{"id":"https://openalex.org/W4321021729","doi":"https://doi.org/10.1109/tdsc.2023.3245842","title":"Generic Soft Error Data and Control Flow Error Detection by Instruction Duplication","display_name":"Generic Soft Error Data and Control Flow Error Detection by Instruction Duplication","publication_year":2023,"publication_date":"2023-02-16","ids":{"openalex":"https://openalex.org/W4321021729","doi":"https://doi.org/10.1109/tdsc.2023.3245842"},"language":"en","primary_location":{"id":"doi:10.1109/tdsc.2023.3245842","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tdsc.2023.3245842","pdf_url":null,"source":{"id":"https://openalex.org/S133795288","display_name":"IEEE Transactions on Dependable and Secure Computing","issn_l":"1545-5971","issn":["1545-5971","1941-0018","2160-9209"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320439","host_organization_name":"IEEE Computer Society","host_organization_lineage":["https://openalex.org/P4310320439","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Computer Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Dependable and Secure Computing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057249985","display_name":"Moslem Didehban","orcid":"https://orcid.org/0000-0002-9357-4702"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Moslem Didehban","raw_affiliation_strings":["Arizona State University, Tempe, AZ, USA"],"raw_orcid":"https://orcid.org/0000-0002-9357-4702","affiliations":[{"raw_affiliation_string":"Arizona State University, Tempe, AZ, USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102904164","display_name":"Hwisoo So","orcid":"https://orcid.org/0000-0002-3496-6079"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hwisoo So","raw_affiliation_strings":["Yonsei University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-3496-6079","affiliations":[{"raw_affiliation_string":"Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060161598","display_name":"Prudhvi Gali","orcid":null},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Prudhvi Gali","raw_affiliation_strings":["Arizona State University, Tempe, AZ, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Arizona State University, Tempe, AZ, USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044172378","display_name":"Aviral Shrivastava","orcid":"https://orcid.org/0000-0002-1075-897X"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Aviral Shrivastava","raw_affiliation_strings":["Arizona State University, Tempe, AZ, USA"],"raw_orcid":"https://orcid.org/0000-0002-1075-897X","affiliations":[{"raw_affiliation_string":"Arizona State University, Tempe, AZ, USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5031543156","display_name":"Kyoungwoo Lee","orcid":"https://orcid.org/0000-0001-5082-3775"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyoungwoo Lee","raw_affiliation_strings":["Yonsei University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0001-5082-3775","affiliations":[{"raw_affiliation_string":"Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.9744,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.86116485,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"21","issue":"1","first_page":"78","last_page":"92"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11424","display_name":"Security and Verification in Computing","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9884999990463257,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8552286028862},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.7653332948684692},{"id":"https://openalex.org/keywords/control-flow","display_name":"Control flow","score":0.6552179455757141},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.6472525000572205},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.5945857167243958},{"id":"https://openalex.org/keywords/microprocessor","display_name":"Microprocessor","score":0.4433422386646271},{"id":"https://openalex.org/keywords/verilog","display_name":"Verilog","score":0.43228572607040405},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4175834059715271},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.35265231132507324},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.33872663974761963},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.2030167579650879},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.09932047128677368},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.09636199474334717}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8552286028862},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.7653332948684692},{"id":"https://openalex.org/C160191386","wikidata":"https://www.wikidata.org/wiki/Q868299","display_name":"Control flow","level":2,"score":0.6552179455757141},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.6472525000572205},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.5945857167243958},{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.4433422386646271},{"id":"https://openalex.org/C2779030575","wikidata":"https://www.wikidata.org/wiki/Q827773","display_name":"Verilog","level":3,"score":0.43228572607040405},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4175834059715271},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.35265231132507324},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.33872663974761963},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2030167579650879},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.09932047128677368},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.09636199474334717},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tdsc.2023.3245842","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tdsc.2023.3245842","pdf_url":null,"source":{"id":"https://openalex.org/S133795288","display_name":"IEEE Transactions on Dependable and Secure Computing","issn_l":"1545-5971","issn":["1545-5971","1941-0018","2160-9209"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320439","host_organization_name":"IEEE Computer Society","host_organization_lineage":["https://openalex.org/P4310320439","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Computer Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Dependable and Secure Computing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Peace, Justice and strong institutions","score":0.8199999928474426,"id":"https://metadata.un.org/sdg/16"}],"awards":[{"id":"https://openalex.org/G4775537920","display_name":null,"funder_award_id":"RS-2022-00165225","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G5632031895","display_name":null,"funder_award_id":"CCF 1723476","funder_id":"https://openalex.org/F4320335353","funder_display_name":"National Science Foundation of Sri Lanka"},{"id":"https://openalex.org/G5634355378","display_name":null,"funder_award_id":"CNS 1525855","funder_id":"https://openalex.org/F4320335353","funder_display_name":"National Science Foundation of Sri Lanka"},{"id":"https://openalex.org/G7200044151","display_name":null,"funder_award_id":"CPS 1646235","funder_id":"https://openalex.org/F4320335353","funder_display_name":"National Science Foundation of Sri Lanka"}],"funders":[{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"},{"id":"https://openalex.org/F4320335353","display_name":"National Science Foundation of Sri Lanka","ror":"https://ror.org/010xaa060"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":50,"referenced_works":["https://openalex.org/W1487279492","https://openalex.org/W1535906379","https://openalex.org/W1585229822","https://openalex.org/W1772618440","https://openalex.org/W1964365815","https://openalex.org/W1996523225","https://openalex.org/W2034593585","https://openalex.org/W2061729790","https://openalex.org/W2080071888","https://openalex.org/W2085510679","https://openalex.org/W2086328257","https://openalex.org/W2095841921","https://openalex.org/W2108557605","https://openalex.org/W2109219878","https://openalex.org/W2118338314","https://openalex.org/W2130189691","https://openalex.org/W2138815251","https://openalex.org/W2140433506","https://openalex.org/W2152757758","https://openalex.org/W2155712274","https://openalex.org/W2161549238","https://openalex.org/W2169596872","https://openalex.org/W2176741225","https://openalex.org/W2337485678","https://openalex.org/W2402686027","https://openalex.org/W2479978724","https://openalex.org/W2528344430","https://openalex.org/W2559930489","https://openalex.org/W2565180819","https://openalex.org/W2612733213","https://openalex.org/W2626531569","https://openalex.org/W2757242886","https://openalex.org/W2767260595","https://openalex.org/W2791148710","https://openalex.org/W2799033078","https://openalex.org/W2903722369","https://openalex.org/W2909680524","https://openalex.org/W2917704380","https://openalex.org/W2945847683","https://openalex.org/W2995379743","https://openalex.org/W3149134903","https://openalex.org/W4232751114","https://openalex.org/W4232962734","https://openalex.org/W4246684434","https://openalex.org/W4249144718","https://openalex.org/W4255032011","https://openalex.org/W6697179407","https://openalex.org/W6721258214","https://openalex.org/W6763117879","https://openalex.org/W6925366431"],"related_works":["https://openalex.org/W2044069930","https://openalex.org/W2011289549","https://openalex.org/W2078707653","https://openalex.org/W3196277062","https://openalex.org/W4224229821","https://openalex.org/W2079643259","https://openalex.org/W2782341877","https://openalex.org/W2593605297","https://openalex.org/W2186173565","https://openalex.org/W2969553121"],"abstract_inverted_index":{"Transient":[0],"faults":[1],"or":[2],"soft":[3,19],"errors":[4],"are":[5,22],"considered":[6],"one":[7],"of":[8,50,57,121,125],"the":[9,55,131,148],"most":[10],"daunting":[11],"reliability":[12],"challenges":[13],"for":[14,18,109],"microprocessors.":[15],"Software":[16],"solutions":[17],"error":[20,31,43,51],"protection":[21,44],"attractive":[23],"because":[24],"they":[25],"can":[26],"provide":[27],"flexible":[28],"and":[29,37,61,75,99,105],"effective":[30,64],"protection.":[32],"For":[33],"instance,":[34],"nZDC":[35,69,90],"(Didehban":[36],"Shrivastava":[38],"2016)":[39],"state-of-the-art":[40],"instruction":[41],"duplication":[42],"scheme":[45,98,150],"achieves":[46],"a":[47,95],"high":[48],"degree":[49],"detection":[52],"by":[53,88,147],"verifying":[54],"results":[56],"memory":[58],"write":[59],"operations":[60],"utilizes":[62],"an":[63,126],"control-flow":[65,70,91,107],"checking":[66,71,92],"mechanism.":[67],"However,":[68],"mechanism":[72,93],"is":[73],"architecture-dependent":[74],"suffers":[76],"from":[77],"some":[78],"vulnerability":[79],"holes.":[80],"In":[81,143],"this":[82],"work,":[83],"we":[84],"address":[85],"these":[86],"issues":[87],"substituting":[89],"with":[94],"general":[96],"(ISA-independent)":[97],"propose":[100],"two":[101],"transformations,":[102],"coarse-grained":[103],"scheduling,":[104],"asymmetric":[106],"signatures,":[108],"hard-to-detect":[110],"control":[111],"flow":[112],"errors.":[113],"Fault":[114],"injection":[115],"experiments":[116],"on":[117,152],"different":[118],"hardware":[119],"components":[120],"synthesizable":[122],"Verilog":[123],"description":[124],"OpenRISC-based":[127],"microprocessor":[128],"reveal":[129],"that":[130],"proposed":[132,149],"transformation":[133],"shows":[134],"85%":[135],"less":[136],"silent":[137],"data":[138],"corruptions":[139],"compared":[140],"to":[141],"nZDC.":[142],"addition,":[144],"programs":[145],"protected":[146],"run":[151],"average":[153],"around":[154],"37%":[155],"faster":[156],"than":[157],"nZDC-protected":[158],"programs.":[159]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":8},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}