{"id":"https://openalex.org/W4312285453","doi":"https://doi.org/10.1109/tcsii.2022.3217756","title":"A 208-MHz, 0.75-mW Self-Calibrated Reference Frequency Quadrupler for a 2-GHz Fractional-N Ring-PLL in 4-nm FinFET CMOS","display_name":"A 208-MHz, 0.75-mW Self-Calibrated Reference Frequency Quadrupler for a 2-GHz Fractional-N Ring-PLL in 4-nm FinFET CMOS","publication_year":2022,"publication_date":"2022-11-04","ids":{"openalex":"https://openalex.org/W4312285453","doi":"https://doi.org/10.1109/tcsii.2022.3217756"},"language":"en","primary_location":{"id":"doi:10.1109/tcsii.2022.3217756","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2022.3217756","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036345925","display_name":"Kyungmin Lee","orcid":"https://orcid.org/0000-0001-6765-0233"},"institutions":[{"id":"https://openalex.org/I138925566","display_name":"Ewha Womans University","ror":"https://ror.org/053fp5c05","country_code":"KR","type":"education","lineage":["https://openalex.org/I138925566"]},{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyungmin Lee","raw_affiliation_strings":["System LSI Business, Samsung Electronics, Hwaseong, South Korea","Department of Electronic and Electrical Engineering, Ewha Womans University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0001-6765-0233","affiliations":[{"raw_affiliation_string":"System LSI Business, Samsung Electronics, Hwaseong, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Department of Electronic and Electrical Engineering, Ewha Womans University, Seoul, South Korea","institution_ids":["https://openalex.org/I138925566"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059645690","display_name":"Jaehong Jung","orcid":"https://orcid.org/0000-0003-3690-4901"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaehong Jung","raw_affiliation_strings":["System LSI Business, Samsung Electronics, Hwaseong, South Korea"],"raw_orcid":"https://orcid.org/0000-0003-3690-4901","affiliations":[{"raw_affiliation_string":"System LSI Business, Samsung Electronics, Hwaseong, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114949069","display_name":"Seungjin Kim","orcid":"https://orcid.org/0009-0003-6558-2902"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seungjin Kim","raw_affiliation_strings":["System LSI Business, Samsung Electronics, Hwaseong, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"System LSI Business, Samsung Electronics, Hwaseong, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061744768","display_name":"Seunghyun Oh","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seunghyun Oh","raw_affiliation_strings":["System LSI Business, Samsung Electronics, Hwaseong, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"System LSI Business, Samsung Electronics, Hwaseong, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101424767","display_name":"Jongwoo Lee","orcid":"https://orcid.org/0000-0001-6746-9645"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jongwoo Lee","raw_affiliation_strings":["System LSI Business, Samsung Electronics, Hwaseong, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"System LSI Business, Samsung Electronics, Hwaseong, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100400981","display_name":"Sung Min Park","orcid":"https://orcid.org/0000-0003-2653-9955"},"institutions":[{"id":"https://openalex.org/I138925566","display_name":"Ewha Womans University","ror":"https://ror.org/053fp5c05","country_code":"KR","type":"education","lineage":["https://openalex.org/I138925566"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sung Min Park","raw_affiliation_strings":["Department of Electronic and Electrical Engineering, Graduate Program in Smart Factory, Ewha Womans University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0003-2653-9955","affiliations":[{"raw_affiliation_string":"Department of Electronic and Electrical Engineering, Graduate Program in Smart Factory, Ewha Womans University, Seoul, South Korea","institution_ids":["https://openalex.org/I138925566"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3534,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.5667484,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"70","issue":"8","first_page":"2719","last_page":"2723"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/phase-locked-loop","display_name":"Phase-locked loop","score":0.7776274085044861},{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.7761969566345215},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.639410674571991},{"id":"https://openalex.org/keywords/duty-cycle","display_name":"Duty cycle","score":0.6301949620246887},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.4604519009590149},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.45581334829330444},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.45418891310691833},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.4431024193763733},{"id":"https://openalex.org/keywords/ring","display_name":"Ring (chemistry)","score":0.4158127009868622},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.40008264780044556},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.39810317754745483},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3282848000526428},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21720534563064575},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.15204215049743652}],"concepts":[{"id":"https://openalex.org/C12707504","wikidata":"https://www.wikidata.org/wiki/Q52637","display_name":"Phase-locked loop","level":3,"score":0.7776274085044861},{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.7761969566345215},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.639410674571991},{"id":"https://openalex.org/C199822604","wikidata":"https://www.wikidata.org/wiki/Q557120","display_name":"Duty cycle","level":3,"score":0.6301949620246887},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.4604519009590149},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.45581334829330444},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.45418891310691833},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.4431024193763733},{"id":"https://openalex.org/C2780378348","wikidata":"https://www.wikidata.org/wiki/Q25351438","display_name":"Ring (chemistry)","level":2,"score":0.4158127009868622},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.40008264780044556},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.39810317754745483},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3282848000526428},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21720534563064575},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.15204215049743652},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsii.2022.3217756","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2022.3217756","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8999999761581421,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2175048562","https://openalex.org/W2800076889","https://openalex.org/W2921886179","https://openalex.org/W3016021971","https://openalex.org/W3126979297","https://openalex.org/W3214302083"],"related_works":["https://openalex.org/W2121182846","https://openalex.org/W2139484866","https://openalex.org/W2008250178","https://openalex.org/W2474043983","https://openalex.org/W2566880546","https://openalex.org/W2078513307","https://openalex.org/W2544336511","https://openalex.org/W2144737022","https://openalex.org/W2000633969","https://openalex.org/W1978186604"],"abstract_inverted_index":{"This":[0],"brief":[1],"presents":[2],"a":[3,13,53,61,80],"208-MHz,":[4],"0.75-mW":[5],"self-calibrated":[6],"reference":[7,16],"frequency":[8,21,34],"quadrupler":[9],"(RFQ),":[10],"which":[11],"provides":[12],"4x":[14],"higher":[15],"clock":[17],"with":[18,73],"minimal":[19],"deterministic":[20],"error.":[22],"The":[23,70,85],"digital-assisted":[24],"calibration":[25,47],"technique":[26],"is":[27,91,119],"exploited":[28],"to":[29,40,124],"compensate":[30],"wide":[31],"range":[32],"of":[33,45,51,88,103,116],"and":[35,39],"duty":[36,54],"cycle":[37,55],"errors":[38],"reduce":[41],"the":[42,65,74,89,97,101,111,113,117],"noise":[43],"degradation":[44],"analog":[46],"loop.":[48],"Also,":[49],"instead":[50],"utilizing":[52],"corrector":[56],"for":[57],"2x":[58],"clock,":[59],"reusing":[60],"delay":[62],"cell":[63],"reduces":[64],"power":[66],"consumption":[67],"by":[68],"50%.":[69],"fractional-N":[71],"ring-PLL":[72],"proposed":[75],"RFQ":[76,90],"was":[77],"implemented":[78],"in":[79],"4nm":[81],"FinFET":[82],"CMOS":[83],"process.":[84],"active":[86],"area":[87,102],"0.0175mm":[92],"<sup":[93,105],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[94,106],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[95,107],"while":[96],"whole":[98],"PLL":[99,118],"occupies":[100],"0.109mm":[104],".":[108],"By":[109],"using":[110],"RFQ,":[112],"measured":[114],"RMS-jitter":[115],"definitely":[120],"improved":[121],"from":[122],"6.6ps":[123],"3.35ps":[125],"at":[126],"1.92GHz":[127],"output":[128],"frequency.":[129]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}