{"id":"https://openalex.org/W7130388174","doi":"https://doi.org/10.1109/tencon66050.2025.11374996","title":"Early Detection of Internal Short Circuit in Lithium Ion Battery Using Time-Frequency Analysis","display_name":"Early Detection of Internal Short Circuit in Lithium Ion Battery Using Time-Frequency Analysis","publication_year":2025,"publication_date":"2025-10-27","ids":{"openalex":"https://openalex.org/W7130388174","doi":"https://doi.org/10.1109/tencon66050.2025.11374996"},"language":null,"primary_location":{"id":"doi:10.1109/tencon66050.2025.11374996","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tencon66050.2025.11374996","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"TENCON 2025 - 2025 IEEE Region 10 Conference (TENCON)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5126308773","display_name":"Anup Appasaheb Kshirsagar","orcid":null},"institutions":[{"id":"https://openalex.org/I141243467","display_name":"Chang Gung University of Science and Technology","ror":"https://ror.org/009knm296","country_code":"TW","type":"education","lineage":["https://openalex.org/I141243467"]},{"id":"https://openalex.org/I4210119464","display_name":"Quality and Reliability (Greece)","ror":"https://ror.org/02f8mda22","country_code":"GR","type":"company","lineage":["https://openalex.org/I4210119464"]}],"countries":["GR","TW"],"is_corresponding":false,"raw_author_name":"Anup Appasaheb Kshirsagar","raw_affiliation_strings":["Chang Gung University,Center for Reliability Science and Technology"],"raw_orcid":"https://orcid.org/0009-0000-8686-0391","affiliations":[{"raw_affiliation_string":"Chang Gung University,Center for Reliability Science and Technology","institution_ids":["https://openalex.org/I141243467","https://openalex.org/I4210119464"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045004316","display_name":"Cher Ming Tan","orcid":"https://orcid.org/0000-0002-6330-3899"},"institutions":[{"id":"https://openalex.org/I141243467","display_name":"Chang Gung University of Science and Technology","ror":"https://ror.org/009knm296","country_code":"TW","type":"education","lineage":["https://openalex.org/I141243467"]},{"id":"https://openalex.org/I4210119464","display_name":"Quality and Reliability (Greece)","ror":"https://ror.org/02f8mda22","country_code":"GR","type":"company","lineage":["https://openalex.org/I4210119464"]}],"countries":["GR","TW"],"is_corresponding":false,"raw_author_name":"Cher Ming Tan","raw_affiliation_strings":["Chang Gung University,Center for Reliability Science and Technology"],"raw_orcid":"https://orcid.org/0000-0002-6330-3899","affiliations":[{"raw_affiliation_string":"Chang Gung University,Center for Reliability Science and Technology","institution_ids":["https://openalex.org/I141243467","https://openalex.org/I4210119464"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102076029","display_name":"S. I. Jeng","orcid":null},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Shuen-Lin Jeng","raw_affiliation_strings":["Institute of Data Science, National Cheng Kung University,Department of Statistics,Tainan,Taiwan"],"raw_orcid":"https://orcid.org/0000-0003-2803-5881","affiliations":[{"raw_affiliation_string":"Institute of Data Science, National Cheng Kung University,Department of Statistics,Tainan,Taiwan","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5126298303","display_name":"Jithendra Mani Kumar Kommuru","orcid":null},"institutions":[{"id":"https://openalex.org/I141243467","display_name":"Chang Gung University of Science and Technology","ror":"https://ror.org/009knm296","country_code":"TW","type":"education","lineage":["https://openalex.org/I141243467"]},{"id":"https://openalex.org/I4210119464","display_name":"Quality and Reliability (Greece)","ror":"https://ror.org/02f8mda22","country_code":"GR","type":"company","lineage":["https://openalex.org/I4210119464"]}],"countries":["GR","TW"],"is_corresponding":false,"raw_author_name":"Jithendra Mani Kumar Kommuru","raw_affiliation_strings":["Chang Gung University,Center for Reliability Science and Technology"],"raw_orcid":"https://orcid.org/0009-0009-8947-9436","affiliations":[{"raw_affiliation_string":"Chang Gung University,Center for Reliability Science and Technology","institution_ids":["https://openalex.org/I141243467","https://openalex.org/I4210119464"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.69657522,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"623","last_page":"627"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10018","display_name":"Advancements in Battery Materials","score":0.0010999999940395355,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.0007999999797903001,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6721000075340271},{"id":"https://openalex.org/keywords/battery","display_name":"Battery (electricity)","score":0.5942000150680542},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5572999715805054},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.5277000069618225},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.5013999938964844},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4796999990940094},{"id":"https://openalex.org/keywords/warning-system","display_name":"Warning system","score":0.4586000144481659},{"id":"https://openalex.org/keywords/energy","display_name":"Energy (signal processing)","score":0.4578999876976013},{"id":"https://openalex.org/keywords/short-circuit","display_name":"Short circuit","score":0.44749999046325684}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.675599992275238},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6721000075340271},{"id":"https://openalex.org/C555008776","wikidata":"https://www.wikidata.org/wiki/Q267298","display_name":"Battery (electricity)","level":3,"score":0.5942000150680542},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5572999715805054},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.5277000069618225},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.5013999938964844},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4796999990940094},{"id":"https://openalex.org/C29825287","wikidata":"https://www.wikidata.org/wiki/Q1427940","display_name":"Warning system","level":2,"score":0.4586000144481659},{"id":"https://openalex.org/C186370098","wikidata":"https://www.wikidata.org/wiki/Q442787","display_name":"Energy (signal processing)","level":2,"score":0.4578999876976013},{"id":"https://openalex.org/C68583231","wikidata":"https://www.wikidata.org/wiki/Q206907","display_name":"Short circuit","level":3,"score":0.44749999046325684},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.414900004863739},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3919000029563904},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.374099999666214},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.366100013256073},{"id":"https://openalex.org/C106945098","wikidata":"https://www.wikidata.org/wiki/Q2527701","display_name":"Internal resistance","level":4,"score":0.3646000027656555},{"id":"https://openalex.org/C25570617","wikidata":"https://www.wikidata.org/wiki/Q1006462","display_name":"Hilbert\u2013Huang transform","level":3,"score":0.3612000048160553},{"id":"https://openalex.org/C2779197387","wikidata":"https://www.wikidata.org/wiki/Q2822895","display_name":"Lithium-ion battery","level":4,"score":0.34139999747276306},{"id":"https://openalex.org/C82157600","wikidata":"https://www.wikidata.org/wiki/Q2671652","display_name":"Diagnostic test","level":2,"score":0.30570000410079956},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.302700012922287},{"id":"https://openalex.org/C2780385302","wikidata":"https://www.wikidata.org/wiki/Q367158","display_name":"Protocol (science)","level":3,"score":0.29789999127388},{"id":"https://openalex.org/C2983668108","wikidata":"https://www.wikidata.org/wiki/Q280453","display_name":"Spectral analysis","level":3,"score":0.2930000126361847},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.29190000891685486},{"id":"https://openalex.org/C124681953","wikidata":"https://www.wikidata.org/wiki/Q339062","display_name":"Decomposition","level":2,"score":0.2782999873161316},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2757999897003174},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.26840001344680786},{"id":"https://openalex.org/C112987892","wikidata":"https://www.wikidata.org/wiki/Q5051574","display_name":"Catastrophic failure","level":2,"score":0.2632000148296356},{"id":"https://openalex.org/C2778541603","wikidata":"https://www.wikidata.org/wiki/Q152763","display_name":"Lithium (medication)","level":2,"score":0.25949999690055847},{"id":"https://openalex.org/C2986587452","wikidata":"https://www.wikidata.org/wiki/Q938438","display_name":"Statistical analysis","level":2,"score":0.2583000063896179},{"id":"https://openalex.org/C73916439","wikidata":"https://www.wikidata.org/wiki/Q837718","display_name":"Energy storage","level":3,"score":0.2547000050544739}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tencon66050.2025.11374996","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tencon66050.2025.11374996","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"TENCON 2025 - 2025 IEEE Region 10 Conference (TENCON)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8542821407318115,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321524","display_name":"Chang Gung University","ror":"https://ror.org/00d80zx46"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W2124640950","https://openalex.org/W2132568683","https://openalex.org/W2162493950","https://openalex.org/W2186577517","https://openalex.org/W2610008367","https://openalex.org/W2763400075","https://openalex.org/W2804344070","https://openalex.org/W2953816312","https://openalex.org/W2964801665","https://openalex.org/W2971230710","https://openalex.org/W3089294463","https://openalex.org/W3190789586","https://openalex.org/W4234317746","https://openalex.org/W4281559381","https://openalex.org/W4291908228","https://openalex.org/W4294861698","https://openalex.org/W4311774739","https://openalex.org/W4319998223","https://openalex.org/W4387186465","https://openalex.org/W4402279231","https://openalex.org/W4404037079","https://openalex.org/W4404937967"],"related_works":[],"abstract_inverted_index":{"Early":[0],"identification":[1],"of":[2,84,109,140,161],"internal":[3],"short":[4],"circuits":[5],"(ISCs)":[6],"in":[7,20,118,158,171],"lithium-ion":[8],"batteries":[9],"(LiBs)":[10],"is":[11],"critical":[12],"for":[13,80,135,165],"ensuring":[14],"system-level":[15],"safety":[16,154],"and":[17,26,39,156,168],"operational":[18],"reliability":[19],"applications":[21],"such":[22],"as":[23,33,101,103],"electric":[24],"vehicles":[25],"grid-scale":[27],"energy":[28,172],"storage.":[29],"Conventional":[30],"diagnostic":[31,63,163],"techniques-such":[32],"resistance":[34],"monitoring,":[35],"voltage":[36,86],"deviation":[37],"analysis,":[38],"statistical":[40],"health":[41,138],"modeling-typically":[42],"detect":[43,96],"faults":[44],"only":[45],"after":[46],"substantial":[47],"degradation":[48],"has":[49],"occurred,":[50],"often":[51],"overlooking":[52],"transient":[53],"electrochemical":[54],"anomalies":[55,122],"that":[56,91],"precede":[57],"ISC":[58,111,125],"onset.":[59],"To":[60],"address":[61],"this":[62],"limitation,":[64],"the":[65,75,92,107,159],"present":[66],"study":[67],"introduces":[68],"a":[69,131],"high-resolution,":[70],"voltage-only":[71],"analytical":[72],"framework":[73,129],"employing":[74],"Smoothed":[76],"Pseudo-Wigner-Ville":[77],"Distribution":[78],"(SPWVD)":[79],"time-frequency":[81],"spectral":[82,99],"decomposition":[83],"discharge":[85],"signals.":[87],"Experimental":[88],"results":[89],"demonstrate":[90],"SPWVD":[93],"technique":[94],"can":[95],"early":[97,166],"ISC-related":[98],"changes":[100],"much":[102],"96":[104],"seconds":[105],"before":[106],"appearance":[108],"conventional":[110],"indicators.":[112],"These":[113],"findings":[114],"highlight":[115],"SPWVD's":[116],"effectiveness":[117],"revealing":[119],"subtle,":[120],"early-stage":[121],"associated":[123],"with":[124],"development.":[126],"The":[127],"proposed":[128],"contributes":[130],"low-intrusion,":[132],"high-sensitivity":[133],"strategy":[134],"real-time":[136],"prognostic":[137],"management":[139],"LiBs.":[141],"By":[142],"enabling":[143],"predictive":[144],"fault":[145],"detection,":[146],"it":[147],"offers":[148],"significant":[149],"potential":[150],"to":[151],"enhance":[152],"battery":[153],"protocols":[155],"supports":[157],"development":[160],"advanced":[162],"tools":[164],"warning":[167],"preventive":[169],"control":[170],"storage":[173],"systems.":[174]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2026-02-19T00:00:00"}