{"id":"https://openalex.org/W2891236523","doi":"https://doi.org/10.1109/tcst.2018.2866976","title":"Probability-Relevant Incipient Fault Detection and Diagnosis Methodology With Applications to Electric Drive Systems","display_name":"Probability-Relevant Incipient Fault Detection and Diagnosis Methodology With Applications to Electric Drive Systems","publication_year":2018,"publication_date":"2018-09-21","ids":{"openalex":"https://openalex.org/W2891236523","doi":"https://doi.org/10.1109/tcst.2018.2866976","mag":"2891236523"},"language":"en","primary_location":{"id":"doi:10.1109/tcst.2018.2866976","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcst.2018.2866976","pdf_url":null,"source":{"id":"https://openalex.org/S133363738","display_name":"IEEE Transactions on Control Systems Technology","issn_l":"1063-6536","issn":["1063-6536","1558-0865","2374-0159"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Control Systems Technology","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5019419996","display_name":"Hongtian Chen","orcid":"https://orcid.org/0000-0002-8600-9668"},"institutions":[{"id":"https://openalex.org/I9842412","display_name":"Nanjing University of Aeronautics and Astronautics","ror":"https://ror.org/01scyh794","country_code":"CN","type":"education","lineage":["https://openalex.org/I9842412"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongtian Chen","raw_affiliation_strings":["Jiangsu Key Laboratory of Internet of Things and Control Technologies, Nanjing University of Aeronautics and Astronautics, Nanjing, China"],"raw_orcid":"https://orcid.org/0000-0002-8600-9668","affiliations":[{"raw_affiliation_string":"Jiangsu Key Laboratory of Internet of Things and Control Technologies, Nanjing University of Aeronautics and Astronautics, Nanjing, China","institution_ids":["https://openalex.org/I9842412"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100635445","display_name":"Bin Jiang","orcid":"https://orcid.org/0000-0002-9153-4360"},"institutions":[{"id":"https://openalex.org/I9842412","display_name":"Nanjing University of Aeronautics and Astronautics","ror":"https://ror.org/01scyh794","country_code":"CN","type":"education","lineage":["https://openalex.org/I9842412"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bin Jiang","raw_affiliation_strings":["Jiangsu Key Laboratory of Internet of Things and Control Technologies, Nanjing University of Aeronautics and Astronautics, Nanjing, China"],"raw_orcid":"https://orcid.org/0000-0002-9153-4360","affiliations":[{"raw_affiliation_string":"Jiangsu Key Laboratory of Internet of Things and Control Technologies, Nanjing University of Aeronautics and Astronautics, Nanjing, China","institution_ids":["https://openalex.org/I9842412"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046071840","display_name":"Steven X. Ding","orcid":"https://orcid.org/0000-0002-5149-5918"},"institutions":[{"id":"https://openalex.org/I62318514","display_name":"University of Duisburg-Essen","ror":"https://ror.org/04mz5ra38","country_code":"DE","type":"education","lineage":["https://openalex.org/I62318514"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Steven X. Ding","raw_affiliation_strings":["Institute for Automatic Control and Complex Systems, University of Duisburg\u2013Essen, Duisburg, Germany"],"raw_orcid":"https://orcid.org/0000-0002-5149-5918","affiliations":[{"raw_affiliation_string":"Institute for Automatic Control and Complex Systems, University of Duisburg\u2013Essen, Duisburg, Germany","institution_ids":["https://openalex.org/I62318514"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039464384","display_name":"Ningyun Lu","orcid":"https://orcid.org/0000-0002-9964-7677"},"institutions":[{"id":"https://openalex.org/I9842412","display_name":"Nanjing University of Aeronautics and Astronautics","ror":"https://ror.org/01scyh794","country_code":"CN","type":"education","lineage":["https://openalex.org/I9842412"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ningyun Lu","raw_affiliation_strings":["Jiangsu Key Laboratory of Internet of Things and Control Technologies, Nanjing University of Aeronautics and Astronautics, Nanjing, China"],"raw_orcid":"https://orcid.org/0000-0002-9964-7677","affiliations":[{"raw_affiliation_string":"Jiangsu Key Laboratory of Internet of Things and Control Technologies, Nanjing University of Aeronautics and Astronautics, Nanjing, China","institution_ids":["https://openalex.org/I9842412"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100344182","display_name":"Wen Chen","orcid":"https://orcid.org/0000-0002-8726-8602"},"institutions":[{"id":"https://openalex.org/I185443292","display_name":"Wayne State University","ror":"https://ror.org/01070mq45","country_code":"US","type":"education","lineage":["https://openalex.org/I185443292"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Wen Chen","raw_affiliation_strings":["Division of Engineering Technology, Wayne State University, Detroit, MI, USA"],"raw_orcid":"https://orcid.org/0000-0002-8726-8602","affiliations":[{"raw_affiliation_string":"Division of Engineering Technology, Wayne State University, Detroit, MI, USA","institution_ids":["https://openalex.org/I185443292"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":9.4956,"has_fulltext":false,"cited_by_count":87,"citation_normalized_percentile":{"value":0.98444106,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":100},"biblio":{"volume":"27","issue":"6","first_page":"2766","last_page":"2773"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9933000206947327,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10640","display_name":"Spectroscopy and Chemometric Analyses","score":0.9930999875068665,"subfield":{"id":"https://openalex.org/subfields/1602","display_name":"Analytical Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.6805135607719421},{"id":"https://openalex.org/keywords/false-alarm","display_name":"False alarm","score":0.6579403281211853},{"id":"https://openalex.org/keywords/principal-component-analysis","display_name":"Principal component analysis","score":0.578500509262085},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5625611543655396},{"id":"https://openalex.org/keywords/divergence","display_name":"Divergence (linguistics)","score":0.5315496921539307},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4921686053276062},{"id":"https://openalex.org/keywords/bayesian-probability","display_name":"Bayesian probability","score":0.4541589021682739},{"id":"https://openalex.org/keywords/bayesian-inference","display_name":"Bayesian inference","score":0.4157649576663971},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3498496115207672},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.33314740657806396}],"concepts":[{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.6805135607719421},{"id":"https://openalex.org/C2776836416","wikidata":"https://www.wikidata.org/wiki/Q1364844","display_name":"False alarm","level":2,"score":0.6579403281211853},{"id":"https://openalex.org/C27438332","wikidata":"https://www.wikidata.org/wiki/Q2873","display_name":"Principal component analysis","level":2,"score":0.578500509262085},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5625611543655396},{"id":"https://openalex.org/C207390915","wikidata":"https://www.wikidata.org/wiki/Q1230525","display_name":"Divergence (linguistics)","level":2,"score":0.5315496921539307},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4921686053276062},{"id":"https://openalex.org/C107673813","wikidata":"https://www.wikidata.org/wiki/Q812534","display_name":"Bayesian probability","level":2,"score":0.4541589021682739},{"id":"https://openalex.org/C160234255","wikidata":"https://www.wikidata.org/wiki/Q812535","display_name":"Bayesian inference","level":3,"score":0.4157649576663971},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3498496115207672},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.33314740657806396},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcst.2018.2866976","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcst.2018.2866976","pdf_url":null,"source":{"id":"https://openalex.org/S133363738","display_name":"IEEE Transactions on Control Systems Technology","issn_l":"1063-6536","issn":["1063-6536","1558-0865","2374-0159"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Control Systems Technology","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2037016199","display_name":null,"funder_award_id":"KYLX16_0378","funder_id":"https://openalex.org/F4320335769","funder_display_name":"Graduate Research and Innovation Projects of Jiangsu Province"},{"id":"https://openalex.org/G8124993113","display_name":null,"funder_award_id":"61573180","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8796025706","display_name":null,"funder_award_id":"61490703","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8969758742","display_name":"\u57fa\u4e8e\u4e0d\u786e\u5b9a\u4fe1\u606f\u7684\u8f67\u5236\u8fc7\u7a0b\u6545\u969c\u9884\u6d4b\u4e0e\u8bca\u65ad\u5173\u952e\u6280\u672f\u7814\u7a76","funder_award_id":"61374141","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320327518","display_name":"Priority Academic Program Development of Jiangsu Higher Education Institutions","ror":null},{"id":"https://openalex.org/F4320335769","display_name":"Graduate Research and Innovation Projects of Jiangsu Province","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1966863755","https://openalex.org/W1984893151","https://openalex.org/W1992707230","https://openalex.org/W2052828853","https://openalex.org/W2072405524","https://openalex.org/W2080008918","https://openalex.org/W2081341054","https://openalex.org/W2127801773","https://openalex.org/W2201427885","https://openalex.org/W2293880708","https://openalex.org/W2341771485","https://openalex.org/W2494112937","https://openalex.org/W2568466811","https://openalex.org/W2593600534","https://openalex.org/W2599795618","https://openalex.org/W2734398964","https://openalex.org/W2739296899","https://openalex.org/W2757109865","https://openalex.org/W4236016061"],"related_works":["https://openalex.org/W1975632186","https://openalex.org/W3027745756","https://openalex.org/W3205213561","https://openalex.org/W2531880140","https://openalex.org/W2126145365","https://openalex.org/W2036609560","https://openalex.org/W346861917","https://openalex.org/W3024018414","https://openalex.org/W2474947501","https://openalex.org/W2086072340"],"abstract_inverted_index":{"By":[0],"dealing":[1],"with":[2,36,52,91],"the":[3,28,40,47,53,58,92,101,125],"crowding":[4],"problem":[5],"caused":[6],"by":[7,107],"incipient":[8,81],"faults,":[9],"this":[10,64],"brief":[11],"will":[12],"develop":[13],"a":[14,116,120,130],"new":[15,65],"fault":[16,96],"detection":[17],"and":[18,43,110,113,119],"diagnosis":[19],"(FDD)":[20],"scheme":[21,67],"called":[22],"probability-relevant":[23],"principal":[24],"component":[25],"analysis":[26,109],"from":[27,39,46],"probability":[29],"view":[30],"point.":[31],"The":[32,98],"proposed":[33,102],"methodology":[34],"cooperates":[35],"Kullback-Leibler":[37],"divergence":[38],"information":[41],"field":[42],"Bayesian":[44],"inference":[45],"machine":[48],"learning":[49],"domain.":[50],"Compared":[51],"standard":[54],"FDD":[55,66,103],"methods":[56],"under":[57,73],"framework":[59],"of":[60,94,100,129],"multivariate":[61],"statistical":[62],"analysis,":[63],"is":[68,85,105],"more":[69,86],"sensitive":[70],"to":[71,80],"faults":[72,90],"an":[74],"acceptable":[75],"false":[76],"alarm":[77],"ratio,":[78],"especially":[79],"faults;":[82],"moreover,":[83],"it":[84],"accurate":[87],"in":[88],"diagnosing":[89],"aid":[93],"improved":[95],"detectability.":[97],"effectiveness":[99],"method":[104],"illustrated":[106],"mathematical":[108],"geometric":[111],"descriptions,":[112],"validated":[114],"via":[115],"numerical":[117],"example":[118],"real":[121],"experimental":[122],"setup":[123],"on":[124],"electric":[126],"drive":[127],"system":[128],"high-speed":[131],"train.":[132]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":9},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":13},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":16},{"year":2020,"cited_by_count":25},{"year":2019,"cited_by_count":11}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}