{"id":"https://openalex.org/W3111013705","doi":"https://doi.org/10.1109/tdsc.2020.3043023","title":"An Empirical Study of the Impact of Single and Multiple Bit-Flip Errors in Programs","display_name":"An Empirical Study of the Impact of Single and Multiple Bit-Flip Errors in Programs","publication_year":2020,"publication_date":"2020-12-09","ids":{"openalex":"https://openalex.org/W3111013705","doi":"https://doi.org/10.1109/tdsc.2020.3043023","mag":"3111013705"},"language":"en","primary_location":{"id":"doi:10.1109/tdsc.2020.3043023","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tdsc.2020.3043023","pdf_url":null,"source":{"id":"https://openalex.org/S133795288","display_name":"IEEE Transactions on Dependable and Secure Computing","issn_l":"1545-5971","issn":["1545-5971","1941-0018","2160-9209"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320439","host_organization_name":"IEEE Computer Society","host_organization_lineage":["https://openalex.org/P4310320439","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Computer Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Dependable and Secure Computing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5045821468","display_name":"Behrooz Sangchoolie","orcid":"https://orcid.org/0000-0001-9536-4269"},"institutions":[{"id":"https://openalex.org/I2800664555","display_name":"RISE Research Institutes of Sweden","ror":"https://ror.org/03nnxqz81","country_code":"SE","type":"other","lineage":["https://openalex.org/I2800664555"]}],"countries":["SE"],"is_corresponding":true,"raw_author_name":"Behrooz Sangchoolie","raw_affiliation_strings":["RISE Research Institutes of Sweden, Bor&#x00E5;s, Sweden"],"raw_orcid":"https://orcid.org/0000-0001-9536-4269","affiliations":[{"raw_affiliation_string":"RISE Research Institutes of Sweden, Bor&#x00E5;s, Sweden","institution_ids":["https://openalex.org/I2800664555"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073641368","display_name":"Karthik Pattabiraman","orcid":"https://orcid.org/0000-0003-2380-3415"},"institutions":[{"id":"https://openalex.org/I141945490","display_name":"University of British Columbia","ror":"https://ror.org/03rmrcq20","country_code":"CA","type":"education","lineage":["https://openalex.org/I141945490"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Karthik Pattabiraman","raw_affiliation_strings":["University of British Colombia, Vancouver, BC, Canada"],"raw_orcid":"https://orcid.org/0000-0003-2380-3415","affiliations":[{"raw_affiliation_string":"University of British Colombia, Vancouver, BC, Canada","institution_ids":["https://openalex.org/I141945490"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102843659","display_name":"Johan Karlsson","orcid":"https://orcid.org/0009-0001-7601-4770"},"institutions":[{"id":"https://openalex.org/I66862912","display_name":"Chalmers University of Technology","ror":"https://ror.org/040wg7k59","country_code":"SE","type":"education","lineage":["https://openalex.org/I66862912"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"Johan Karlsson","raw_affiliation_strings":["Chalmers University of Technology, G&#x00F6;teborg, Sweden"],"raw_orcid":"https://orcid.org/0000-0002-5542-2011","affiliations":[{"raw_affiliation_string":"Chalmers University of Technology, G&#x00F6;teborg, Sweden","institution_ids":["https://openalex.org/I66862912"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5045821468"],"corresponding_institution_ids":["https://openalex.org/I2800664555"],"apc_list":null,"apc_paid":null,"fwci":1.2484,"has_fulltext":false,"cited_by_count":31,"citation_normalized_percentile":{"value":0.80130369,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"19","issue":"3","first_page":"1988","last_page":"2006"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bit","display_name":"Bit (key)","score":0.8153997659683228},{"id":"https://openalex.org/keywords/bit-error-rate","display_name":"Bit error rate","score":0.6174362897872925},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5815050005912781},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.4918084442615509},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.49097779393196106},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4183942675590515},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.4164014458656311},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.4144185483455658},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.4120596647262573},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.3302954435348511},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.29896488785743713},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.14174425601959229},{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.09482330083847046},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.07982233166694641}],"concepts":[{"id":"https://openalex.org/C117011727","wikidata":"https://www.wikidata.org/wiki/Q1278488","display_name":"Bit (key)","level":2,"score":0.8153997659683228},{"id":"https://openalex.org/C56296756","wikidata":"https://www.wikidata.org/wiki/Q840922","display_name":"Bit error rate","level":3,"score":0.6174362897872925},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5815050005912781},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.4918084442615509},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.49097779393196106},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4183942675590515},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.4164014458656311},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.4144185483455658},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.4120596647262573},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.3302954435348511},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.29896488785743713},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.14174425601959229},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.09482330083847046},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.07982233166694641},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tdsc.2020.3043023","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tdsc.2020.3043023","pdf_url":null,"source":{"id":"https://openalex.org/S133795288","display_name":"IEEE Transactions on Dependable and Secure Computing","issn_l":"1545-5971","issn":["1545-5971","1941-0018","2160-9209"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320439","host_organization_name":"IEEE Computer Society","host_organization_lineage":["https://openalex.org/P4310320439","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Computer Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Dependable and Secure Computing","raw_type":"journal-article"},{"id":"pmh:oai:research.chalmers.se:524714","is_oa":false,"landing_page_url":"https://research.chalmers.se/en/publication/524714","pdf_url":null,"source":{"id":"https://openalex.org/S4306402469","display_name":"Chalmers Research (Chalmers University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I66862912","host_organization_name":"Chalmers University of Technology","host_organization_lineage":["https://openalex.org/I66862912"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":""}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Peace, Justice and strong institutions","score":0.8100000023841858,"id":"https://metadata.un.org/sdg/16"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":41,"referenced_works":["https://openalex.org/W1242742582","https://openalex.org/W1487279492","https://openalex.org/W1563037183","https://openalex.org/W1619770058","https://openalex.org/W1825939613","https://openalex.org/W1872425908","https://openalex.org/W1967835393","https://openalex.org/W1982406967","https://openalex.org/W2017147164","https://openalex.org/W2030260865","https://openalex.org/W2034593585","https://openalex.org/W2042203635","https://openalex.org/W2042997824","https://openalex.org/W2076266525","https://openalex.org/W2092187580","https://openalex.org/W2101580666","https://openalex.org/W2103418833","https://openalex.org/W2122149420","https://openalex.org/W2125169487","https://openalex.org/W2150267144","https://openalex.org/W2155437619","https://openalex.org/W2165070096","https://openalex.org/W2169315529","https://openalex.org/W2273440736","https://openalex.org/W2402610930","https://openalex.org/W2529578574","https://openalex.org/W2549251310","https://openalex.org/W2626574314","https://openalex.org/W2883034956","https://openalex.org/W2905075051","https://openalex.org/W3011765223","https://openalex.org/W3012032150","https://openalex.org/W4232172996","https://openalex.org/W4232751114","https://openalex.org/W4246166885","https://openalex.org/W4246619473","https://openalex.org/W4250541405","https://openalex.org/W4255519882","https://openalex.org/W6637647359","https://openalex.org/W6643510916","https://openalex.org/W6694513646"],"related_works":["https://openalex.org/W2044069930","https://openalex.org/W2078707653","https://openalex.org/W3196277062","https://openalex.org/W4224229821","https://openalex.org/W2079643259","https://openalex.org/W2782341877","https://openalex.org/W2593605297","https://openalex.org/W2969553121","https://openalex.org/W1553526993","https://openalex.org/W2408771053"],"abstract_inverted_index":{"Recent":[0],"studies":[1],"have":[2],"shown":[3],"that":[4,15,91,112,127,141,150,194],"technology":[5],"and":[6],"voltage":[7],"scaling":[8],"are":[9,113,195],"expected":[10],"to":[11,38,52,68,105,116,188,200],"increase":[12],"the":[13,27,40,117,121,133,153,162],"likelihood":[14],"particle-induced":[16],"soft":[17,44],"errors":[18,56,93,107,193],"manifest":[19],"as":[20],"multiple-bit":[21,55,106,122,134,192],"errors.":[22,45,70,123],"This":[23],"raises":[24],"concerns":[25],"about":[26],"validity":[28],"of":[29,43,48,62,84,102,132,159,165,191],"using":[30],"single":[31],"bit-flips":[32],"in":[33,94,137],"fault":[34,74],"injection":[35,75,190],"experiments":[36],"aiming":[37],"assess":[39],"program-level":[41],"impact":[42],"The":[46],"goal":[47],"this":[49],"article":[50],"is":[51],"investigate":[53],"whether":[54],"could":[57],"cause":[58,201],"a":[59,82,99],"higher":[60,100,148],"percentage":[61,101,140,146,164],"silent":[63],"data":[64],"corruptions":[65],"(SDCs)":[66],"compared":[67,104],"single-bit":[69,92,155],"Based":[71,175],"on":[72,176],"2700":[73],"campaigns":[76,135],"with":[77],"15":[78],"benchmark":[79],"programs,":[80],"featuring":[81],"total":[83],"27":[85],"million":[86],"experiments,":[87],"our":[88,177],"results":[89,111],"show":[90],"most":[95,158,172],"cases":[96],"either":[97,196],"yield":[98,109],"SDCs":[103,166],"or":[108,198],"SDC":[110,139],"very":[114],"close":[115],"ones":[118],"obtained":[119,151,168],"for":[120,152,184],"Further,":[124],"we":[125,179],"find":[126],"only":[128],"around":[129],"2":[130],"percent":[131],"resulted":[136],"an":[138],"was":[142,167],"more":[143],"than":[144,149],"5":[145],"points":[147],"corresponding":[154],"campaigns.":[156],"For":[157],"these":[160],"campaigns,":[161],"highest":[163],"by":[169],"flipping":[170],"at":[171],"3":[173],"bits.":[174],"results,":[178],"also":[180],"propose":[181],"four":[182],"techniques":[183],"error":[185],"space":[186],"pruning":[187],"avoid":[189],"unlikely":[197],"infeasible":[199],"SDCs.":[202]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":10},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":7},{"year":2021,"cited_by_count":1}],"updated_date":"2026-05-23T08:51:43.019350","created_date":"2025-10-10T00:00:00"}
