{"id":"https://openalex.org/W4401506965","doi":"https://doi.org/10.1109/tcsii.2024.3442215","title":"An N/PBTI-Isolated BTI Monitor With a Configurable Switching Network and Calibration for Process Variation in Memory Periphery","display_name":"An N/PBTI-Isolated BTI Monitor With a Configurable Switching Network and Calibration for Process Variation in Memory Periphery","publication_year":2024,"publication_date":"2024-08-12","ids":{"openalex":"https://openalex.org/W4401506965","doi":"https://doi.org/10.1109/tcsii.2024.3442215"},"language":"en","primary_location":{"id":"doi:10.1109/tcsii.2024.3442215","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/tcsii.2024.3442215","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046966173","display_name":"Shin-Hyun Jeong","orcid":"https://orcid.org/0000-0003-2998-8342"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Shin-Hyun Jeong","raw_affiliation_strings":["Department of Electrical and Computer Engineering, and the Inter-University Semiconductor Research Center, Seoul National University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, and the Inter-University Semiconductor Research Center, Seoul National University, Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023903086","display_name":"Yong-Un Jeong","orcid":"https://orcid.org/0000-0003-0472-0542"},"institutions":[{"id":"https://openalex.org/I28777354","display_name":"Sejong University","ror":"https://ror.org/00aft1q37","country_code":"KR","type":"education","lineage":["https://openalex.org/I28777354"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yong-Un Jeong","raw_affiliation_strings":["Department of Semiconductor Systems Engineering, and the Institute of Semiconductor and System IC, Sejong University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Semiconductor Systems Engineering, and the Institute of Semiconductor and System IC, Sejong University, Seoul, South Korea","institution_ids":["https://openalex.org/I28777354"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5080332152","display_name":"Suhwan Kim","orcid":"https://orcid.org/0000-0001-9107-2963"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Suhwan Kim","raw_affiliation_strings":["Department of Electrical and Computer Engineering, and the Inter-University Semiconductor Research Center, Seoul National University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, and the Inter-University Semiconductor Research Center, Seoul National University, Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5046966173"],"corresponding_institution_ids":["https://openalex.org/I139264467"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.138778,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"71","issue":"11","first_page":"4628","last_page":"4632"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9085999727249146,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9085999727249146,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9002000093460083,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.7588182687759399},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6537022590637207},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5777652263641357},{"id":"https://openalex.org/keywords/variation","display_name":"Variation (astronomy)","score":0.5249766707420349},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.41706186532974243},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3644925653934479},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.363962322473526},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.363760769367218},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17206788063049316},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1666213572025299},{"id":"https://openalex.org/keywords/astrophysics","display_name":"Astrophysics","score":0.1065240204334259},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.06877133250236511}],"concepts":[{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.7588182687759399},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6537022590637207},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5777652263641357},{"id":"https://openalex.org/C2778334786","wikidata":"https://www.wikidata.org/wiki/Q1586270","display_name":"Variation (astronomy)","level":2,"score":0.5249766707420349},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.41706186532974243},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3644925653934479},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.363962322473526},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.363760769367218},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17206788063049316},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1666213572025299},{"id":"https://openalex.org/C44870925","wikidata":"https://www.wikidata.org/wiki/Q37547","display_name":"Astrophysics","level":1,"score":0.1065240204334259},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.06877133250236511},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsii.2024.3442215","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/tcsii.2024.3442215","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G4616405269","display_name":null,"funder_award_id":"2022-0-01013","funder_id":"https://openalex.org/F4320328359","funder_display_name":"Ministry of Science and ICT, South Korea"}],"funders":[{"id":"https://openalex.org/F4320328359","display_name":"Ministry of Science and ICT, South Korea","ror":"https://ror.org/01wpjm123"},{"id":"https://openalex.org/F4320335489","display_name":"Institute for Information and Communications Technology Promotion","ror":"https://ror.org/01g0hqq23"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1600691640","https://openalex.org/W2016958650","https://openalex.org/W2038126736","https://openalex.org/W2051747677","https://openalex.org/W2059193309","https://openalex.org/W2066698193","https://openalex.org/W2076406548","https://openalex.org/W2096035326","https://openalex.org/W2098188762","https://openalex.org/W2114725738","https://openalex.org/W2134067926","https://openalex.org/W2148843623","https://openalex.org/W2159931326","https://openalex.org/W2165206834","https://openalex.org/W2179420095","https://openalex.org/W2291303685","https://openalex.org/W2542616127","https://openalex.org/W2779878421","https://openalex.org/W3005765195","https://openalex.org/W3006144294","https://openalex.org/W3013320480","https://openalex.org/W4226094037"],"related_works":["https://openalex.org/W2386430105","https://openalex.org/W2356521405","https://openalex.org/W2038534795","https://openalex.org/W2384358604","https://openalex.org/W1567829292","https://openalex.org/W3001063351","https://openalex.org/W3196905815","https://openalex.org/W2137012493","https://openalex.org/W2959030164","https://openalex.org/W1564147575"],"abstract_inverted_index":{"This":[0],"brief":[1],"presents":[2],"an":[3],"on-chip":[4],"bias":[5],"temperature":[6],"instability":[7],"(BTI)":[8],"monitor":[9,30],"to":[10,57,85],"accurately":[11],"detect":[12],"performance":[13],"degradation":[14],"caused":[15],"by":[16],"negative":[17],"BTI":[18,22,29,60],"(NBTI)":[19],"and":[20,39,45],"positive":[21],"(PBTI)":[23],"in":[24],"DRAM":[25],"periphery.":[26],"The":[27,49],"proposed":[28,75],"is":[31,74],"capable":[32],"of":[33,36,79],"isolated":[34],"measurement":[35,56,64,88],"both":[37],"NBTI":[38],"PBTI":[40],"using":[41,76],"a":[42,68],"configurable":[43],"pull-up":[44],"pull-down":[46],"switching":[47],"network.":[48],"dual-delay":[50],"line":[51],"topology":[52],"also":[53],"ensures":[54],"fast":[55],"minimize":[58],"unwanted":[59],"recovery,":[61],"which":[62],"reduces":[63],"accuracy.":[65,89],"In":[66],"addition,":[67],"calibration":[69],"scheme":[70],"for":[71],"process":[72],"variation":[73],"body":[77],"biasing":[78],"devices":[80],"that":[81],"mimics":[82],"BTI-induced":[83],"stress":[84],"further":[86],"enhance":[87]},"counts_by_year":[],"updated_date":"2025-12-23T23:11:35.936235","created_date":"2025-10-10T00:00:00"}