{"id":"https://openalex.org/W7131635234","doi":"https://doi.org/10.1109/tcsii.2026.3668178","title":"Hybrid Driving Strategy of SiC MOSFETs Buck Converter With Switching Losses Reduction and Safe Operation","display_name":"Hybrid Driving Strategy of SiC MOSFETs Buck Converter With Switching Losses Reduction and Safe Operation","publication_year":2026,"publication_date":"2026-02-26","ids":{"openalex":"https://openalex.org/W7131635234","doi":"https://doi.org/10.1109/tcsii.2026.3668178"},"language":null,"primary_location":{"id":"doi:10.1109/tcsii.2026.3668178","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2026.3668178","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Fan Feng","orcid":"https://orcid.org/0009-0004-0495-9718"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fan Feng","raw_affiliation_strings":["School of Automation Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu, China"],"raw_orcid":"https://orcid.org/0009-0004-0495-9718","affiliations":[{"raw_affiliation_string":"School of Automation Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102317505","display_name":"Zhangyong Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhangyong Chen","raw_affiliation_strings":["School of Automation Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-3268-4086","affiliations":[{"raw_affiliation_string":"School of Automation Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033006342","display_name":"Yuanxin Li","orcid":"https://orcid.org/0009-0003-2715-6339"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuanxin Li","raw_affiliation_strings":["Yuanxin Li with the School of Mechanical and Electrical Engineering, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":"https://orcid.org/0009-0003-2715-6339","affiliations":[{"raw_affiliation_string":"Yuanxin Li with the School of Mechanical and Electrical Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5126944531","display_name":"Yuliang Dong","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuliang Dong","raw_affiliation_strings":["School of Automation Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084982288","display_name":"X. W. Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiang Wang","raw_affiliation_strings":["School of Automation Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I150229711"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.17334753,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"73","issue":"4","first_page":"493","last_page":"497"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.8607000112533569,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.8607000112533569,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.011300000362098217,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.007300000172108412,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/overvoltage","display_name":"Overvoltage","score":0.6909000277519226},{"id":"https://openalex.org/keywords/buck-converter","display_name":"Buck converter","score":0.6349999904632568},{"id":"https://openalex.org/keywords/gate-driver","display_name":"Gate driver","score":0.5738000273704529},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.5490999817848206},{"id":"https://openalex.org/keywords/silicon-carbide","display_name":"Silicon carbide","score":0.5465999841690063},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4749999940395355},{"id":"https://openalex.org/keywords/power-semiconductor-device","display_name":"Power semiconductor device","score":0.4404999911785126},{"id":"https://openalex.org/keywords/switching-time","display_name":"Switching time","score":0.43070000410079956}],"concepts":[{"id":"https://openalex.org/C15703209","wikidata":"https://www.wikidata.org/wiki/Q333883","display_name":"Overvoltage","level":3,"score":0.6909000277519226},{"id":"https://openalex.org/C150818752","wikidata":"https://www.wikidata.org/wiki/Q83804","display_name":"Buck converter","level":3,"score":0.6349999904632568},{"id":"https://openalex.org/C179141203","wikidata":"https://www.wikidata.org/wiki/Q1495747","display_name":"Gate driver","level":3,"score":0.5738000273704529},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.5490999817848206},{"id":"https://openalex.org/C2780722187","wikidata":"https://www.wikidata.org/wiki/Q412356","display_name":"Silicon carbide","level":2,"score":0.5465999841690063},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4749999940395355},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4456999897956848},{"id":"https://openalex.org/C129014197","wikidata":"https://www.wikidata.org/wiki/Q906544","display_name":"Power semiconductor device","level":3,"score":0.4404999911785126},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.435699999332428},{"id":"https://openalex.org/C199310435","wikidata":"https://www.wikidata.org/wiki/Q7659121","display_name":"Switching time","level":2,"score":0.43070000410079956},{"id":"https://openalex.org/C48677424","wikidata":"https://www.wikidata.org/wiki/Q6888088","display_name":"Mode (computer interface)","level":2,"score":0.429500013589859},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4174000024795532},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.373199999332428},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.3691999912261963},{"id":"https://openalex.org/C88653102","wikidata":"https://www.wikidata.org/wiki/Q570553","display_name":"Power MOSFET","level":5,"score":0.367000013589859},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3605000078678131},{"id":"https://openalex.org/C2777151078","wikidata":"https://www.wikidata.org/wiki/Q30671714","display_name":"Switching frequency","level":3,"score":0.35510000586509705},{"id":"https://openalex.org/C3019721787","wikidata":"https://www.wikidata.org/wiki/Q180805","display_name":"Fast switching","level":3,"score":0.3465999960899353},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.32179999351501465},{"id":"https://openalex.org/C144534570","wikidata":"https://www.wikidata.org/wiki/Q5325","display_name":"Inductor","level":3,"score":0.31130000948905945},{"id":"https://openalex.org/C2985627981","wikidata":"https://www.wikidata.org/wiki/Q828827","display_name":"Power loss","level":3,"score":0.2736999988555908},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.272599995136261},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.26919999718666077}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsii.2026.3668178","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2026.3668178","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7585734128952026}],"awards":[{"id":"https://openalex.org/G5613328323","display_name":null,"funder_award_id":"2025ZDZX0078","funder_id":"https://openalex.org/F4320336756","funder_display_name":"Tianjin Science and Technology Program"},{"id":"https://openalex.org/G8888855890","display_name":null,"funder_award_id":"62271117","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320336756","display_name":"Tianjin Science and Technology Program","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,26,33,82,102],"hybrid":[4],"gate":[5,28,35],"drive":[6,29,36],"strategy":[7,80],"for":[8],"optimizing":[9],"the":[10,41,47,64,76,109,112],"performance":[11],"of":[12,111],"Silicon":[13],"Carbide":[14],"(SiC)":[15],"MOSFETs":[16],"in":[17,85,115],"power":[18],"converters.":[19],"The":[20,79],"proposed":[21,113],"method":[22],"dynamically":[23],"switches":[24],"between":[25],"current-source":[27],"(CSG)":[30],"mode":[31,38,49,66],"and":[32,56,119],"voltage-source":[34],"(VSG)":[37],"based":[39],"on":[40,101],"load":[42],"current.":[43],"Under":[44],"light-load":[45],"conditions,":[46,63],"CSG":[48],"is":[50,67],"utilized":[51],"to":[52,69],"maximize":[53],"switching":[54,58,86],"speed":[55],"minimize":[57],"losses,":[59,87],"while":[60,92],"under":[61],"heavy-load":[62,97],"VSG":[65],"activated":[68],"mitigate":[70],"overvoltage":[71,120],"stress":[72],"by":[73],"slowing":[74],"down":[75],"device":[77],"transitions.":[78],"provides":[81],"significant":[83],"reduction":[84],"especially":[88],"at":[89],"light":[90],"loads,":[91],"ensuring":[93],"safe":[94],"operation":[95],"during":[96],"conditions.":[98],"Experimental":[99],"results":[100],"1000":[103],"W":[104],"non-synchronous":[105],"buck":[106],"converter":[107],"demonstrate":[108],"effectiveness":[110],"approach":[114],"improving":[116],"both":[117],"efficiency":[118],"protection.":[121]},"counts_by_year":[],"updated_date":"2026-03-28T06:11:35.319607","created_date":"2026-02-27T00:00:00"}