{"id":"https://openalex.org/W2918568519","doi":"https://doi.org/10.1109/tencon.2018.8650459","title":"Development of Hall Sensor Fault Compensation Method to Improve Control Reliability of BLDC Motor","display_name":"Development of Hall Sensor Fault Compensation Method to Improve Control Reliability of BLDC Motor","publication_year":2018,"publication_date":"2018-10-01","ids":{"openalex":"https://openalex.org/W2918568519","doi":"https://doi.org/10.1109/tencon.2018.8650459","mag":"2918568519"},"language":"en","primary_location":{"id":"doi:10.1109/tencon.2018.8650459","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tencon.2018.8650459","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"TENCON 2018 - 2018 IEEE Region 10 Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101554415","display_name":"Dong Yeol Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I52010207","display_name":"Keimyung University","ror":"https://ror.org/00tjv0s33","country_code":"KR","type":"education","lineage":["https://openalex.org/I52010207"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dong Yeol Lee","raw_affiliation_strings":["Department of Electrical Energy Engineering, Keimyung University, Daegu, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Energy Engineering, Keimyung University, Daegu, South Korea","institution_ids":["https://openalex.org/I52010207"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100672906","display_name":"Mi Jeong Kim","orcid":"https://orcid.org/0000-0002-0727-2741"},"institutions":[{"id":"https://openalex.org/I52010207","display_name":"Keimyung University","ror":"https://ror.org/00tjv0s33","country_code":"KR","type":"education","lineage":["https://openalex.org/I52010207"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Mi Jeong Kim","raw_affiliation_strings":["Department of Electrical Energy Engineering, Keimyung University, Daegu, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Energy Engineering, Keimyung University, Daegu, South Korea","institution_ids":["https://openalex.org/I52010207"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077021317","display_name":"Myung-Sik Jeong","orcid":null},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Myung-Sik Jeong","raw_affiliation_strings":["Department of Electrical Energy Engineering, HanYang University, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Energy Engineering, HanYang University, Seoul, South Korea","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5070626522","display_name":"Dong-Woo Kang","orcid":"https://orcid.org/0000-0002-5763-7585"},"institutions":[{"id":"https://openalex.org/I52010207","display_name":"Keimyung University","ror":"https://ror.org/00tjv0s33","country_code":"KR","type":"education","lineage":["https://openalex.org/I52010207"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dong-Woo Kang","raw_affiliation_strings":["Department of Electrical Energy Engineering, Keimyung University, Daegu, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Energy Engineering, Keimyung University, Daegu, South Korea","institution_ids":["https://openalex.org/I52010207"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1309,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.5303996,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"58","issue":null,"first_page":"0574","last_page":"0578"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10504","display_name":"Sensorless Control of Electric Motors","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10504","display_name":"Sensorless Control of Electric Motors","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10278","display_name":"Electric Motor Design and Analysis","score":0.9950000047683716,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13093","display_name":"Electric Power Systems and Control","score":0.9943000078201294,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7425796389579773},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.7178795337677002},{"id":"https://openalex.org/keywords/hall-effect-sensor","display_name":"Hall effect sensor","score":0.5181964039802551},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5045696496963501},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.47945892810821533},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.466092973947525},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4508150517940521},{"id":"https://openalex.org/keywords/control-engineering","display_name":"Control engineering","score":0.3683491349220276},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3114604353904724},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2450111210346222},{"id":"https://openalex.org/keywords/psychology","display_name":"Psychology","score":0.1402479112148285},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.10404196381568909},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.05348131060600281},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.05339241027832031}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7425796389579773},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.7178795337677002},{"id":"https://openalex.org/C107637996","wikidata":"https://www.wikidata.org/wiki/Q1431247","display_name":"Hall effect sensor","level":3,"score":0.5181964039802551},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5045696496963501},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.47945892810821533},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.466092973947525},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4508150517940521},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.3683491349220276},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3114604353904724},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2450111210346222},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.1402479112148285},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.10404196381568909},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.05348131060600281},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.05339241027832031},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0},{"id":"https://openalex.org/C16389437","wikidata":"https://www.wikidata.org/wiki/Q11421","display_name":"Magnet","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tencon.2018.8650459","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tencon.2018.8650459","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"TENCON 2018 - 2018 IEEE Region 10 Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7200000286102295}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W2024029617","https://openalex.org/W2033228414","https://openalex.org/W2038855593","https://openalex.org/W2087068929","https://openalex.org/W2100614885","https://openalex.org/W2111992740","https://openalex.org/W2162572743","https://openalex.org/W2304858949"],"related_works":["https://openalex.org/W2370979685","https://openalex.org/W2379084545","https://openalex.org/W4292054214","https://openalex.org/W3162919010","https://openalex.org/W2187844424","https://openalex.org/W2408343962","https://openalex.org/W2365721267","https://openalex.org/W2586454696","https://openalex.org/W2189291528","https://openalex.org/W2365687337"],"abstract_inverted_index":{"In":[0],"this":[1,178],"study,":[2],"we":[3],"develop":[4],"an":[5],"improved":[6,79,108,152],"all-pass":[7,80,109],"filter":[8,81,110,149],"that":[9,22,72],"compensates":[10],"the":[11,44,48,51,55,59,62,69,78,84,87,93,96,103,107,116,125,140,145,164,175],"signal":[12,60,85,132],"of":[13,50,54,61,68,86,98,144,177],"a":[14,26,32,112],"faulty":[15,63,88],"Hall":[16,20,27,45,64,70,89,128],"sensor":[17,28,46,71,90],"using":[18,106,124],"two":[19,66],"sensors":[21],"operate":[23],"normally":[24,74],"when":[25],"fault":[29,42],"occurs":[30],"in":[31,43],"permanent":[33],"magnet":[34],"synchronous":[35],"motor":[36],"operating":[37,127],"at":[38],"high":[39],"speed.":[40],"A":[41],"is":[47,122,167],"cause":[49],"reliability":[52,114],"degradation":[53],"system.":[56],"To":[57],"compensate":[58,83],"sensor,":[65],"signals":[67],"operates":[73],"are":[75,150],"applied":[76],"to":[77,82,100,139,173],"by":[91,153],"delaying":[92],"phase.":[94],"Unlike":[95],"method":[97,105,119],"switching":[99],"sensorless":[101,117],"control,":[102],"compensated":[104,123],"has":[111],"higher":[113],"than":[115],"control":[118],"because":[120],"it":[121],"normal":[126],"sensor.":[129],"The":[130],"output":[131],"phase":[133],"delay":[134],"and":[135,160,171],"duty":[136],"nonlinearity":[137],"according":[138],"input":[141],"frequency":[142],"change":[143],"original":[146],"all-p":[147],"ass":[148],"linearly":[151],"IC":[154],"chips":[155],"such":[156],"as":[157],"decoder,":[158],"And-gate,":[159],"D":[161],"Flip-Flop.":[162],"Finally,":[163],"designed":[165],"circuit":[166],"analyzed":[168],"through":[169],"simulation":[170],"experiment":[172],"verify":[174],"results":[176],"study.":[179]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}