{"id":"https://openalex.org/W7130346416","doi":"https://doi.org/10.1109/tencon66050.2025.11375102","title":"Real-Time Fabric Defect Detection System Using Yolov8","display_name":"Real-Time Fabric Defect Detection System Using Yolov8","publication_year":2025,"publication_date":"2025-10-27","ids":{"openalex":"https://openalex.org/W7130346416","doi":"https://doi.org/10.1109/tencon66050.2025.11375102"},"language":null,"primary_location":{"id":"doi:10.1109/tencon66050.2025.11375102","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tencon66050.2025.11375102","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"TENCON 2025 - 2025 IEEE Region 10 Conference (TENCON)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5126351023","display_name":"P. Kaythry","orcid":null},"institutions":[{"id":"https://openalex.org/I916357946","display_name":"Sri Sivasubramaniya Nadar College of Engineering","ror":"https://ror.org/054psm803","country_code":"IN","type":"education","lineage":["https://openalex.org/I916357946"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"P. Kaythry","raw_affiliation_strings":["Sri Sivasubramaniya Nadar College of Engineering,Department of Electronics and Communication Engineering,Chennai,India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sri Sivasubramaniya Nadar College of Engineering,Department of Electronics and Communication Engineering,Chennai,India","institution_ids":["https://openalex.org/I916357946"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5126349319","display_name":"Swetha A","orcid":null},"institutions":[{"id":"https://openalex.org/I916357946","display_name":"Sri Sivasubramaniya Nadar College of Engineering","ror":"https://ror.org/054psm803","country_code":"IN","type":"education","lineage":["https://openalex.org/I916357946"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Swetha A","raw_affiliation_strings":["Sri Sivasubramaniya Nadar College of Engineering,Department of Electronics and Communication Engineering,Chennai,India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sri Sivasubramaniya Nadar College of Engineering,Department of Electronics and Communication Engineering,Chennai,India","institution_ids":["https://openalex.org/I916357946"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5126340580","display_name":"Shree Varshini N","orcid":null},"institutions":[{"id":"https://openalex.org/I916357946","display_name":"Sri Sivasubramaniya Nadar College of Engineering","ror":"https://ror.org/054psm803","country_code":"IN","type":"education","lineage":["https://openalex.org/I916357946"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Shree Varshini N","raw_affiliation_strings":["Sri Sivasubramaniya Nadar College of Engineering,Department of Electronics and Communication Engineering,Chennai,India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sri Sivasubramaniya Nadar College of Engineering,Department of Electronics and Communication Engineering,Chennai,India","institution_ids":["https://openalex.org/I916357946"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I916357946"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.72420396,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"170","last_page":"174"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.8859000205993652,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.8859000205993652,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11595","display_name":"Textile materials and evaluations","score":0.06440000236034393,"subfield":{"id":"https://openalex.org/subfields/2507","display_name":"Polymers and Plastics"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.011800000444054604,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.6312999725341797},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.5846999883651733},{"id":"https://openalex.org/keywords/product","display_name":"Product (mathematics)","score":0.5302000045776367},{"id":"https://openalex.org/keywords/consistency","display_name":"Consistency (knowledge bases)","score":0.5066999793052673},{"id":"https://openalex.org/keywords/manufacturing-process","display_name":"Manufacturing process","score":0.37549999356269836},{"id":"https://openalex.org/keywords/pressing","display_name":"Pressing","score":0.32249999046325684}],"concepts":[{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6312999725341797},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.5846999883651733},{"id":"https://openalex.org/C90673727","wikidata":"https://www.wikidata.org/wiki/Q901718","display_name":"Product (mathematics)","level":2,"score":0.5302000045776367},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5199000239372253},{"id":"https://openalex.org/C2776436953","wikidata":"https://www.wikidata.org/wiki/Q5163215","display_name":"Consistency (knowledge bases)","level":2,"score":0.5066999793052673},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.45329999923706055},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.38109999895095825},{"id":"https://openalex.org/C2987875673","wikidata":"https://www.wikidata.org/wiki/Q187939","display_name":"Manufacturing process","level":2,"score":0.37549999356269836},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.3228999972343445},{"id":"https://openalex.org/C93021684","wikidata":"https://www.wikidata.org/wiki/Q3816735","display_name":"Pressing","level":2,"score":0.32249999046325684},{"id":"https://openalex.org/C164767435","wikidata":"https://www.wikidata.org/wiki/Q28823","display_name":"Textile","level":2,"score":0.32019999623298645},{"id":"https://openalex.org/C2780598303","wikidata":"https://www.wikidata.org/wiki/Q65921492","display_name":"Flexibility (engineering)","level":2,"score":0.3174000084400177},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.2906999886035919},{"id":"https://openalex.org/C19351080","wikidata":"https://www.wikidata.org/wiki/Q1395034","display_name":"New product development","level":2,"score":0.28049999475479126},{"id":"https://openalex.org/C5339829","wikidata":"https://www.wikidata.org/wiki/Q1425977","display_name":"Machine vision","level":2,"score":0.27459999918937683},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.26589998602867126},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.2603999972343445}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tencon66050.2025.11375102","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tencon66050.2025.11375102","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"TENCON 2025 - 2025 IEEE Region 10 Conference (TENCON)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.46392661333084106,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W2899016840","https://openalex.org/W2904092989","https://openalex.org/W3199091160","https://openalex.org/W4205763372","https://openalex.org/W4210889182","https://openalex.org/W4386105244","https://openalex.org/W4390419129"],"related_works":[],"abstract_inverted_index":{"Fabric":[0],"defect":[1],"detection":[2],"represents":[3],"an":[4],"essential":[5],"and":[6,21,43,57,84,92,115,144],"pivotal":[7],"process":[8],"within":[9],"the":[10,28,74,119,124,135,148],"textile":[11],"industry,":[12],"which":[13,98],"is":[14],"fundamental":[15],"for":[16],"guaranteeing":[17],"both":[18],"product":[19],"quality":[20,110],"consistency":[22],"across":[23],"various":[24],"manufacturing":[25,120],"outputs.":[26],"Nevertheless,":[27],"traditional":[29,149],"methods":[30],"of":[31,95,104,113],"manual":[32],"inspection":[33],"that":[34,72],"have":[35],"been":[36],"employed":[37],"historically":[38],"are":[39],"not":[40],"only":[41],"labor-intensive":[42],"time-consuming":[44],"but":[45],"also":[46],"inherently":[47],"subjective,":[48],"thus":[49],"making":[50],"them":[51],"highly":[52],"susceptible":[53],"to":[54,61,81,147],"human":[55],"error":[56],"misjudgment.":[58],"In":[59],"response":[60],"these":[62,86,132],"significant":[63],"challenges,":[64],"this":[65],"study":[66],"presents":[67],"a":[68,102,141],"machine":[69,107],"learning":[70],"approach":[71],"utilizes":[73],"You":[75],"Look":[76],"Only":[77],"Once":[78],"model":[79,138],"(YOLO)":[80],"effectively":[82],"tackle":[83],"ameliorate":[85],"pressing":[87],"issues.":[88],"The":[89],"intricate":[90],"nature":[91],"vast":[93],"diversity":[94],"fabric":[96],"defects,":[97],"can":[99],"arise":[100],"from":[101],"multitude":[103],"factors":[105],"including":[106],"malfunctions,":[108],"inferior":[109],"yarns,":[111],"spoilage":[112],"materials,":[114],"excessive":[116],"stretching":[117],"during":[118],"process,":[121],"greatly":[122],"exacerbate":[123],"challenges":[125],"associated":[126],"with":[127],"accurate":[128],"detection.":[129],"To":[130],"overcome":[131],"formidable":[133],"obstacles,":[134],"proposed":[136],"YOLO":[137],"serves":[139],"as":[140],"more":[142],"efficient":[143],"precise":[145],"alternative":[146],"inspection.":[150]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2026-02-19T00:00:00"}