{"id":"https://openalex.org/W4388893681","doi":"https://doi.org/10.1109/tencon58879.2023.10322337","title":"Experimental Investigation of the Generalization Performance of Neural Network in Defect Localization System for Steel Pipe Health Monitoring","display_name":"Experimental Investigation of the Generalization Performance of Neural Network in Defect Localization System for Steel Pipe Health Monitoring","publication_year":2023,"publication_date":"2023-10-31","ids":{"openalex":"https://openalex.org/W4388893681","doi":"https://doi.org/10.1109/tencon58879.2023.10322337"},"language":"en","primary_location":{"id":"doi:10.1109/tencon58879.2023.10322337","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/tencon58879.2023.10322337","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"TENCON 2023 - 2023 IEEE Region 10 Conference (TENCON)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111078268","display_name":"Yuya Hayakawa","orcid":null},"institutions":[{"id":"https://openalex.org/I161296585","display_name":"Tokyo University of Science","ror":"https://ror.org/05sj3n476","country_code":"JP","type":"education","lineage":["https://openalex.org/I161296585"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yuya Hayakawa","raw_affiliation_strings":["Tokyo University of Science,Department of Electrical Engineering,Katsushika,Tokyo,Japan","Department of Electrical Engineering, Tokyo University of Science, Katsushika, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tokyo University of Science,Department of Electrical Engineering,Katsushika,Tokyo,Japan","institution_ids":["https://openalex.org/I161296585"]},{"raw_affiliation_string":"Department of Electrical Engineering, Tokyo University of Science, Katsushika, Tokyo, Japan","institution_ids":["https://openalex.org/I161296585"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113051800","display_name":"Yuga Aoki","orcid":null},"institutions":[{"id":"https://openalex.org/I161296585","display_name":"Tokyo University of Science","ror":"https://ror.org/05sj3n476","country_code":"JP","type":"education","lineage":["https://openalex.org/I161296585"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yuga Aoki","raw_affiliation_strings":["Tokyo University of Science,Department of Electrical Engineering,Katsushika,Tokyo,Japan","Department of Electrical Engineering, Tokyo University of Science, Katsushika, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tokyo University of Science,Department of Electrical Engineering,Katsushika,Tokyo,Japan","institution_ids":["https://openalex.org/I161296585"]},{"raw_affiliation_string":"Department of Electrical Engineering, Tokyo University of Science, Katsushika, Tokyo, Japan","institution_ids":["https://openalex.org/I161296585"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104053570","display_name":"Kenjiro Mori","orcid":null},"institutions":[{"id":"https://openalex.org/I139084617","display_name":"Hiroshima Institute of Technology","ror":"https://ror.org/02bwkwm60","country_code":"JP","type":"education","lineage":["https://openalex.org/I139084617"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kenjiro Mori","raw_affiliation_strings":["Hiroshima Institute of Technology,Department of Architectual Design,Hiroshima-shi,Hiroshima,Japan","Department of Architectual Design, Hiroshima Institute of Technology, Hiroshima-shi, Hiroshima, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hiroshima Institute of Technology,Department of Architectual Design,Hiroshima-shi,Hiroshima,Japan","institution_ids":["https://openalex.org/I139084617"]},{"raw_affiliation_string":"Department of Architectual Design, Hiroshima Institute of Technology, Hiroshima-shi, Hiroshima, Japan","institution_ids":["https://openalex.org/I139084617"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110454120","display_name":"Takumi Ito","orcid":null},"institutions":[{"id":"https://openalex.org/I161296585","display_name":"Tokyo University of Science","ror":"https://ror.org/05sj3n476","country_code":"JP","type":"education","lineage":["https://openalex.org/I161296585"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takumi Ito","raw_affiliation_strings":["Tokyo University of Science,Department of Architecture,Katsushika,Tokyo,Japan","Department of Architecture, Tokyo University of Science, Katsushika, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tokyo University of Science,Department of Architecture,Katsushika,Tokyo,Japan","institution_ids":["https://openalex.org/I161296585"]},{"raw_affiliation_string":"Department of Architecture, Tokyo University of Science, Katsushika, Tokyo, Japan","institution_ids":["https://openalex.org/I161296585"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5042202496","display_name":"T. Kawahara","orcid":"https://orcid.org/0000-0002-7130-3397"},"institutions":[{"id":"https://openalex.org/I161296585","display_name":"Tokyo University of Science","ror":"https://ror.org/05sj3n476","country_code":"JP","type":"education","lineage":["https://openalex.org/I161296585"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takayuki Kawahara","raw_affiliation_strings":["Tokyo University of Science,Department of Electrical Engineering,Katsushika,Tokyo,Japan","Department of Electrical Engineering, Tokyo University of Science, Katsushika, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tokyo University of Science,Department of Electrical Engineering,Katsushika,Tokyo,Japan","institution_ids":["https://openalex.org/I161296585"]},{"raw_affiliation_string":"Department of Electrical Engineering, Tokyo University of Science, Katsushika, Tokyo, Japan","institution_ids":["https://openalex.org/I161296585"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1206,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.42958223,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"942","last_page":"947"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.9804999828338623,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12086","display_name":"Structural Integrity and Reliability Analysis","score":0.9535999894142151,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/generalization","display_name":"Generalization","score":0.8668171167373657},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.7350250482559204},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5893014073371887},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5814511775970459},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5251069664955139},{"id":"https://openalex.org/keywords/sample","display_name":"Sample (material)","score":0.5085676908493042},{"id":"https://openalex.org/keywords/structural-health-monitoring","display_name":"Structural health monitoring","score":0.4754990041255951},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.4253443777561188},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3862137198448181},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.33537232875823975},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2601742744445801},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.22924256324768066},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.17726099491119385},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.0765288770198822}],"concepts":[{"id":"https://openalex.org/C177148314","wikidata":"https://www.wikidata.org/wiki/Q170084","display_name":"Generalization","level":2,"score":0.8668171167373657},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.7350250482559204},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5893014073371887},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5814511775970459},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5251069664955139},{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.5085676908493042},{"id":"https://openalex.org/C2776247918","wikidata":"https://www.wikidata.org/wiki/Q1423713","display_name":"Structural health monitoring","level":2,"score":0.4754990041255951},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.4253443777561188},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3862137198448181},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.33537232875823975},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2601742744445801},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.22924256324768066},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.17726099491119385},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0765288770198822},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tencon58879.2023.10322337","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/tencon58879.2023.10322337","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"TENCON 2023 - 2023 IEEE Region 10 Conference (TENCON)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2741339639","https://openalex.org/W2787356053","https://openalex.org/W3115622635"],"related_works":["https://openalex.org/W1974895211","https://openalex.org/W2176409448","https://openalex.org/W2129841057","https://openalex.org/W3040712279","https://openalex.org/W2364769705","https://openalex.org/W2056136368","https://openalex.org/W2374664672","https://openalex.org/W4367555392","https://openalex.org/W2883092465","https://openalex.org/W4236726576"],"abstract_inverted_index":{"This":[0],"study":[1],"aimed":[2],"to":[3,73,96,112],"assess":[4],"the":[5,32,74,94,98,104,116,126,139],"generalization":[6,136],"performance":[7,137],"of":[8,28,110,135],"a":[9,87,107,132],"Metal":[10,140],"Health":[11,141],"Monitoring":[12,142],"system,":[13],"which":[14],"is":[15],"crucial":[16],"for":[17,120],"practical":[18],"applications.":[19],"Previous":[20],"research":[21],"has":[22],"not":[23,123],"thoroughly":[24],"examined":[25],"this":[26],"aspect":[27],"performance.":[29],"To":[30],"enhance":[31],"system's":[33],"performance,":[34],"we":[35],"conducted":[36],"experiments":[37],"using":[38],"90":[39],"metal":[40,121],"pieces,":[41],"anticipating":[42],"improved":[43],"results":[44,130],"with":[45],"increased":[46],"sample":[47],"size.":[48],"The":[49,76,100],"pieces":[50,122],"were":[51,67,78],"divided":[52],"into":[53,81],"nine":[54],"classes,":[55],"representing":[56],"undamaged":[57],"and":[58,83,86],"damaged":[59],"conditions":[60],"at":[61],"eight":[62],"different":[63],"positions.":[64],"Vibration":[65],"waveforms":[66,77],"obtained":[68],"by":[69],"attaching":[70],"piezoelectric":[71],"sensors":[72],"pieces.":[75],"then":[79],"split":[80],"training":[82,127],"evaluation":[84],"datasets,":[85],"neural":[88],"network":[89],"(NN)":[90],"was":[91],"trained":[92],"on":[93],"former":[95],"classify":[97],"latter.":[99],"findings":[101],"revealed":[102],"that":[103],"NN":[105],"achieved":[106],"remarkable":[108],"accuracy":[109],"up":[111],"80.6%":[113],"in":[114,125,138],"classifying":[115],"damage":[117],"positions,":[118],"even":[119],"included":[124],"set.":[128],"These":[129],"indicate":[131],"high":[133],"level":[134],"system.":[143]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}