{"id":"https://openalex.org/W4388622855","doi":"https://doi.org/10.1109/tcsii.2023.3332177","title":"Asymmetric SOI CMOS Switch With Series and Parallel Resonators to Enhance Isolation","display_name":"Asymmetric SOI CMOS Switch With Series and Parallel Resonators to Enhance Isolation","publication_year":2023,"publication_date":"2023-11-13","ids":{"openalex":"https://openalex.org/W4388622855","doi":"https://doi.org/10.1109/tcsii.2023.3332177"},"language":"en","primary_location":{"id":"doi:10.1109/tcsii.2023.3332177","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2023.3332177","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101781446","display_name":"Jaehyun Kwon","orcid":"https://orcid.org/0009-0001-5335-1600"},"institutions":[{"id":"https://openalex.org/I141371507","display_name":"Soongsil University","ror":"https://ror.org/017xnm587","country_code":"KR","type":"education","lineage":["https://openalex.org/I141371507"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Jaehyun Kwon","raw_affiliation_strings":["Department of Intelligent Semiconductors, Soongsil University, Seoul, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Department of Intelligent Semiconductors, Soongsil University, Seoul, Republic of Korea","institution_ids":["https://openalex.org/I141371507"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035397090","display_name":"Jaeyong Lee","orcid":"https://orcid.org/0000-0002-0073-2733"},"institutions":[{"id":"https://openalex.org/I141371507","display_name":"Soongsil University","ror":"https://ror.org/017xnm587","country_code":"KR","type":"education","lineage":["https://openalex.org/I141371507"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaeyong Lee","raw_affiliation_strings":["Department of Electronic Engineering, Soongsil University, Seoul, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Soongsil University, Seoul, Republic of Korea","institution_ids":["https://openalex.org/I141371507"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005961971","display_name":"Taehun Kim","orcid":"https://orcid.org/0000-0001-6260-0640"},"institutions":[{"id":"https://openalex.org/I141371507","display_name":"Soongsil University","ror":"https://ror.org/017xnm587","country_code":"KR","type":"education","lineage":["https://openalex.org/I141371507"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Taehun Kim","raw_affiliation_strings":["Department of Electronic Engineering, Soongsil University, Seoul, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Soongsil University, Seoul, Republic of Korea","institution_ids":["https://openalex.org/I141371507"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103233685","display_name":"Donghwan Seo","orcid":"https://orcid.org/0000-0002-4049-5509"},"institutions":[{"id":"https://openalex.org/I141371507","display_name":"Soongsil University","ror":"https://ror.org/017xnm587","country_code":"KR","type":"education","lineage":["https://openalex.org/I141371507"]},{"id":"https://openalex.org/I2801036362","display_name":"Agency for Defense Development","ror":"https://ror.org/05fhe0r85","country_code":"KR","type":"government","lineage":["https://openalex.org/I1327899338","https://openalex.org/I1344042128","https://openalex.org/I2801036362","https://openalex.org/I2801339556"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Donghwan Seo","raw_affiliation_strings":["Department of Electronic Engineering, Soongsil University, Seoul, Republic of Korea","Test & Evaluation Research Institute, Agency for Defense Development, Taean, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Soongsil University, Seoul, Republic of Korea","institution_ids":["https://openalex.org/I141371507"]},{"raw_affiliation_string":"Test & Evaluation Research Institute, Agency for Defense Development, Taean, Republic of Korea","institution_ids":["https://openalex.org/I2801036362"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113875616","display_name":"Jinho Yoo","orcid":"https://orcid.org/0009-0002-3620-5123"},"institutions":[{"id":"https://openalex.org/I141371507","display_name":"Soongsil University","ror":"https://ror.org/017xnm587","country_code":"KR","type":"education","lineage":["https://openalex.org/I141371507"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jinho Yoo","raw_affiliation_strings":["Department of Electronic Engineering, Soongsil University, Seoul, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Soongsil University, Seoul, Republic of Korea","institution_ids":["https://openalex.org/I141371507"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010873873","display_name":"Jaeheon Cho","orcid":null},"institutions":[{"id":"https://openalex.org/I141371507","display_name":"Soongsil University","ror":"https://ror.org/017xnm587","country_code":"KR","type":"education","lineage":["https://openalex.org/I141371507"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaeheon Cho","raw_affiliation_strings":["Department of Electronic Engineering, Soongsil University, Seoul, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Soongsil University, Seoul, Republic of Korea","institution_ids":["https://openalex.org/I141371507"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103037998","display_name":"Changkun Park","orcid":"https://orcid.org/0000-0002-4699-9935"},"institutions":[{"id":"https://openalex.org/I141371507","display_name":"Soongsil University","ror":"https://ror.org/017xnm587","country_code":"KR","type":"education","lineage":["https://openalex.org/I141371507"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Changkun Park","raw_affiliation_strings":["Department of Electronic Engineering and the Department of Intelligent Semiconductors, Soongsil University, Seoul, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering and the Department of Intelligent Semiconductors, Soongsil University, Seoul, Republic of Korea","institution_ids":["https://openalex.org/I141371507"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5101781446"],"corresponding_institution_ids":["https://openalex.org/I141371507"],"apc_list":null,"apc_paid":null,"fwci":1.8743,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.86091629,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"71","issue":"4","first_page":"1964","last_page":"1968"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/silicon-on-insulator","display_name":"Silicon on insulator","score":0.8040392398834229},{"id":"https://openalex.org/keywords/resonator","display_name":"Resonator","score":0.6906829476356506},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6193469166755676},{"id":"https://openalex.org/keywords/isolation","display_name":"Isolation (microbiology)","score":0.602664589881897},{"id":"https://openalex.org/keywords/series","display_name":"Series (stratigraphy)","score":0.5763649940490723},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5147200226783752},{"id":"https://openalex.org/keywords/series-and-parallel-circuits","display_name":"Series and parallel circuits","score":0.4311932921409607},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.42864280939102173},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.41161707043647766},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.40873971581459045},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3932803273200989},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2855505347251892},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.13290616869926453},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.05322936177253723}],"concepts":[{"id":"https://openalex.org/C53143962","wikidata":"https://www.wikidata.org/wiki/Q1478788","display_name":"Silicon on insulator","level":3,"score":0.8040392398834229},{"id":"https://openalex.org/C97126364","wikidata":"https://www.wikidata.org/wiki/Q349669","display_name":"Resonator","level":2,"score":0.6906829476356506},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6193469166755676},{"id":"https://openalex.org/C2775941552","wikidata":"https://www.wikidata.org/wiki/Q25212305","display_name":"Isolation (microbiology)","level":2,"score":0.602664589881897},{"id":"https://openalex.org/C143724316","wikidata":"https://www.wikidata.org/wiki/Q312468","display_name":"Series (stratigraphy)","level":2,"score":0.5763649940490723},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5147200226783752},{"id":"https://openalex.org/C95023266","wikidata":"https://www.wikidata.org/wiki/Q55738334","display_name":"Series and parallel circuits","level":3,"score":0.4311932921409607},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.42864280939102173},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.41161707043647766},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.40873971581459045},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3932803273200989},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2855505347251892},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.13290616869926453},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.05322936177253723},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C89423630","wikidata":"https://www.wikidata.org/wiki/Q7193","display_name":"Microbiology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsii.2023.3332177","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2023.3332177","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8600000143051147}],"awards":[{"id":"https://openalex.org/G4069368776","display_name":null,"funder_award_id":"NRF-2021R1A2C1013666","funder_id":"https://openalex.org/F4320322030","funder_display_name":"Ministry of Science, ICT and Future Planning"}],"funders":[{"id":"https://openalex.org/F4320322030","display_name":"Ministry of Science, ICT and Future Planning","ror":"https://ror.org/032e49973"},{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1968018528","https://openalex.org/W2017461892","https://openalex.org/W2070863845","https://openalex.org/W2112665670","https://openalex.org/W2116773862","https://openalex.org/W2137795881","https://openalex.org/W2147158184","https://openalex.org/W2793167437","https://openalex.org/W2897419180","https://openalex.org/W2949039276","https://openalex.org/W3126801148","https://openalex.org/W3136776287","https://openalex.org/W3197192019","https://openalex.org/W4288391361","https://openalex.org/W4295832139","https://openalex.org/W4317384998","https://openalex.org/W4321384913"],"related_works":["https://openalex.org/W2104300577","https://openalex.org/W4206445530","https://openalex.org/W2771786520","https://openalex.org/W2174354966","https://openalex.org/W2810180604","https://openalex.org/W2325281603","https://openalex.org/W2944964251","https://openalex.org/W2012754971","https://openalex.org/W2034653092","https://openalex.org/W2101030291"],"abstract_inverted_index":{"In":[0,59],"this":[1],"brief,":[2],"we":[3],"designed":[4,78,100,170],"an":[5,96],"asymmetric":[6,31,56,97],"single-pole":[7],"double-throw":[8],"(SPDT)":[9],"switch":[10,76,98,172],"that":[11],"operates":[12],"at":[13,150],"1.9":[14],"\u2013":[15],"2.4":[16],"GHz.":[17],"To":[18,88],"improve":[19],"the":[20,23,55,65,70,75,82,85,90,93,139,169],"isolation":[21],"in":[22,61,81,84,110,138,159],"Rx":[24,111,160],"mode,":[25],"which":[26],"is":[27,173],"a":[28,34],"disadvantage":[29],"of":[30,69,92,168],"SPDT":[32,57,171],"switches,":[33],"series":[35,46],"and":[36,42,47,112,123,156,161],"parallel":[37,48],"resonance":[38,49],"structure":[39,50],"was":[40,99,130],"proposed":[41,45,94],"analyzed.":[43],"The":[44,108,127,143,165],"has":[51],"been":[52],"applied":[53],"to":[54,63,79,117,132],"switch.":[58],"addition,":[60],"order":[62],"secure":[64],"power":[66],"handling":[67],"capability":[68],"switch,":[71],"all":[72],"transistors":[73],"constituting":[74],"were":[77,115,153],"be":[80,118,133],"on-state":[83],"Tx":[86,113,162],"mode.":[87],"verify":[89],"feasibility":[91],"structure,":[95],"using":[101],"130-nm":[102],"partially":[103],"depleted":[104],"SOI":[105],"CMOS":[106],"process.":[107],"isolations":[109],"modes":[114],"measured":[116,131,149],"higher":[119],"than":[120,135],"28.6":[121],"dB":[122,137],"41.3":[124],"dB,":[125],"respectively.":[126,164],"insertion":[128],"loss":[129],"less":[134],"1.79":[136],"same":[140],"frequency":[141],"range.":[142],"input":[144],"1-dB":[145],"compression":[146],"points":[147],"(IP1dBs)":[148],"2.2":[151],"GHz":[152],"6.7":[154],"dBm":[155,158],"38.8":[157],"modes,":[163],"core":[166],"size":[167],"0.27":[174],"mm2.":[175]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":10},{"year":2024,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}