{"id":"https://openalex.org/W4411484124","doi":"https://doi.org/10.1109/tcsii.2025.3581545","title":"Digitally Calibrated Redundancy-Based String DAC: A Novel Architecture for Enhanced Static Linearity","display_name":"Digitally Calibrated Redundancy-Based String DAC: A Novel Architecture for Enhanced Static Linearity","publication_year":2025,"publication_date":"2025-06-20","ids":{"openalex":"https://openalex.org/W4411484124","doi":"https://doi.org/10.1109/tcsii.2025.3581545"},"language":"en","primary_location":{"id":"doi:10.1109/tcsii.2025.3581545","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2025.3581545","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5017653134","display_name":"Isaac Bruce","orcid":"https://orcid.org/0000-0003-3959-1293"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Isaac Bruce","raw_affiliation_strings":["Electrical Engineering Department, Iowa State University, Ames, IA, USA"],"raw_orcid":"https://orcid.org/0000-0003-3959-1293","affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5093828063","display_name":"Emmanuel Nti Darko","orcid":"https://orcid.org/0009-0003-8237-2384"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Emmanuel Nti Darko","raw_affiliation_strings":["Electrical Engineering Department, Iowa State University, Ames, IA, USA"],"raw_orcid":"https://orcid.org/0009-0003-8237-2384","affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5093828064","display_name":"Ekaniyere Oko Odion","orcid":null},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ekaniyere Oko Odion","raw_affiliation_strings":["Electrical Engineering Department, Iowa State University, Ames, IA, USA"],"raw_orcid":"https://orcid.org/0009-0000-5302-3749","affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108991016","display_name":"Matthew Crabb","orcid":null},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Matthew Crabb","raw_affiliation_strings":["Electrical Engineering Department, Iowa State University, Ames, IA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101873076","display_name":"Degang Chen","orcid":"https://orcid.org/0000-0002-5938-6329"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Degang Chen","raw_affiliation_strings":["Electrical Engineering Department, Iowa State University, Ames, IA, USA"],"raw_orcid":"https://orcid.org/0000-0002-5938-6329","affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I173911158"],"apc_list":null,"apc_paid":null,"fwci":0.4223,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.59565761,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"72","issue":"10","first_page":"1343","last_page":"1347"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10320","display_name":"Neural Networks and Applications","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11697","display_name":"Numerical Methods and Algorithms","score":0.9779000282287598,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.7295088171958923},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.6223674416542053},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.565552294254303},{"id":"https://openalex.org/keywords/architecture","display_name":"Architecture","score":0.4737356901168823},{"id":"https://openalex.org/keywords/string","display_name":"String (physics)","score":0.4471559226512909},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3515141010284424},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23566779494285583},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.22239950299263},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.21675005555152893},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.14831045269966125},{"id":"https://openalex.org/keywords/art","display_name":"Art","score":0.07204613089561462},{"id":"https://openalex.org/keywords/theoretical-physics","display_name":"Theoretical physics","score":0.05685719847679138}],"concepts":[{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.7295088171958923},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.6223674416542053},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.565552294254303},{"id":"https://openalex.org/C123657996","wikidata":"https://www.wikidata.org/wiki/Q12271","display_name":"Architecture","level":2,"score":0.4737356901168823},{"id":"https://openalex.org/C157486923","wikidata":"https://www.wikidata.org/wiki/Q1376436","display_name":"String (physics)","level":2,"score":0.4471559226512909},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3515141010284424},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23566779494285583},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.22239950299263},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.21675005555152893},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.14831045269966125},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.07204613089561462},{"id":"https://openalex.org/C33332235","wikidata":"https://www.wikidata.org/wiki/Q18362","display_name":"Theoretical physics","level":1,"score":0.05685719847679138},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsii.2025.3581545","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2025.3581545","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G7049714409","display_name":null,"funder_award_id":"AMS-CSD 3160.012","funder_id":"https://openalex.org/F4320306087","funder_display_name":"Semiconductor Research Corporation"}],"funders":[{"id":"https://openalex.org/F4320306087","display_name":"Semiconductor Research Corporation","ror":"https://ror.org/047z4n946"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1570714606","https://openalex.org/W1599899898","https://openalex.org/W2165922306","https://openalex.org/W2794427711","https://openalex.org/W3007406817","https://openalex.org/W4402716141"],"related_works":["https://openalex.org/W2023858428","https://openalex.org/W4247324130","https://openalex.org/W2538259895","https://openalex.org/W2126963364","https://openalex.org/W2051287254","https://openalex.org/W2370937376","https://openalex.org/W2218509615","https://openalex.org/W1489573155","https://openalex.org/W2348662850","https://openalex.org/W4293868490"],"abstract_inverted_index":{"This":[0],"brief":[1],"introduces":[2],"a":[3,51],"three-segment":[4],"resistor":[5],"string":[6,33],"ladder":[7],"DAC":[8,34],"featuring":[9],"built-in":[10],"redundancy":[11,67],"and":[12,37],"sub-radix":[13],"transfer":[14],"characteristics.":[15],"The":[16],"architecture":[17],"implements":[18],"digital":[19],"calibration":[20],"to":[21,31],"optimize":[22],"the":[23,43,58],"linearity-resolution":[24],"tradeoff,":[25],"achieving":[26],"substantial":[27],"area":[28],"reduction":[29],"compared":[30],"conventional":[32],"designs.":[35],"Measurement":[36],"simulation":[38],"results":[39],"are":[40],"presented":[41,49],"validating":[42],"architecture\u2019s":[44],"performance.":[45,83],"Mathematical":[46],"analysis":[47],"is":[48],"revealing":[50],"fundamental":[52],"1":[53],"LSB":[54],"lower":[55],"bound":[56],"on":[57],"best":[59],"achievable":[60],"post-calibration":[61,81],"differential":[62],"nonlinearity":[63],"(DNL)":[64],"for":[65],"1-bit":[66],"cases.":[68],"To":[69],"address":[70],"this":[71],"limitation,":[72],"we":[73],"present":[74],"two":[75],"alternative":[76],"architectures":[77],"that":[78],"demonstrate":[79],"improved":[80],"DNL":[82]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}