{"id":"https://openalex.org/W4391936080","doi":"https://doi.org/10.1109/tcst.2024.3363370","title":"Kalman Filter-Based Estimation of Surface Conductivity and Surface Variations in Scanning Tunneling Microscopy","display_name":"Kalman Filter-Based Estimation of Surface Conductivity and Surface Variations in Scanning Tunneling Microscopy","publication_year":2024,"publication_date":"2024-02-19","ids":{"openalex":"https://openalex.org/W4391936080","doi":"https://doi.org/10.1109/tcst.2024.3363370"},"language":"en","primary_location":{"id":"doi:10.1109/tcst.2024.3363370","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcst.2024.3363370","pdf_url":null,"source":{"id":"https://openalex.org/S133363738","display_name":"IEEE Transactions on Control Systems Technology","issn_l":"1063-6536","issn":["1063-6536","1558-0865","2374-0159"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Control Systems Technology","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103028637","display_name":"Richa Mishra","orcid":"https://orcid.org/0009-0008-7181-4622"},"institutions":[{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Richa Mishra","raw_affiliation_strings":["Erik Jonsson School of Engineering and Computer Science, The University of Texas at Dallas, Richardson, TX, USA"],"affiliations":[{"raw_affiliation_string":"Erik Jonsson School of Engineering and Computer Science, The University of Texas at Dallas, Richardson, TX, USA","institution_ids":["https://openalex.org/I162577319"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5061619957","display_name":"S. O. Reza Moheimani","orcid":"https://orcid.org/0000-0002-1225-4126"},"institutions":[{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. O. Reza Moheimani","raw_affiliation_strings":["Erik Jonsson School of Engineering and Computer Science, The University of Texas at Dallas, Richardson, TX, USA"],"affiliations":[{"raw_affiliation_string":"Erik Jonsson School of Engineering and Computer Science, The University of Texas at Dallas, Richardson, TX, USA","institution_ids":["https://openalex.org/I162577319"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5103028637"],"corresponding_institution_ids":["https://openalex.org/I162577319"],"apc_list":null,"apc_paid":null,"fwci":0.7205,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.65764268,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":"32","issue":"4","first_page":"1298","last_page":"1309"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13531","display_name":"Surface and Thin Film Phenomena","score":0.9958000183105469,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13531","display_name":"Surface and Thin Film Phenomena","score":0.9958000183105469,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9854999780654907,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.9785000085830688,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/kalman-filter","display_name":"Kalman filter","score":0.7942507863044739},{"id":"https://openalex.org/keywords/scanning-tunneling-microscope","display_name":"Scanning tunneling microscope","score":0.5648595094680786},{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.5479408502578735},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5265322327613831},{"id":"https://openalex.org/keywords/scanning-probe-microscopy","display_name":"Scanning probe microscopy","score":0.5220006704330444},{"id":"https://openalex.org/keywords/extended-kalman-filter","display_name":"Extended Kalman filter","score":0.4429852068424225},{"id":"https://openalex.org/keywords/moving-horizon-estimation","display_name":"Moving horizon estimation","score":0.4404814839363098},{"id":"https://openalex.org/keywords/conductivity","display_name":"Conductivity","score":0.4137299656867981},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3095778822898865},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.2908335328102112},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.23875606060028076},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.2334231436252594},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1724487543106079},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.13791057467460632}],"concepts":[{"id":"https://openalex.org/C157286648","wikidata":"https://www.wikidata.org/wiki/Q846780","display_name":"Kalman filter","level":2,"score":0.7942507863044739},{"id":"https://openalex.org/C6518042","wikidata":"https://www.wikidata.org/wiki/Q175646","display_name":"Scanning tunneling microscope","level":2,"score":0.5648595094680786},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.5479408502578735},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5265322327613831},{"id":"https://openalex.org/C36628996","wikidata":"https://www.wikidata.org/wiki/Q907287","display_name":"Scanning probe microscopy","level":2,"score":0.5220006704330444},{"id":"https://openalex.org/C206833254","wikidata":"https://www.wikidata.org/wiki/Q5421817","display_name":"Extended Kalman filter","level":3,"score":0.4429852068424225},{"id":"https://openalex.org/C50050547","wikidata":"https://www.wikidata.org/wiki/Q6927137","display_name":"Moving horizon estimation","level":4,"score":0.4404814839363098},{"id":"https://openalex.org/C131540310","wikidata":"https://www.wikidata.org/wiki/Q907564","display_name":"Conductivity","level":2,"score":0.4137299656867981},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3095778822898865},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2908335328102112},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.23875606060028076},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.2334231436252594},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1724487543106079},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.13791057467460632},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcst.2024.3363370","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcst.2024.3363370","pdf_url":null,"source":{"id":"https://openalex.org/S133363738","display_name":"IEEE Transactions on Control Systems Technology","issn_l":"1063-6536","issn":["1063-6536","1558-0865","2374-0159"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Control Systems Technology","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2881896293","display_name":null,"funder_award_id":"DE-SC0020827","funder_id":"https://openalex.org/F4320306084","funder_display_name":"U.S. Department of Energy"},{"id":"https://openalex.org/G4348564067","display_name":null,"funder_award_id":"DE-EE0008322","funder_id":"https://openalex.org/F4320306084","funder_display_name":"U.S. Department of Energy"}],"funders":[{"id":"https://openalex.org/F4320306084","display_name":"U.S. Department of Energy","ror":"https://ror.org/01bj3aw27"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":39,"referenced_works":["https://openalex.org/W304861154","https://openalex.org/W1964263641","https://openalex.org/W1982505882","https://openalex.org/W1982799726","https://openalex.org/W1983684958","https://openalex.org/W2004328597","https://openalex.org/W2024962018","https://openalex.org/W2027327117","https://openalex.org/W2033013230","https://openalex.org/W2036033789","https://openalex.org/W2045177544","https://openalex.org/W2054044116","https://openalex.org/W2055756780","https://openalex.org/W2055759100","https://openalex.org/W2056577791","https://openalex.org/W2067326868","https://openalex.org/W2067993066","https://openalex.org/W2069946400","https://openalex.org/W2087433409","https://openalex.org/W2091981364","https://openalex.org/W2094800639","https://openalex.org/W2108018421","https://openalex.org/W2147405040","https://openalex.org/W2165781683","https://openalex.org/W2214506747","https://openalex.org/W2502777640","https://openalex.org/W2735698164","https://openalex.org/W2762108646","https://openalex.org/W2781774348","https://openalex.org/W2790374560","https://openalex.org/W2810641743","https://openalex.org/W3126045158","https://openalex.org/W3126067356","https://openalex.org/W3173467603","https://openalex.org/W3176261461","https://openalex.org/W4210433495","https://openalex.org/W4237444302","https://openalex.org/W4256406198","https://openalex.org/W4312594221"],"related_works":["https://openalex.org/W2103062922","https://openalex.org/W2162299404","https://openalex.org/W2893231799","https://openalex.org/W2562855176","https://openalex.org/W4300640027","https://openalex.org/W1501322398","https://openalex.org/W2674597762","https://openalex.org/W1541063877","https://openalex.org/W4231082752","https://openalex.org/W1506303183"],"abstract_inverted_index":{"In":[0,22],"this":[1,53,97],"article,":[2],"we":[3],"present":[4],"a":[5,23,44,58,63,92,106],"novel":[6],"method":[7,98,123],"for":[8],"decoupling":[9],"surface":[10,15,28,68,78,115,127,130],"electronic":[11],"properties":[12,29],"from":[13,87],"topographic":[14],"variations":[16],"in":[17,55,124],"scanning":[18],"tunneling":[19],"microscope":[20],"(STM).":[21],"conventional":[24],"STM":[25],"image,":[26],"these":[27],"are":[30],"mixed,":[31],"and":[32,62,77,129],"separating":[33],"them":[34],"is":[35],"nontrivial.":[36],"We":[37,50,94],"perform":[38],"closed-loop":[39],"system":[40],"identification":[41],"to":[42,66,116],"obtain":[43],"dynamic":[45],"model":[46,54],"of":[47,120],"the":[48,88,118],"STM.":[49],"then":[51],"use":[52],"conjunction":[56],"with":[57],"Kalman":[59],"filter":[60],"(KF)":[61],"disturbance":[64],"observer":[65],"estimate":[67],"conductivity,":[69],"<inline-formula":[70,80,107],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[71,81,108],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[72,82,109],"<tex-math":[73,83,110],"notation=\"LaTeX\">$\\sigma$</tex-math>":[74],"</inline-formula>":[75,85,113],",":[76,86],"variations,":[79],"notation=\"LaTeX\">$h$</tex-math>":[84],"measurements":[89],"obtained":[90],"during":[91],"scan.":[93],"experimentally":[95],"verify":[96],"by":[99],"first":[100],"performing":[101],"hydrogen":[102],"depassivation":[103],"lithography":[104],"on":[105],"notation=\"LaTeX\">$\\mathrm{Si(100)-2\\times":[111],"1:H}$</tex-math>":[112],"passivated":[114],"demonstrate":[117],"effectiveness":[119],"our":[121],"proposed":[122],"accurately":[125],"estimating":[126],"conductivity":[128],"height":[131],"variations.":[132]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}