{"id":"https://openalex.org/W7130309730","doi":"https://doi.org/10.1109/tencon66050.2025.11375373","title":"Accurate Fault Classification and Location Identification Using Various Machine Learning Models for Self-Healing in Smart Grids","display_name":"Accurate Fault Classification and Location Identification Using Various Machine Learning Models for Self-Healing in Smart Grids","publication_year":2025,"publication_date":"2025-10-27","ids":{"openalex":"https://openalex.org/W7130309730","doi":"https://doi.org/10.1109/tencon66050.2025.11375373"},"language":null,"primary_location":{"id":"doi:10.1109/tencon66050.2025.11375373","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tencon66050.2025.11375373","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"TENCON 2025 - 2025 IEEE Region 10 Conference (TENCON)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5126326326","display_name":"P. Swati Patro","orcid":null},"institutions":[{"id":"https://openalex.org/I4210101034","display_name":"Birla Institute of Technology and Science - Hyderabad Campus","ror":"https://ror.org/014ctt859","country_code":"IN","type":"education","lineage":["https://openalex.org/I4210101034","https://openalex.org/I74796645"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"P. Swati Patro","raw_affiliation_strings":["BITS Pilani, Hyderabad campus,Electrical and Electronics Engineering,Hyderabad,India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"BITS Pilani, Hyderabad campus,Electrical and Electronics Engineering,Hyderabad,India","institution_ids":["https://openalex.org/I4210101034"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065384387","display_name":"N. Praneeth","orcid":"https://orcid.org/0000-0002-3789-3549"},"institutions":[{"id":"https://openalex.org/I4210101034","display_name":"Birla Institute of Technology and Science - Hyderabad Campus","ror":"https://ror.org/014ctt859","country_code":"IN","type":"education","lineage":["https://openalex.org/I4210101034","https://openalex.org/I74796645"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"N Praneeth","raw_affiliation_strings":["BITS Pilani, Hyderabad campus,Electrical and Electronics Engineering,Hyderabad,India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"BITS Pilani, Hyderabad campus,Electrical and Electronics Engineering,Hyderabad,India","institution_ids":["https://openalex.org/I4210101034"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103914726","display_name":"Stp Srinivas","orcid":null},"institutions":[{"id":"https://openalex.org/I4210101034","display_name":"Birla Institute of Technology and Science - Hyderabad Campus","ror":"https://ror.org/014ctt859","country_code":"IN","type":"education","lineage":["https://openalex.org/I4210101034","https://openalex.org/I74796645"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"STP Srinivas","raw_affiliation_strings":["BITS Pilani, Hyderabad campus,Electrical and Electronics Engineering,Hyderabad,India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"BITS Pilani, Hyderabad campus,Electrical and Electronics Engineering,Hyderabad,India","institution_ids":["https://openalex.org/I4210101034"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210101034"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.71247811,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"855","last_page":"859"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9351000189781189,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9351000189781189,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.017500000074505806,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13183","display_name":"Islanding Detection in Power Systems","score":0.011900000274181366,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6254000067710876},{"id":"https://openalex.org/keywords/smart-grid","display_name":"Smart grid","score":0.6200000047683716},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5101000070571899},{"id":"https://openalex.org/keywords/electric-power-system","display_name":"Electric power system","score":0.5055000185966492},{"id":"https://openalex.org/keywords/feed-forward","display_name":"Feed forward","score":0.48260000348091125},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.45170000195503235},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.3955000042915344},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.3901999890804291},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.3790999948978424}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6254000067710876},{"id":"https://openalex.org/C10558101","wikidata":"https://www.wikidata.org/wiki/Q689855","display_name":"Smart grid","level":2,"score":0.6200000047683716},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.5662999749183655},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5249000191688538},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5101000070571899},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.5055000185966492},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4986000061035156},{"id":"https://openalex.org/C38858127","wikidata":"https://www.wikidata.org/wiki/Q5441228","display_name":"Feed forward","level":2,"score":0.48260000348091125},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.45170000195503235},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.43709999322891235},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.3955000042915344},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.3901999890804291},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.3790999948978424},{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.35600000619888306},{"id":"https://openalex.org/C151406439","wikidata":"https://www.wikidata.org/wiki/Q186588","display_name":"Time series","level":2,"score":0.34630000591278076},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.34290000796318054},{"id":"https://openalex.org/C187691185","wikidata":"https://www.wikidata.org/wiki/Q2020720","display_name":"Grid","level":2,"score":0.34220001101493835},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.3418999910354614},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3215999901294708},{"id":"https://openalex.org/C47702885","wikidata":"https://www.wikidata.org/wiki/Q5441227","display_name":"Feedforward neural network","level":3,"score":0.30720001459121704},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.30239999294281006},{"id":"https://openalex.org/C24574437","wikidata":"https://www.wikidata.org/wiki/Q7135228","display_name":"Parametric model","level":3,"score":0.30000001192092896},{"id":"https://openalex.org/C67186912","wikidata":"https://www.wikidata.org/wiki/Q367664","display_name":"Data modeling","level":2,"score":0.2849999964237213},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.2768999934196472},{"id":"https://openalex.org/C169258074","wikidata":"https://www.wikidata.org/wiki/Q245748","display_name":"Random forest","level":2,"score":0.274399995803833},{"id":"https://openalex.org/C45804977","wikidata":"https://www.wikidata.org/wiki/Q7239673","display_name":"Predictive modelling","level":2,"score":0.27309998869895935},{"id":"https://openalex.org/C119247159","wikidata":"https://www.wikidata.org/wiki/Q1366192","display_name":"System identification","level":3,"score":0.2662999927997589},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2639000117778778}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tencon66050.2025.11375373","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tencon66050.2025.11375373","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"TENCON 2025 - 2025 IEEE Region 10 Conference (TENCON)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1712273250","https://openalex.org/W2163463221","https://openalex.org/W2981838212","https://openalex.org/W3140660742","https://openalex.org/W3147059732","https://openalex.org/W3184571638","https://openalex.org/W4205556238","https://openalex.org/W4205836245","https://openalex.org/W4226054541","https://openalex.org/W4360995877","https://openalex.org/W4380537703","https://openalex.org/W4399526530","https://openalex.org/W4403127437","https://openalex.org/W4407938638"],"related_works":[],"abstract_inverted_index":{"Parametric":[0],"monitoring":[1],"using":[2,72],"machine":[3,121],"learning":[4,122],"techniques":[5],"offers":[6],"a":[7],"promising":[8],"solution":[9],"for":[10,61],"accurately":[11],"detecting":[12],"and":[13,23,45,56,66,86,98,104,112,131,141,152],"classifying":[14],"faults":[15],"in":[16,36,68,83,136,157,162],"electric":[17],"power":[18,69,164],"grids,":[19],"providing":[20],"greater":[21],"precision":[22],"efficiency":[24],"than":[25],"traditional":[26],"methods":[27],"while":[28],"supporting":[29,158],"the":[30,43,73,150],"development":[31],"of":[32,47,95,138,154],"resilient,":[33],"self-healing":[34],"systems":[35],"smart":[37],"grid":[38],"environments.":[39],"This":[40],"paper":[41],"evaluates":[42],"applicability":[44],"performance":[46],"decision":[48],"tree,":[49],"random":[50],"forest,":[51],"XGBoost,":[52],"feedforward":[53],"neural":[54],"networks,":[55],"long":[57],"short-term":[58],"memory":[59],"models":[60,123],"real-time":[62],"fault":[63,110,160],"detection,":[64],"classification,":[65],"localization":[67],"system":[70,80],"protection":[71],"IEEE":[74],"9-bus":[75],"test":[76,79],"system.":[77],"The":[78,120,144],"is":[81,88,134],"designed":[82],"DIgSILENT":[84],"PowerFactory,":[85],"data":[87],"obtained":[89],"from":[90],"electromagnetic":[91],"transient":[92],"(EMT)":[93],"simulations":[94],"three-phase":[96],"voltage":[97],"current":[99],"signals":[100],"under":[101],"both":[102],"prefault":[103],"post-fault":[105],"conditions.":[106],"Various":[107],"short":[108],"circuit":[109],"types":[111],"locations":[113],"are":[114,124],"considered":[115],"to":[116],"enhance":[117],"model":[118,156],"generalization.":[119],"trained":[125],"on":[126],"these":[127],"EMT":[128],"timeseries":[129],"signals,":[130],"their":[132],"effectiveness":[133],"analyzed":[135],"terms":[137],"accuracy,":[139],"robustness,":[140],"computational":[142],"efficiency.":[143],"results":[145],"offer":[146],"valuable":[147],"insights":[148],"into":[149],"capabilities":[151],"limitations":[153],"each":[155],"intelligent":[159],"management":[161],"modern":[163],"systems.":[165]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2026-02-19T00:00:00"}