., Mountain View, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sun MicroSystems, Inc.orporated, Mountain View, CA, USA","institution_ids":[]},{"raw_affiliation_string":"Sun Microsyst. Inc., Mountain View, CA, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":null,"display_name":"M. Wong","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"M. Wong","raw_affiliation_strings":["Sun MicroSystems, Inc.orporated, Mountain View, CA, USA","Sun Microsyst. Inc., Mountain View, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sun MicroSystems, Inc.orporated, Mountain View, CA, USA","institution_ids":[]},{"raw_affiliation_string":"Sun Microsyst. Inc., Mountain View, CA, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.3889,"has_fulltext":false,"cited_by_count":43,"citation_normalized_percentile":{"value":0.93205607,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"70","last_page":"75"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9878000020980835,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9878000020980835,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.0024999999441206455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.0020000000949949026,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/risc-processor","display_name":"RISC processor","score":0.7639999985694885},{"id":"https://openalex.org/keywords/jtag","display_name":"JTAG","score":0.7940000295639038},{"id":"https://openalex.org/keywords/testability","display_name":"testability","score":0.722000002861023},{"id":"https://openalex.org/keywords/parallelism","display_name":"parallelism","score":0.42500001192092896}],"concepts":[{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.8491703271865845},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6996281147003174},{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.6816272735595703},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6481197476387024},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.6276524066925049},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.5243682861328125},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.46547290682792664},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3430848717689514},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23805475234985352},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.19186371564865112},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.17853188514709473}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.1994.527937","doi":"https://doi.org/10.1109/test.1994.527937","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.1994.527937","pdf_url":null,"source":{"id":"https://openalex.org/S4210209697","display_name":"Proceedings/Proceedings - International Test Conference","issn_l":"1089-3539","issn":["1089-3539","2378-2250"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings., International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"sustainable_development_goals_aurora":[{"display_name":"Industry, innovation and infrastructure","score":0.46000000834465027,"id":"https://metadata.un.org/sdg/9"}],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1965344016","https://openalex.org/W2028504835","https://openalex.org/W2034476614","https://openalex.org/W2140891025","https://openalex.org/W2140891446","https://openalex.org/W4248774658"],"related_works":["https://openalex.org/W4321442002","https://openalex.org/W2015265939","https://openalex.org/W2284072287","https://openalex.org/W2611067230","https://openalex.org/W2480201319","https://openalex.org/W2387706296","https://openalex.org/W2155788121","https://openalex.org/W1987313229","https://openalex.org/W2001393705","https://openalex.org/W2357771869"],"abstract_inverted_index":{"MicroSPARC":[0],"is":[1],"a":[2,29,68],"highly":[3],"integrated,":[4],"high":[5],"volume,":[6],"low-cost":[7],"CMOS":[8],"RISC":[9],"microprocessor.":[10],"To":[11],"meet":[12],"the":[13,36,40,78,85,93,97],"design":[14,42],"goals,":[15],"it":[16],"included":[17],"fully":[18],"synchronous":[19],"logic":[20],"with":[21,67,89],"full":[22],"testability":[23],"support,":[24],"using":[25],"scannable":[26],"flops":[27],"and":[28,43,53,61,81],"JTAG-compliant":[30],"clock":[31],"controller.":[32],"This":[33],"paper":[34,65,75],"describes":[35,77],"key":[37],"features":[38],"of":[39,70,96],"scan":[41],"how":[44],"they":[45],"were":[46],"used":[47,80],"to":[48],"maximize":[49],"parallelism":[50],"in":[51,59,84],"system":[52],"tester":[54,86],"environments,":[55],"while":[56],"reducing":[57],"bottlenecks":[58],"functional":[60],"timing":[62],"debug.":[63],"The":[64],"concludes":[66],"discussion":[69],"lessons":[71],"learned.":[72],"A":[73],"related":[74],"(1994)":[76],"methodologies":[79],"benefits":[82],"realized":[83],"environment,":[87],"along":[88],"data":[90],"collected":[91],"during":[92],"debug":[94],"phase":[95],"project.":[98]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-10-06T10:28:23.643775","created_date":"2025-10-10T00:00:00"}