{"id":"https://openalex.org/W4411551091","doi":"https://doi.org/10.1109/tcsii.2025.3582493","title":"Single-Event Upset Monitor-Based Radiation-Hardened Latch for Multi-node Upset","display_name":"Single-Event Upset Monitor-Based Radiation-Hardened Latch for Multi-node Upset","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4411551091","doi":"https://doi.org/10.1109/tcsii.2025.3582493"},"language":"en","primary_location":{"id":"doi:10.1109/tcsii.2025.3582493","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2025.3582493","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5118596074","display_name":"Zhan Zheyu","orcid":null},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhan Zheyu","raw_affiliation_strings":["Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101728485","display_name":"Hainan Liu","orcid":"https://orcid.org/0000-0003-2448-6052"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liu Hainan","raw_affiliation_strings":["Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057581270","display_name":"Duoli Li","orcid":null},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Li Duoli","raw_affiliation_strings":["Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5118596075","display_name":"Ma Quangang","orcid":null},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ma Quangang","raw_affiliation_strings":["Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5118596076","display_name":"Zhao Wenxin","orcid":null},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhao Wenxin","raw_affiliation_strings":["Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5118596077","display_name":"Yan Zhenzhen","orcid":null},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yan Zhenzhen","raw_affiliation_strings":["Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China"],"raw_orcid":"https://orcid.org/0009-0009-4167-5681","affiliations":[{"raw_affiliation_string":"Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023885825","display_name":"Bo Li","orcid":"https://orcid.org/0000-0003-4905-2744"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Li Bo","raw_affiliation_strings":["Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-4905-2744","affiliations":[{"raw_affiliation_string":"Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.10843615,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9894000291824341,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11216","display_name":"Radiation Detection and Scintillator Technologies","score":0.9889000058174133,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/upset","display_name":"Upset","score":0.9774295091629028},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.9042117595672607},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.5634185075759888},{"id":"https://openalex.org/keywords/event","display_name":"Event (particle physics)","score":0.440989226102829},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3811889886856079},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.35552793741226196},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2355446219444275},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2319650948047638},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.17862838506698608},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.07243868708610535},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.06745147705078125},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.06556111574172974}],"concepts":[{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.9774295091629028},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.9042117595672607},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.5634185075759888},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.440989226102829},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3811889886856079},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.35552793741226196},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2355446219444275},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2319650948047638},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.17862838506698608},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.07243868708610535},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.06745147705078125},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.06556111574172974},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsii.2025.3582493","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2025.3582493","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321133","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1659671481","https://openalex.org/W1899181454","https://openalex.org/W2050431855","https://openalex.org/W2056721615","https://openalex.org/W2060193918","https://openalex.org/W2118998611","https://openalex.org/W2122903059","https://openalex.org/W2153751624","https://openalex.org/W2550596389","https://openalex.org/W2587844224","https://openalex.org/W2954184824","https://openalex.org/W3008392074","https://openalex.org/W3046446688","https://openalex.org/W3149586126","https://openalex.org/W4200618691","https://openalex.org/W4365420287","https://openalex.org/W4377235607","https://openalex.org/W4391130225","https://openalex.org/W4400489002","https://openalex.org/W4406046981"],"related_works":["https://openalex.org/W2102538861","https://openalex.org/W2765704306","https://openalex.org/W2123934961","https://openalex.org/W4411551091","https://openalex.org/W1540420234","https://openalex.org/W2161646799","https://openalex.org/W2359969304","https://openalex.org/W764628369","https://openalex.org/W2155141467","https://openalex.org/W1502430142"],"abstract_inverted_index":{"This":[0],"brief":[1],"describes":[2],"a":[3,72],"novel":[4],"latch":[5,41],"design,":[6],"the":[7,34,40,50,61,65,88,99],"Single-Event":[8],"Upset":[9],"(SEU)":[10],"monitoring-based":[11],"Radiation":[12],"Hardened":[13],"Latch":[14],"(SMRHL),":[15],"which":[16],"is":[17,30],"robust":[18],"under":[19],"multi-node":[20],"upset":[21],"(MNU)":[22],"conditions.":[23],"The":[24,56],"SEU":[25,37,93],"monitoring":[26],"circuit":[27],"of":[28,36,67,75],"SMRHL":[29,51,63],"designed":[31],"to":[32,77,82,91],"detect":[33],"presence":[35],"events":[38],"inside":[39],"and":[42,70],"trigger":[43],"alarm":[44,94],"signals":[45,95],"accordingly,":[46],"thus":[47],"ensuring":[48],"that":[49,60],"can":[52],"output":[53],"correct":[54],"data.":[55],"simulation":[57],"results":[58],"demonstrate":[59],"proposed":[62],"minimizes":[64],"number":[66],"SEU-sensitive":[68],"nodes":[69],"achieves":[71],"significant":[73],"improvement":[74],"up":[76],"57.9X":[78],"in":[79],"power-delay-area-product":[80],"compared":[81],"other":[83],"state-of-the-art":[84],"MNU":[85],"latches.":[86],"Additionally,":[87],"SMRHLs":[89],"capability":[90],"generate":[92],"enhances":[96],"reliability":[97],"at":[98],"system":[100],"architecture":[101],"level.":[102]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}