{"id":"https://openalex.org/W2804652951","doi":"https://doi.org/10.1109/tcyb.2018.2830338","title":"Fault Diagnosis of Tennessee-Eastman Process Using Orthogonal Incremental Extreme Learning Machine Based on Driving Amount","display_name":"Fault Diagnosis of Tennessee-Eastman Process Using Orthogonal Incremental Extreme Learning Machine Based on Driving Amount","publication_year":2018,"publication_date":"2018-05-21","ids":{"openalex":"https://openalex.org/W2804652951","doi":"https://doi.org/10.1109/tcyb.2018.2830338","mag":"2804652951","pmid":"https://pubmed.ncbi.nlm.nih.gov/29994325"},"language":"en","primary_location":{"id":"doi:10.1109/tcyb.2018.2830338","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcyb.2018.2830338","pdf_url":null,"source":{"id":"https://openalex.org/S4210191041","display_name":"IEEE Transactions on Cybernetics","issn_l":"2168-2267","issn":["2168-2267","2168-2275"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Cybernetics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","pubmed"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5015096297","display_name":"Weidong Zou","orcid":"https://orcid.org/0000-0002-2227-7524"},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Weidong Zou","raw_affiliation_strings":["School of Automation, Beijing Institute of Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Automation, Beijing Institute of Technology, Beijing, China","institution_ids":["https://openalex.org/I125839683"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064231378","display_name":"Yuanqing Xia","orcid":"https://orcid.org/0000-0002-5977-4911"},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuanqing Xia","raw_affiliation_strings":["School of Automation, Beijing Institute of Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Automation, Beijing Institute of Technology, Beijing, China","institution_ids":["https://openalex.org/I125839683"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100395264","display_name":"Huifang Li","orcid":"https://orcid.org/0000-0002-7963-3702"},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huifang Li","raw_affiliation_strings":["School of Automation, Beijing Institute of Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Automation, Beijing Institute of Technology, Beijing, China","institution_ids":["https://openalex.org/I125839683"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5015096297"],"corresponding_institution_ids":["https://openalex.org/I125839683"],"apc_list":null,"apc_paid":null,"fwci":4.235,"has_fulltext":false,"cited_by_count":65,"citation_normalized_percentile":{"value":0.95291682,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":100},"biblio":{"volume":"48","issue":"12","first_page":"3403","last_page":"3410"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12676","display_name":"Machine Learning and ELM","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12676","display_name":"Machine Learning and ELM","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9847999811172485,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9836000204086304,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/extreme-learning-machine","display_name":"Extreme learning machine","score":0.9848905205726624},{"id":"https://openalex.org/keywords/orthogonalization","display_name":"Orthogonalization","score":0.7907811403274536},{"id":"https://openalex.org/keywords/generalization","display_name":"Generalization","score":0.6386182904243469},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5231063365936279},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5138893127441406},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.47326114773750305},{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.46919795870780945},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.46610626578330994},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.44190162420272827},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4042772948741913},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.40160760283470154},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.38308650255203247},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.20782998204231262}],"concepts":[{"id":"https://openalex.org/C2780150128","wikidata":"https://www.wikidata.org/wiki/Q21948731","display_name":"Extreme learning machine","level":3,"score":0.9848905205726624},{"id":"https://openalex.org/C47559304","wikidata":"https://www.wikidata.org/wiki/Q1702189","display_name":"Orthogonalization","level":2,"score":0.7907811403274536},{"id":"https://openalex.org/C177148314","wikidata":"https://www.wikidata.org/wiki/Q170084","display_name":"Generalization","level":2,"score":0.6386182904243469},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5231063365936279},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5138893127441406},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.47326114773750305},{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.46919795870780945},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.46610626578330994},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.44190162420272827},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4042772948741913},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.40160760283470154},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.38308650255203247},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.20782998204231262},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tcyb.2018.2830338","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcyb.2018.2830338","pdf_url":null,"source":{"id":"https://openalex.org/S4210191041","display_name":"IEEE Transactions on Cybernetics","issn_l":"2168-2267","issn":["2168-2267","2168-2275"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Cybernetics","raw_type":"journal-article"},{"id":"pmid:29994325","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/29994325","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE transactions on cybernetics","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.41999998688697815}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1969644672","https://openalex.org/W1973433968","https://openalex.org/W1974365260","https://openalex.org/W1990938413","https://openalex.org/W1997726919","https://openalex.org/W2008654225","https://openalex.org/W2013147061","https://openalex.org/W2023332595","https://openalex.org/W2061036845","https://openalex.org/W2063922127","https://openalex.org/W2070669992","https://openalex.org/W2087141873","https://openalex.org/W2096987757","https://openalex.org/W2118899040","https://openalex.org/W2130378394","https://openalex.org/W2141695047","https://openalex.org/W2165967751","https://openalex.org/W2234781454","https://openalex.org/W2301541953","https://openalex.org/W2486149598","https://openalex.org/W2514268906","https://openalex.org/W2582152269","https://openalex.org/W2603415176","https://openalex.org/W2773549135","https://openalex.org/W4236939771"],"related_works":["https://openalex.org/W1965163197","https://openalex.org/W2005349189","https://openalex.org/W2526976988","https://openalex.org/W3122962126","https://openalex.org/W2386892378","https://openalex.org/W4301514602","https://openalex.org/W2949490341","https://openalex.org/W1541233540","https://openalex.org/W2362628444","https://openalex.org/W1972782958"],"abstract_inverted_index":{"Fault":[0],"diagnosis":[1],"is":[2,36,112],"important":[3],"to":[4,37],"the":[5,24,27,39,57,65,104,119,138],"industrial":[6],"process.":[7],"This":[8],"paper":[9],"proposes":[10],"an":[11,47],"orthogonal":[12,89],"incremental":[13,48],"extreme":[14,49],"learning":[15,50],"machine":[16,51],"based":[17],"on":[18],"driving":[19,44],"amount":[20,45],"(DAOI-ELM)":[21],"for":[22,56],"recognizing":[23],"faults":[25,140],"of":[26,34,82,106,110,118],"Tennessee-Eastman":[28],"process":[29],"(TEP).":[30],"The":[31,53,95,108,131],"basic":[32],"idea":[33],"DAOI-ELM":[35,71,111,136],"incorporate":[38],"Gram-Schmidt":[40],"orthogonalization":[41],"method":[42],"and":[43,61,77,92,98,114,129],"into":[46],"(I-ELM).":[52],"case":[54],"study":[55],"2-D":[58],"nonlinear":[59],"function":[60],"regression":[62],"problems":[63],"from":[64,103],"UCI":[66],"dataset":[67],"results":[68,133],"show":[69,134],"that":[70,117,135],"can":[72],"obtain":[73],"better":[74,141],"generalization":[75],"ability":[76],"a":[78],"more":[79],"compact":[80],"structure":[81],"ELM":[83],"than":[84,142],"I-ELM,":[85,127],"convex":[86],"I-ELM":[87,90],"(CI-ELM),":[88],"(OI-ELM),":[91],"bidirectional":[93],"ELM.":[94],"experimental":[96],"training":[97],"testing":[99],"data":[100],"are":[101],"derived":[102],"simulations":[105],"TEP.":[107],"performance":[109],"evaluated":[113],"compared":[115],"with":[116],"back":[120],"propagation":[121],"neural":[122],"network,":[123],"support":[124],"vector":[125],"machine,":[126],"CI-ELM,":[128],"OI-ELM.":[130],"simulation":[132],"diagnoses":[137],"TEP":[139],"other":[143],"methods.":[144]},"counts_by_year":[{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":11},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":16},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":7},{"year":2019,"cited_by_count":9},{"year":2018,"cited_by_count":5}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}
