{"id":"https://openalex.org/W4289537597","doi":"https://doi.org/10.1109/tcsii.2022.3195760","title":"Improved Integrated Hybrid DC Circuit Breaker for MTDC Grid Protection","display_name":"Improved Integrated Hybrid DC Circuit Breaker for MTDC Grid Protection","publication_year":2022,"publication_date":"2022-08-02","ids":{"openalex":"https://openalex.org/W4289537597","doi":"https://doi.org/10.1109/tcsii.2022.3195760"},"language":"en","primary_location":{"id":"doi:10.1109/tcsii.2022.3195760","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2022.3195760","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100450412","display_name":"Shuo Zhang","orcid":"https://orcid.org/0000-0003-4344-1212"},"institutions":[{"id":"https://openalex.org/I154099455","display_name":"Shandong University","ror":"https://ror.org/0207yh398","country_code":"CN","type":"education","lineage":["https://openalex.org/I154099455"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuo Zhang","raw_affiliation_strings":["School of Electrical Engineering, Shandong University, Jinan, China"],"raw_orcid":"https://orcid.org/0000-0003-4344-1212","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Shandong University, Jinan, China","institution_ids":["https://openalex.org/I154099455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051744665","display_name":"Guibin Zou","orcid":"https://orcid.org/0000-0001-6267-9993"},"institutions":[{"id":"https://openalex.org/I154099455","display_name":"Shandong University","ror":"https://ror.org/0207yh398","country_code":"CN","type":"education","lineage":["https://openalex.org/I154099455"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guibin Zou","raw_affiliation_strings":["School of Electrical Engineering, Shandong University, Jinan, China"],"raw_orcid":"https://orcid.org/0000-0001-6267-9993","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Shandong University, Jinan, China","institution_ids":["https://openalex.org/I154099455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066908116","display_name":"Xiuyan Wei","orcid":"https://orcid.org/0000-0003-0929-2671"},"institutions":[{"id":"https://openalex.org/I154099455","display_name":"Shandong University","ror":"https://ror.org/0207yh398","country_code":"CN","type":"education","lineage":["https://openalex.org/I154099455"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiuyan Wei","raw_affiliation_strings":["School of Electrical Engineering, Shandong University, Jinan, China"],"raw_orcid":"https://orcid.org/0000-0003-0929-2671","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Shandong University, Jinan, China","institution_ids":["https://openalex.org/I154099455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013146458","display_name":"Chenghan Zhou","orcid":"https://orcid.org/0000-0003-4425-9236"},"institutions":[{"id":"https://openalex.org/I154099455","display_name":"Shandong University","ror":"https://ror.org/0207yh398","country_code":"CN","type":"education","lineage":["https://openalex.org/I154099455"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chenghan Zhou","raw_affiliation_strings":["School of Electrical Engineering, Shandong University, Jinan, China"],"raw_orcid":"https://orcid.org/0000-0003-4425-9236","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Shandong University, Jinan, China","institution_ids":["https://openalex.org/I154099455"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5080477449","display_name":"Kunyin Zhou","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Kunyin Zhou","raw_affiliation_strings":["Jian Shi Technology Company Ltd., Shenzhen, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Jian Shi Technology Company Ltd., Shenzhen, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.6463,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.66505056,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":98},"biblio":{"volume":"69","issue":"12","first_page":"4999","last_page":"5003"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14502","display_name":"High-Voltage Power Transmission Systems","score":0.9907000064849854,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11808","display_name":"Superconducting Materials and Applications","score":0.9760000109672546,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/circuit-breaker","display_name":"Circuit breaker","score":0.816224217414856},{"id":"https://openalex.org/keywords/arc-fault-circuit-interrupter","display_name":"Arc-fault circuit interrupter","score":0.5722839832305908},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5384537577629089},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4858412444591522},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4841333329677582},{"id":"https://openalex.org/keywords/current-limiting","display_name":"Current limiting","score":0.4395352005958557},{"id":"https://openalex.org/keywords/inductor","display_name":"Inductor","score":0.43764910101890564},{"id":"https://openalex.org/keywords/grid","display_name":"Grid","score":0.4356898069381714},{"id":"https://openalex.org/keywords/dissipation","display_name":"Dissipation","score":0.43317344784736633},{"id":"https://openalex.org/keywords/inductance","display_name":"Inductance","score":0.43266889452934265},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.341959685087204},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3366023302078247},{"id":"https://openalex.org/keywords/short-circuit","display_name":"Short circuit","score":0.2733839750289917},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.17812952399253845},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1480329930782318},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08001434803009033}],"concepts":[{"id":"https://openalex.org/C61352017","wikidata":"https://www.wikidata.org/wiki/Q211058","display_name":"Circuit breaker","level":2,"score":0.816224217414856},{"id":"https://openalex.org/C157069517","wikidata":"https://www.wikidata.org/wiki/Q132172","display_name":"Arc-fault circuit interrupter","level":4,"score":0.5722839832305908},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5384537577629089},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4858412444591522},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4841333329677582},{"id":"https://openalex.org/C204106720","wikidata":"https://www.wikidata.org/wiki/Q15856134","display_name":"Current limiting","level":3,"score":0.4395352005958557},{"id":"https://openalex.org/C144534570","wikidata":"https://www.wikidata.org/wiki/Q5325","display_name":"Inductor","level":3,"score":0.43764910101890564},{"id":"https://openalex.org/C187691185","wikidata":"https://www.wikidata.org/wiki/Q2020720","display_name":"Grid","level":2,"score":0.4356898069381714},{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.43317344784736633},{"id":"https://openalex.org/C29210110","wikidata":"https://www.wikidata.org/wiki/Q177897","display_name":"Inductance","level":3,"score":0.43266889452934265},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.341959685087204},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3366023302078247},{"id":"https://openalex.org/C68583231","wikidata":"https://www.wikidata.org/wiki/Q206907","display_name":"Short circuit","level":3,"score":0.2733839750289917},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.17812952399253845},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1480329930782318},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08001434803009033},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsii.2022.3195760","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2022.3195760","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8999999761581421}],"awards":[{"id":"https://openalex.org/G2137722190","display_name":null,"funder_award_id":"52077124","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W2290973808","https://openalex.org/W2343550325","https://openalex.org/W2587108853","https://openalex.org/W2673002214","https://openalex.org/W2910606805","https://openalex.org/W2971758057","https://openalex.org/W2999366149","https://openalex.org/W3010840985","https://openalex.org/W3037132975","https://openalex.org/W3154999374","https://openalex.org/W3155697195","https://openalex.org/W3172253937","https://openalex.org/W6696614334"],"related_works":["https://openalex.org/W2769490182","https://openalex.org/W2196183592","https://openalex.org/W2166381952","https://openalex.org/W2120661608","https://openalex.org/W4224442805","https://openalex.org/W2114486131","https://openalex.org/W3168403633","https://openalex.org/W4285445067","https://openalex.org/W1487788472","https://openalex.org/W2078222865"],"abstract_inverted_index":{"The":[0],"current-limiting":[1],"inductors":[2],"are":[3],"usually":[4],"installed":[5],"in":[6,45,67,72],"the":[7,13,22,31,41,51,73,79,91,114,124,127],"multi-terminal":[8,74],"dc":[9,32,47,62,75,88],"grid":[10,55],"to":[11],"limit":[12],"fault":[14,27,80,109],"current":[15],"rising":[16],"speed.":[17],"However,":[18],"they":[19],"will":[20],"increase":[21],"energy":[23],"dissipation":[24,53],"pressure":[25],"and":[26,50,107,120],"isolation":[28,81,110],"time":[29],"of":[30,43,54,98,126],"circuit":[33,48,63,89],"breaker,":[34],"which":[35],"puts":[36],"forward":[37],"higher":[38,96],"requirements":[39],"on":[40,84],"capacity":[42,105],"arresters":[44],"hybrid":[46,61,87],"breaker":[49,64,93],"heat":[52],"equipment.":[56],"Therefore,":[57],"an":[58],"improved":[59],"integrated":[60,86],"is":[65],"proposed":[66,92,128],"this":[68],"brief":[69],"for":[70],"applications":[71],"grid.":[76],"Compared":[77],"with":[78],"solution":[82],"based":[83],"existing":[85],"breakers,":[90],"has":[94],"slightly":[95],"cost":[97],"semiconductor":[99],"switches":[100],"but":[101],"significantly":[102],"reduced":[103],"arrester":[104],"requirement":[106],"faster":[108],"speed":[111],"by":[112],"bypassing":[113],"inductance":[115],"components.":[116],"Extensive":[117],"electromagnetic":[118],"simulations":[119],"physical":[121],"experiments":[122],"verify":[123],"effectiveness":[125],"device.":[129]},"counts_by_year":[{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":4}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}