{"id":"https://openalex.org/W2916345052","doi":"https://doi.org/10.1109/tcst.2019.2895798","title":"Adaptive Scan for Atomic Force Microscopy Based on Online Optimization: Theory and Experiment","display_name":"Adaptive Scan for Atomic Force Microscopy Based on Online Optimization: Theory and Experiment","publication_year":2019,"publication_date":"2019-02-18","ids":{"openalex":"https://openalex.org/W2916345052","doi":"https://doi.org/10.1109/tcst.2019.2895798","mag":"2916345052"},"language":"en","primary_location":{"id":"doi:10.1109/tcst.2019.2895798","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcst.2019.2895798","pdf_url":null,"source":{"id":"https://openalex.org/S133363738","display_name":"IEEE Transactions on Control Systems Technology","issn_l":"1063-6536","issn":["1063-6536","1558-0865","2374-0159"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Control Systems Technology","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101797386","display_name":"Kaixiang Wang","orcid":"https://orcid.org/0000-0003-3466-3884"},"institutions":[{"id":"https://openalex.org/I165779595","display_name":"The University of Melbourne","ror":"https://ror.org/01ej9dk98","country_code":"AU","type":"education","lineage":["https://openalex.org/I165779595"]}],"countries":["AU"],"is_corresponding":false,"raw_author_name":"Kaixiang Wang","raw_affiliation_strings":["Department of Mechanical Engineering, The University of Melbourne, Parkville, Australia"],"raw_orcid":"https://orcid.org/0000-0003-3466-3884","affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, The University of Melbourne, Parkville, Australia","institution_ids":["https://openalex.org/I165779595"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013074934","display_name":"Michael G. Ruppert","orcid":"https://orcid.org/0000-0003-2286-4929"},"institutions":[{"id":"https://openalex.org/I78757542","display_name":"University of Newcastle Australia","ror":"https://ror.org/00eae9z71","country_code":"AU","type":"education","lineage":["https://openalex.org/I78757542"]}],"countries":["AU"],"is_corresponding":false,"raw_author_name":"Michael G. Ruppert","raw_affiliation_strings":["School of Electrical Engineering and Computing, The University of Newcastle, Callaghan, Australia"],"raw_orcid":"https://orcid.org/0000-0003-2286-4929","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Computing, The University of Newcastle, Callaghan, Australia","institution_ids":["https://openalex.org/I78757542"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020178903","display_name":"Chris Manzie","orcid":"https://orcid.org/0000-0002-9969-0982"},"institutions":[{"id":"https://openalex.org/I165779595","display_name":"The University of Melbourne","ror":"https://ror.org/01ej9dk98","country_code":"AU","type":"education","lineage":["https://openalex.org/I165779595"]}],"countries":["AU"],"is_corresponding":false,"raw_author_name":"Chris Manzie","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, The University of Melbourne, Parkville, Australia"],"raw_orcid":"https://orcid.org/0000-0002-9969-0982","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, The University of Melbourne, Parkville, Australia","institution_ids":["https://openalex.org/I165779595"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035230630","display_name":"Dragan Ne\u0161i\u0107","orcid":"https://orcid.org/0000-0001-7944-0241"},"institutions":[{"id":"https://openalex.org/I165779595","display_name":"The University of Melbourne","ror":"https://ror.org/01ej9dk98","country_code":"AU","type":"education","lineage":["https://openalex.org/I165779595"]}],"countries":["AU"],"is_corresponding":false,"raw_author_name":"Dragan Nesic","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, The University of Melbourne, Parkville, Australia"],"raw_orcid":"https://orcid.org/0000-0001-7944-0241","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, The University of Melbourne, Parkville, Australia","institution_ids":["https://openalex.org/I165779595"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5022476782","display_name":"Yuen Kuan Yong","orcid":"https://orcid.org/0000-0001-7363-5304"},"institutions":[{"id":"https://openalex.org/I78757542","display_name":"University of Newcastle Australia","ror":"https://ror.org/00eae9z71","country_code":"AU","type":"education","lineage":["https://openalex.org/I78757542"]}],"countries":["AU"],"is_corresponding":false,"raw_author_name":"Yuen Kuan Yong","raw_affiliation_strings":["School of Electrical Engineering and Computing, The University of Newcastle, Callaghan, Australia"],"raw_orcid":"https://orcid.org/0000-0001-7363-5304","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Computing, The University of Newcastle, Callaghan, Australia","institution_ids":["https://openalex.org/I78757542"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.4158,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.82148009,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"28","issue":"3","first_page":"869","last_page":"883"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11525","display_name":"Piezoelectric Actuators and Control","score":0.9921000003814697,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12224","display_name":"Nanofabrication and Lithography Techniques","score":0.9915000200271606,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/atomic-force-microscopy","display_name":"Atomic force microscopy","score":0.6037675738334656},{"id":"https://openalex.org/keywords/non-contact-atomic-force-microscopy","display_name":"Non-contact atomic force microscopy","score":0.49235832691192627},{"id":"https://openalex.org/keywords/microscopy","display_name":"Microscopy","score":0.47393661737442017},{"id":"https://openalex.org/keywords/atomic-force-acoustic-microscopy","display_name":"Atomic force acoustic microscopy","score":0.4546133279800415},{"id":"https://openalex.org/keywords/magnetic-force-microscope","display_name":"Magnetic force microscope","score":0.44364774227142334},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.36639487743377686},{"id":"https://openalex.org/keywords/kelvin-probe-force-microscope","display_name":"Kelvin probe force microscope","score":0.35694146156311035},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.35012513399124146},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.35005417466163635},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.28123557567596436},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.2797301113605499},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.24132364988327026},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.10760641098022461}],"concepts":[{"id":"https://openalex.org/C102951782","wikidata":"https://www.wikidata.org/wiki/Q49295","display_name":"Atomic force microscopy","level":2,"score":0.6037675738334656},{"id":"https://openalex.org/C71246147","wikidata":"https://www.wikidata.org/wiki/Q16029538","display_name":"Non-contact atomic force microscopy","level":4,"score":0.49235832691192627},{"id":"https://openalex.org/C147080431","wikidata":"https://www.wikidata.org/wiki/Q1074953","display_name":"Microscopy","level":2,"score":0.47393661737442017},{"id":"https://openalex.org/C43826995","wikidata":"https://www.wikidata.org/wiki/Q17014103","display_name":"Atomic force acoustic microscopy","level":5,"score":0.4546133279800415},{"id":"https://openalex.org/C181635281","wikidata":"https://www.wikidata.org/wiki/Q2799395","display_name":"Magnetic force microscope","level":4,"score":0.44364774227142334},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.36639487743377686},{"id":"https://openalex.org/C83898325","wikidata":"https://www.wikidata.org/wiki/Q1324110","display_name":"Kelvin probe force microscope","level":3,"score":0.35694146156311035},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.35012513399124146},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.35005417466163635},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.28123557567596436},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.2797301113605499},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.24132364988327026},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.10760641098022461},{"id":"https://openalex.org/C32546565","wikidata":"https://www.wikidata.org/wiki/Q856711","display_name":"Magnetization","level":3,"score":0.0},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tcst.2019.2895798","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcst.2019.2895798","pdf_url":null,"source":{"id":"https://openalex.org/S133363738","display_name":"IEEE Transactions on Control Systems Technology","issn_l":"1063-6536","issn":["1063-6536","1558-0865","2374-0159"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Control Systems Technology","raw_type":"journal-article"},{"id":"pmh:uon:44539","is_oa":false,"landing_page_url":"http://hdl.handle.net/1959.13/1452926","pdf_url":null,"source":{"id":"https://openalex.org/S4306401391","display_name":"NOVA (University of Newcastle, Australia)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I78757542","host_organization_name":"University of Newcastle Australia","host_organization_lineage":["https://openalex.org/I78757542"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"journal article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":41,"referenced_works":["https://openalex.org/W114979488","https://openalex.org/W1579530897","https://openalex.org/W1967445304","https://openalex.org/W1975928756","https://openalex.org/W2005656307","https://openalex.org/W2019077128","https://openalex.org/W2019462738","https://openalex.org/W2024303936","https://openalex.org/W2042028590","https://openalex.org/W2043703444","https://openalex.org/W2047357456","https://openalex.org/W2053249052","https://openalex.org/W2058209887","https://openalex.org/W2065325399","https://openalex.org/W2067147925","https://openalex.org/W2068162240","https://openalex.org/W2068401877","https://openalex.org/W2074586010","https://openalex.org/W2075916174","https://openalex.org/W2078463398","https://openalex.org/W2082935967","https://openalex.org/W2084322412","https://openalex.org/W2092010593","https://openalex.org/W2102840460","https://openalex.org/W2105343910","https://openalex.org/W2113608953","https://openalex.org/W2118600801","https://openalex.org/W2127934173","https://openalex.org/W2137370905","https://openalex.org/W2143862071","https://openalex.org/W2144651557","https://openalex.org/W2147509943","https://openalex.org/W2162461129","https://openalex.org/W2166632579","https://openalex.org/W2414774309","https://openalex.org/W2488461993","https://openalex.org/W2564895605","https://openalex.org/W2592170858","https://openalex.org/W2782823635","https://openalex.org/W2783310548","https://openalex.org/W6734248742"],"related_works":["https://openalex.org/W2112760685","https://openalex.org/W2278491674","https://openalex.org/W2107151021","https://openalex.org/W2951248961","https://openalex.org/W4230574023","https://openalex.org/W2046206102","https://openalex.org/W2057733030","https://openalex.org/W4289234543","https://openalex.org/W2746982208","https://openalex.org/W2083085260"],"abstract_inverted_index":{"A":[0,86],"major":[1],"challenge":[2],"in":[3,29,48,60,112],"atomic":[4],"force":[5],"microscopy":[6],"is":[7,22,80,97,103,109,125,138,148],"to":[8,24,31,82],"reduce":[9],"the":[10,15,19,100,107,113,141,145],"scan":[11,20,51,65,78,87,101],"duration":[12],"while":[13],"retaining":[14],"image":[16,35],"quality.":[17],"Conventionally,":[18],"rate":[21,52,102],"restricted":[23],"a":[25,33,40,49,57,69,132],"sufficiently":[26],"small":[27],"value":[28],"order":[30],"ensure":[32],"desirable":[34],"quality":[36],"as":[37,39],"well":[38],"safe":[41],"tip-sample":[42],"contact":[43],"force.":[44],"This":[45],"usually":[46],"results":[47],"conservative":[50],"for":[53,64,140],"samples":[54],"that":[55,67,106],"have":[56,68],"large":[58],"variation":[59],"aspect":[61,116],"ratio":[62,117],"and/or":[63,118],"patterns":[66],"varying":[70],"linear":[71,119],"velocity.":[72],"In":[73],"this":[74,84],"paper,":[75],"an":[76,128],"adaptive":[77],"scheme":[79,147],"proposed":[81,146],"alleviate":[83],"problem.":[85],"line-based":[88],"performance":[89],"metric":[90,108],"balancing":[91],"both":[92,151],"imaging":[93],"speed":[94],"and":[95,99,131,153],"accuracy":[96],"proposed,":[98],"adapted":[104],"such":[105],"optimized":[110],"online":[111,123],"presence":[114],"of":[115],"velocity":[120],"variations.":[121],"The":[122],"optimization":[124],"achieved":[126],"using":[127],"extremum-seeking":[129],"approach,":[130],"semiglobal":[133],"practical":[134],"asymptotic":[135],"stability":[136],"result":[137],"shown":[139],"overall":[142],"system.":[143],"Finally,":[144],"demonstrated":[149],"via":[150],"simulation":[152],"experiment.":[154]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}
