{"id":"https://openalex.org/W4408017048","doi":"https://doi.org/10.1109/tcsii.2025.3546292","title":"A 10 to 15 GHz Digital Step Attenuator With Robust Temperature Tolerance Across -55 \u2218C to 125 \u2218C","display_name":"A 10 to 15 GHz Digital Step Attenuator With Robust Temperature Tolerance Across -55 \u2218C to 125 \u2218C","publication_year":2025,"publication_date":"2025-02-27","ids":{"openalex":"https://openalex.org/W4408017048","doi":"https://doi.org/10.1109/tcsii.2025.3546292"},"language":"en","primary_location":{"id":"doi:10.1109/tcsii.2025.3546292","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2025.3546292","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101849813","display_name":"Jiang Luo","orcid":"https://orcid.org/0000-0003-4519-792X"},"institutions":[{"id":"https://openalex.org/I50760025","display_name":"Hangzhou Dianzi University","ror":"https://ror.org/0576gt767","country_code":"CN","type":"education","lineage":["https://openalex.org/I50760025"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiang Luo","raw_affiliation_strings":["Innovation Center for Electronic Design Automation Technology, Hangzhou Dianzi University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0003-4519-792X","affiliations":[{"raw_affiliation_string":"Innovation Center for Electronic Design Automation Technology, Hangzhou Dianzi University, Hangzhou, China","institution_ids":["https://openalex.org/I50760025"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101597263","display_name":"Yao Peng","orcid":"https://orcid.org/0000-0003-2975-6234"},"institutions":[{"id":"https://openalex.org/I4387153688","display_name":"Beijing Institute of Radio Metrology and Measurement","ror":"https://ror.org/02c8ctc21","country_code":null,"type":"company","lineage":["https://openalex.org/I15089104","https://openalex.org/I4387153688"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yao Peng","raw_affiliation_strings":["Beijing Institute of Radio Measurement, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing Institute of Radio Measurement, Beijing, China","institution_ids":["https://openalex.org/I4387153688"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5083141785","display_name":"Qiang Cheng","orcid":"https://orcid.org/0000-0002-2442-8357"},"institutions":[{"id":"https://openalex.org/I4210090971","display_name":"Southeast University","ror":"https://ror.org/00cf0ab87","country_code":"BD","type":"education","lineage":["https://openalex.org/I4210090971"]},{"id":"https://openalex.org/I4391768253","display_name":"State Key Laboratory of Millimeter Waves","ror":"https://ror.org/02q1v5910","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391768253","https://openalex.org/I76569877"]},{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["BD","CN"],"is_corresponding":false,"raw_author_name":"Qiang Cheng","raw_affiliation_strings":["State Key Laboratory of Millimeter Waves, Institute of Electromagnetic Space, Southeast University, Nanjing, China","State Key Laboratory of Millimeter Waves, Southeast University, Nanjing"],"raw_orcid":"https://orcid.org/0000-0002-2442-8357","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Millimeter Waves, Institute of Electromagnetic Space, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I4391768253","https://openalex.org/I76569877"]},{"raw_affiliation_string":"State Key Laboratory of Millimeter Waves, Southeast University, Nanjing","institution_ids":["https://openalex.org/I4210090971"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.6386,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.61887834,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":97},"biblio":{"volume":"72","issue":"5","first_page":"653","last_page":"657"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.991599977016449,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.991599977016449,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13965","display_name":"Laser and Thermal Forming Techniques","score":0.9697999954223633,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10998","display_name":"Heat Transfer and Optimization","score":0.96670001745224,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/attenuator","display_name":"Attenuator (electronics)","score":0.7958922982215881},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.43611961603164673},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.36399102210998535},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.33661189675331116},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2856523096561432},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21585038304328918},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.15845811367034912},{"id":"https://openalex.org/keywords/attenuation","display_name":"Attenuation","score":0.10659414529800415}],"concepts":[{"id":"https://openalex.org/C174847166","wikidata":"https://www.wikidata.org/wiki/Q1269728","display_name":"Attenuator (electronics)","level":3,"score":0.7958922982215881},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.43611961603164673},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.36399102210998535},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.33661189675331116},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2856523096561432},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21585038304328918},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.15845811367034912},{"id":"https://openalex.org/C184652730","wikidata":"https://www.wikidata.org/wiki/Q2357982","display_name":"Attenuation","level":2,"score":0.10659414529800415}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsii.2025.3546292","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2025.3546292","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.7599999904632568,"id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G2430043739","display_name":null,"funder_award_id":"2023YFB3811503","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"},{"id":"https://openalex.org/G668132764","display_name":null,"funder_award_id":"LQ23F040009","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W2135888962","https://openalex.org/W2498061868","https://openalex.org/W2799908907","https://openalex.org/W2869254420","https://openalex.org/W2949899059","https://openalex.org/W3012144340","https://openalex.org/W3035275655","https://openalex.org/W3113348610","https://openalex.org/W3125066956","https://openalex.org/W3137406201","https://openalex.org/W3162619471","https://openalex.org/W3167147598","https://openalex.org/W3199278212","https://openalex.org/W3208041214","https://openalex.org/W4312556958","https://openalex.org/W4361980931","https://openalex.org/W4386266043","https://openalex.org/W4387010009"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2389772695","https://openalex.org/W2356507289","https://openalex.org/W2514464399","https://openalex.org/W2373477153","https://openalex.org/W4367147853","https://openalex.org/W2560907006","https://openalex.org/W3217517359"],"abstract_inverted_index":{"This":[0,61],"brief":[1],"presents":[2],"an":[3,18,22,34,128,135,142,167],"efficient":[4],"adaptive":[5,35],"analog":[6,36],"temperature":[7,24],"compensation":[8,169],"technique":[9],"that":[10],"stabilizes":[11],"the":[12,43,51,58,74,154,157,163],"amplitude":[13,106,177],"and":[14,69,84,107,141,178],"phase":[15,108,137,179],"performance":[16],"of":[17,54,156],"RF":[19],"attenuator":[20,80],"over":[21,150],"ultra-wide":[23],"range":[25],"without":[26],"compromising":[27],"its":[28],"other":[29],"metrics.":[30],"The":[31,98],"approach":[32],"utilizes":[33],"temperature-dependent":[37],"voltage":[38],"source":[39],"(AATVS)":[40],"to":[41,119,165],"supply":[42],"binary":[44],"digital":[45,78],"control":[46],"array,":[47],"which":[48],"indirectly":[49],"biases":[50],"gate":[52],"terminals":[53],"MOSFET":[55],"switches":[56],"in":[57,67,103,171],"attenuation":[59,130],"unit.":[60],"method":[62],"effectively":[63],"mitigates":[64],"thermal":[65,183],"variations":[66],"on-resistance":[68],"intrinsic":[70],"capacitance.":[71],"To":[72,153],"validate":[73],"technique,":[75],"a":[76,87,172],"5-bit":[77,173],"step":[79],"(DSA)":[81],"was":[82],"designed":[83],"fabricated":[85],"using":[86],"<inline-formula":[88,111,120],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[89,112,121],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[90,113,122],"<tex-math":[91,114,123],"notation=\"LaTeX\">$0.13~\\mu":[92],"$":[93],"</tex-math></inline-formula>m":[94],"SiGe":[95],"BiCMOS":[96],"process.":[97],"DSA":[99],"exhibited":[100],"excellent":[101],"consistency":[102],"root-mean-square":[104],"(RMS)":[105],"errors":[109],"across":[110],"notation=\"LaTeX\">$-":[115],"55~^{\\circ":[116],"}$":[117,125],"</tex-math></inline-formula>C":[118],"notation=\"LaTeX\">$125~^{\\circ":[124],"</tex-math></inline-formula>C,":[126],"achieving":[127],"RMS":[129,136],"error":[131,138],"below":[132],"0.24":[133],"dB,":[134],"under":[139,181],"2.3\u00b0,":[140],"insertion":[143],"loss":[144],"(IL)":[145],"better":[146],"than":[147],"4.9":[148],"dB":[149],"10\u201315":[151],"GHz.":[152],"best":[155],"authors\u2019":[158],"knowledge,":[159],"this":[160],"letter":[161],"is":[162],"first":[164],"implement":[166],"AATVS-based":[168],"mechanism":[170],"DSA,":[174],"ensuring":[175],"stable":[176],"accuracy":[180],"extreme":[182],"variations.":[184]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-02-28T00:00:00"}