{"id":"https://openalex.org/W2102541604","doi":"https://doi.org/10.1109/tcst.2009.2023913","title":"A New Diagnostic Model for Identifying Parametric Faults","display_name":"A New Diagnostic Model for Identifying Parametric Faults","publication_year":2009,"publication_date":"2009-08-21","ids":{"openalex":"https://openalex.org/W2102541604","doi":"https://doi.org/10.1109/tcst.2009.2023913","mag":"2102541604"},"language":"en","primary_location":{"id":"doi:10.1109/tcst.2009.2023913","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcst.2009.2023913","pdf_url":null,"source":{"id":"https://openalex.org/S133363738","display_name":"IEEE Transactions on Control Systems Technology","issn_l":"1063-6536","issn":["1063-6536","1558-0865","2374-0159"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Control Systems Technology","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5039994071","display_name":"R. Doraiswami","orcid":null},"institutions":[{"id":"https://openalex.org/I106938459","display_name":"University of New Brunswick","ror":"https://ror.org/05nkf0n29","country_code":"CA","type":"education","lineage":["https://openalex.org/I106938459"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Rajamani Doraiswami","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of New Brunswick, Fredericton, Canada","[Dept. of Electr. & Comput. Eng., Univ. of New Brunswick, Fredericton, NB, Canada]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of New Brunswick, Fredericton, Canada","institution_ids":["https://openalex.org/I106938459"]},{"raw_affiliation_string":"[Dept. of Electr. & Comput. Eng., Univ. of New Brunswick, Fredericton, NB, Canada]","institution_ids":["https://openalex.org/I106938459"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003982229","display_name":"Chris Diduch","orcid":"https://orcid.org/0000-0001-9816-4385"},"institutions":[{"id":"https://openalex.org/I106938459","display_name":"University of New Brunswick","ror":"https://ror.org/05nkf0n29","country_code":"CA","type":"education","lineage":["https://openalex.org/I106938459"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Chris P. Diduch","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of New Brunswick, Fredericton, Canada","[Dept. of Electr. & Comput. Eng., Univ. of New Brunswick, Fredericton, NB, Canada]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of New Brunswick, Fredericton, Canada","institution_ids":["https://openalex.org/I106938459"]},{"raw_affiliation_string":"[Dept. of Electr. & Comput. Eng., Univ. of New Brunswick, Fredericton, NB, Canada]","institution_ids":["https://openalex.org/I106938459"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5087819768","display_name":"Jiong Tang","orcid":"https://orcid.org/0000-0002-6825-9049"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jiong Tang","raw_affiliation_strings":["MDA Space Missions, Brampton, ON, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"MDA Space Missions, Brampton, ON, Canada","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":7.638,"has_fulltext":false,"cited_by_count":32,"citation_normalized_percentile":{"value":0.96898073,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"18","issue":"3","first_page":"533","last_page":"544"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14470","display_name":"Advanced Data Processing Techniques","score":0.9728000164031982,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9675999879837036,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/residual","display_name":"Residual","score":0.7904548645019531},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.7757700681686401},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.7202731370925903},{"id":"https://openalex.org/keywords/parametric-model","display_name":"Parametric model","score":0.5653889775276184},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5516876578330994},{"id":"https://openalex.org/keywords/identifier","display_name":"Identifier","score":0.5409385561943054},{"id":"https://openalex.org/keywords/isolation","display_name":"Isolation (microbiology)","score":0.45945531129837036},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.43594419956207275},{"id":"https://openalex.org/keywords/interconnection","display_name":"Interconnection","score":0.42125487327575684},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.41756555438041687},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.34545087814331055},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3266415596008301},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3169437646865845},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2173689901828766},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.14855358004570007}],"concepts":[{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.7904548645019531},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.7757700681686401},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.7202731370925903},{"id":"https://openalex.org/C24574437","wikidata":"https://www.wikidata.org/wiki/Q7135228","display_name":"Parametric model","level":3,"score":0.5653889775276184},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5516876578330994},{"id":"https://openalex.org/C154504017","wikidata":"https://www.wikidata.org/wiki/Q853614","display_name":"Identifier","level":2,"score":0.5409385561943054},{"id":"https://openalex.org/C2775941552","wikidata":"https://www.wikidata.org/wiki/Q25212305","display_name":"Isolation (microbiology)","level":2,"score":0.45945531129837036},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.43594419956207275},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.42125487327575684},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.41756555438041687},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.34545087814331055},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3266415596008301},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3169437646865845},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2173689901828766},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.14855358004570007},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C89423630","wikidata":"https://www.wikidata.org/wiki/Q7193","display_name":"Microbiology","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcst.2009.2023913","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcst.2009.2023913","pdf_url":null,"source":{"id":"https://openalex.org/S133363738","display_name":"IEEE Transactions on Control Systems Technology","issn_l":"1063-6536","issn":["1063-6536","1558-0865","2374-0159"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Control Systems Technology","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W110061065","https://openalex.org/W178056938","https://openalex.org/W259795459","https://openalex.org/W640385025","https://openalex.org/W1482540049","https://openalex.org/W1514337951","https://openalex.org/W1592847587","https://openalex.org/W1607002992","https://openalex.org/W1965324089","https://openalex.org/W1974401242","https://openalex.org/W1988527617","https://openalex.org/W1997969525","https://openalex.org/W2008325098","https://openalex.org/W2008476021","https://openalex.org/W2022530680","https://openalex.org/W2046939402","https://openalex.org/W2062047485","https://openalex.org/W2063559670","https://openalex.org/W2065062920","https://openalex.org/W2068485404","https://openalex.org/W2109402626","https://openalex.org/W2135325357","https://openalex.org/W2155726510","https://openalex.org/W2164558337","https://openalex.org/W2170602363","https://openalex.org/W2588215197","https://openalex.org/W6609855404"],"related_works":["https://openalex.org/W4378651134","https://openalex.org/W4252684102","https://openalex.org/W2352307597","https://openalex.org/W1979633005","https://openalex.org/W2163724607","https://openalex.org/W4385301753","https://openalex.org/W3186428265","https://openalex.org/W2171501125","https://openalex.org/W2617234683","https://openalex.org/W2375947351"],"abstract_inverted_index":{"This":[0,27],"paper":[1,28],"presents":[2],"a":[3,33,40,66,86,97],"new":[4],"approach":[5],"to":[6,24,46,56,68,84],"failure":[7],"detection":[8],"and":[9,36,48],"isolation":[10],"(FDI)":[11],"for":[12,99],"systems":[13],"modeled":[14],"as":[15,96,109],"an":[16,114],"interconnection":[17],"of":[18,32,39],"subsystems":[19],"that":[20],"are":[21,44,53,93],"each":[22],"subject":[23],"parametric":[25,101],"faults.":[26,51,102],"develops":[29],"the":[30,37,57,61,70,75,81,90],"concept":[31,38],"diagnostic":[34,71,76],"model":[35,47,77],"fault":[41],"emulator":[42],"which":[43],"used":[45,79,95],"parameterize":[49],"subsystem":[50],"There":[52],"two":[54],"stages":[55],"FDI":[58],"scheme.":[59],"In":[60],"first":[62],"stage":[63,83],"there":[64],"is":[65,78,105],"requirement":[67],"identify":[69],"model.":[72],"Once":[73],"identified,":[74],"in":[80],"second":[82],"generate":[85],"residual.":[87],"Artifacts":[88],"within":[89],"measured":[91],"residual":[92],"then":[94],"basis":[98],"identifying":[100],"The":[103],"scheme":[104],"distinct":[106],"from":[107],"others":[108],"it":[110],"does":[111],"not":[112],"require":[113],"online":[115],"recursive":[116],"least":[117],"squares":[118],"type":[119],"identifier.":[120]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":3},{"year":2017,"cited_by_count":2},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":6},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":5}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}