{"id":"https://openalex.org/W2589306531","doi":"https://doi.org/10.1109/tcyb.2017.2668395","title":"A Generic Deep-Learning-Based Approach for Automated Surface Inspection","display_name":"A Generic Deep-Learning-Based Approach for Automated Surface Inspection","publication_year":2017,"publication_date":"2017-02-24","ids":{"openalex":"https://openalex.org/W2589306531","doi":"https://doi.org/10.1109/tcyb.2017.2668395","mag":"2589306531","pmid":"https://pubmed.ncbi.nlm.nih.gov/28252414"},"language":"en","primary_location":{"id":"doi:10.1109/tcyb.2017.2668395","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcyb.2017.2668395","pdf_url":null,"source":{"id":"https://openalex.org/S4210191041","display_name":"IEEE Transactions on Cybernetics","issn_l":"2168-2267","issn":["2168-2267","2168-2275"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Cybernetics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","pubmed"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5015718923","display_name":"Ruoxu Ren","orcid":"https://orcid.org/0000-0001-9080-0340"},"institutions":[{"id":"https://openalex.org/I165932596","display_name":"National University of Singapore","ror":"https://ror.org/01tgyzw49","country_code":"SG","type":"education","lineage":["https://openalex.org/I165932596"]}],"countries":["SG"],"is_corresponding":true,"raw_author_name":"Ruoxu Ren","raw_affiliation_strings":["Applied Technology Group, Rolls-Royce Singapore, Singapore","Department of Electrical and Computer Engineering, National University of Singapore, Singapore"],"affiliations":[{"raw_affiliation_string":"Applied Technology Group, Rolls-Royce Singapore, Singapore","institution_ids":[]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, National University of Singapore, Singapore","institution_ids":["https://openalex.org/I165932596"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081481430","display_name":"Terence Hung","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Terence Hung","raw_affiliation_strings":["Applied Technology Group, Rolls-Royce Singapore, Singapore"],"affiliations":[{"raw_affiliation_string":"Applied Technology Group, Rolls-Royce Singapore, Singapore","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025285243","display_name":"Kay Chen Tan","orcid":"https://orcid.org/0000-0002-6802-2463"},"institutions":[{"id":"https://openalex.org/I168719708","display_name":"City University of Hong Kong","ror":"https://ror.org/03q8dnn23","country_code":"HK","type":"education","lineage":["https://openalex.org/I168719708"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Kay Chen Tan","raw_affiliation_strings":["Department of Computer Science, City University of Hong Kong, Hong Kong"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, City University of Hong Kong, Hong Kong","institution_ids":["https://openalex.org/I168719708"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5015718923"],"corresponding_institution_ids":["https://openalex.org/I165932596"],"apc_list":null,"apc_paid":null,"fwci":50.0038,"has_fulltext":false,"cited_by_count":480,"citation_normalized_percentile":{"value":0.99895085,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":100},"biblio":{"volume":"48","issue":"3","first_page":"929","last_page":"940"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9901999831199646,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7918484210968018},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7351541519165039},{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.72065669298172},{"id":"https://openalex.org/keywords/classifier","display_name":"Classifier (UML)","score":0.6615819931030273},{"id":"https://openalex.org/keywords/word-error-rate","display_name":"Word error rate","score":0.5759854316711426},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5574004650115967},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.4986300468444824},{"id":"https://openalex.org/keywords/training-set","display_name":"Training set","score":0.4913283884525299},{"id":"https://openalex.org/keywords/task","display_name":"Task (project management)","score":0.47527259588241577},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.43750759959220886},{"id":"https://openalex.org/keywords/image-segmentation","display_name":"Image segmentation","score":0.43056023120880127},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.3349263072013855},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08633807301521301}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7918484210968018},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7351541519165039},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.72065669298172},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.6615819931030273},{"id":"https://openalex.org/C40969351","wikidata":"https://www.wikidata.org/wiki/Q3516228","display_name":"Word error rate","level":2,"score":0.5759854316711426},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5574004650115967},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.4986300468444824},{"id":"https://openalex.org/C51632099","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Training set","level":2,"score":0.4913283884525299},{"id":"https://openalex.org/C2780451532","wikidata":"https://www.wikidata.org/wiki/Q759676","display_name":"Task (project management)","level":2,"score":0.47527259588241577},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.43750759959220886},{"id":"https://openalex.org/C124504099","wikidata":"https://www.wikidata.org/wiki/Q56933","display_name":"Image segmentation","level":3,"score":0.43056023120880127},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.3349263072013855},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08633807301521301},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tcyb.2017.2668395","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcyb.2017.2668395","pdf_url":null,"source":{"id":"https://openalex.org/S4210191041","display_name":"IEEE Transactions on Cybernetics","issn_l":"2168-2267","issn":["2168-2267","2168-2275"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Cybernetics","raw_type":"journal-article"},{"id":"pmid:28252414","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/28252414","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE transactions on cybernetics","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.6399999856948853}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":55,"referenced_works":["https://openalex.org/W47126999","https://openalex.org/W60298037","https://openalex.org/W192729464","https://openalex.org/W1570692647","https://openalex.org/W1937412611","https://openalex.org/W1975551334","https://openalex.org/W1980004124","https://openalex.org/W1987056043","https://openalex.org/W1988299413","https://openalex.org/W1988670984","https://openalex.org/W1999478155","https://openalex.org/W2007854896","https://openalex.org/W2014360807","https://openalex.org/W2017672812","https://openalex.org/W2020113819","https://openalex.org/W2044465660","https://openalex.org/W2047643928","https://openalex.org/W2053593539","https://openalex.org/W2062118960","https://openalex.org/W2072994056","https://openalex.org/W2076063813","https://openalex.org/W2088478449","https://openalex.org/W2092072518","https://openalex.org/W2097946161","https://openalex.org/W2110125524","https://openalex.org/W2113101204","https://openalex.org/W2121166252","https://openalex.org/W2133059825","https://openalex.org/W2141697870","https://openalex.org/W2145456339","https://openalex.org/W2149933564","https://openalex.org/W2155541015","https://openalex.org/W2158191924","https://openalex.org/W2163352848","https://openalex.org/W2163605009","https://openalex.org/W2175342987","https://openalex.org/W2316169433","https://openalex.org/W2917344403","https://openalex.org/W2963542991","https://openalex.org/W4249127829","https://openalex.org/W4250878893","https://openalex.org/W4285719527","https://openalex.org/W4294375521","https://openalex.org/W4299518610","https://openalex.org/W6602435033","https://openalex.org/W6607887029","https://openalex.org/W6629368666","https://openalex.org/W6640242225","https://openalex.org/W6663851081","https://openalex.org/W6680096826","https://openalex.org/W6682132143","https://openalex.org/W6682778277","https://openalex.org/W6683470745","https://openalex.org/W6684191040","https://openalex.org/W6760000479"],"related_works":["https://openalex.org/W2981877337","https://openalex.org/W3203938600","https://openalex.org/W4286910063","https://openalex.org/W2163707935","https://openalex.org/W83146503","https://openalex.org/W2169074127","https://openalex.org/W202723009","https://openalex.org/W2188612292","https://openalex.org/W2146197305","https://openalex.org/W2134950286"],"abstract_inverted_index":{"Automated":[0],"surface":[1],"inspection":[2],"(ASI)":[3],"is":[4,14,36,63,83],"a":[5,26,55],"challenging":[6],"task":[7,162],"in":[8,109,135,144,159],"industry,":[9],"as":[10],"collecting":[11],"training":[12,32],"dataset":[13],"usually":[15],"costly":[16],"and":[17,78,94,139],"related":[18],"methods":[19],"are":[20,52,103],"highly":[21],"dataset-dependent.":[22],"In":[23,111,122,149],"this":[24,39],"paper,":[25],"generic":[27],"approach":[28,40],"that":[29],"requires":[30],"small":[31],"data":[33,81],"for":[34],"ASI":[35],"proposed.":[37],"First,":[38],"builds":[41],"classifier":[42,69],"on":[43,75],"the":[44,50,67,112,115,123,126,151,160],"features":[45,51],"of":[46,100,163],"image":[47,92],"patches,":[48],"where":[49],"transferred":[53],"from":[54],"pretrained":[56],"deep":[57],"learning":[58],"network.":[59],"Next,":[60],"pixel-wise":[61],"prediction":[62],"obtained":[64],"by":[65,120,133,142],"convolving":[66],"trained":[68],"over":[70],"input":[71],"image.":[72],"An":[73],"experiment":[74,87],"three":[76,136],"public":[77],"one":[79],"industrial":[80,164],"set":[82],"carried":[84],"out.":[85],"The":[86,98],"involves":[88],"two":[89],"tasks:":[90],"1)":[91],"classification":[93,113],"2)":[95],"defect":[96,137,147],"segmentation.":[97],"results":[99],"proposed":[101,116,127,152],"algorithm":[102],"compared":[104],"against":[105],"several":[106],"best":[107],"benchmarks":[108],"literature.":[110],"tasks,":[114,125],"method":[117,128,153],"improves":[118,140],"accuracy":[119],"0.66%-25.50%.":[121],"segmentation":[124,161],"reduces":[129],"error":[130,156],"escape":[131,157],"rates":[132],"6.00%-19.00%":[134],"types":[138],"accuracies":[141],"2.29%-9.86%":[143],"all":[145],"seven":[146],"types.":[148],"addition,":[150],"achieves":[154],"0.0%":[155],"rate":[158],"data.":[165]},"counts_by_year":[{"year":2026,"cited_by_count":6},{"year":2025,"cited_by_count":35},{"year":2024,"cited_by_count":42},{"year":2023,"cited_by_count":70},{"year":2022,"cited_by_count":84},{"year":2021,"cited_by_count":80},{"year":2020,"cited_by_count":77},{"year":2019,"cited_by_count":56},{"year":2018,"cited_by_count":27},{"year":2017,"cited_by_count":3}],"updated_date":"2026-04-07T14:57:38.498316","created_date":"2025-10-10T00:00:00"}