{"id":"https://openalex.org/W4285819444","doi":"https://doi.org/10.1109/tcsii.2022.3192268","title":"A Compact Low-Loss High-Selectivity Excellent-Isolation FBAR Duplexer Integrated Chip for LTE Band-3 Industrial Applications","display_name":"A Compact Low-Loss High-Selectivity Excellent-Isolation FBAR Duplexer Integrated Chip for LTE Band-3 Industrial Applications","publication_year":2022,"publication_date":"2022-07-19","ids":{"openalex":"https://openalex.org/W4285819444","doi":"https://doi.org/10.1109/tcsii.2022.3192268"},"language":"en","primary_location":{"id":"doi:10.1109/tcsii.2022.3192268","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2022.3192268","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040846618","display_name":"Yongle Wu","orcid":"https://orcid.org/0000-0002-3269-7143"},"institutions":[{"id":"https://openalex.org/I139759216","display_name":"Beijing University of Posts and Telecommunications","ror":"https://ror.org/04w9fbh59","country_code":"CN","type":"education","lineage":["https://openalex.org/I139759216"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yongle Wu","raw_affiliation_strings":["School of Electronic Engineering, Beijing Key Laboratory of Work Safety Intelligent Monitoring, Beijing University of Posts and Telecommunications, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic Engineering, Beijing Key Laboratory of Work Safety Intelligent Monitoring, Beijing University of Posts and Telecommunications, Beijing, China","institution_ids":["https://openalex.org/I139759216"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064048788","display_name":"Haopeng Wu","orcid":"https://orcid.org/0000-0002-0758-9546"},"institutions":[{"id":"https://openalex.org/I139759216","display_name":"Beijing University of Posts and Telecommunications","ror":"https://ror.org/04w9fbh59","country_code":"CN","type":"education","lineage":["https://openalex.org/I139759216"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haopeng Wu","raw_affiliation_strings":["School of Electronic Engineering, Beijing Key Laboratory of Work Safety Intelligent Monitoring, Beijing University of Posts and Telecommunications, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic Engineering, Beijing Key Laboratory of Work Safety Intelligent Monitoring, Beijing University of Posts and Telecommunications, Beijing, China","institution_ids":["https://openalex.org/I139759216"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100331967","display_name":"Weimin Wang","orcid":"https://orcid.org/0000-0003-3110-3259"},"institutions":[{"id":"https://openalex.org/I139759216","display_name":"Beijing University of Posts and Telecommunications","ror":"https://ror.org/04w9fbh59","country_code":"CN","type":"education","lineage":["https://openalex.org/I139759216"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weimin Wang","raw_affiliation_strings":["School of Electronic Engineering, Beijing Key Laboratory of Work Safety Intelligent Monitoring, Beijing University of Posts and Telecommunications, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic Engineering, Beijing Key Laboratory of Work Safety Intelligent Monitoring, Beijing University of Posts and Telecommunications, Beijing, China","institution_ids":["https://openalex.org/I139759216"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050946054","display_name":"Yuhao Yang","orcid":"https://orcid.org/0000-0003-2569-6115"},"institutions":[{"id":"https://openalex.org/I139759216","display_name":"Beijing University of Posts and Telecommunications","ror":"https://ror.org/04w9fbh59","country_code":"CN","type":"education","lineage":["https://openalex.org/I139759216"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuhao Yang","raw_affiliation_strings":["School of Electronic Engineering, Beijing Key Laboratory of Work Safety Intelligent Monitoring, Beijing University of Posts and Telecommunications, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic Engineering, Beijing Key Laboratory of Work Safety Intelligent Monitoring, Beijing University of Posts and Telecommunications, Beijing, China","institution_ids":["https://openalex.org/I139759216"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065514033","display_name":"Zhiguo Lai","orcid":"https://orcid.org/0000-0002-8959-6896"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Zhiguo Lai","raw_affiliation_strings":["Design Department, HunterSun Electronics Company Ltd., Suzhou, China"],"affiliations":[{"raw_affiliation_string":"Design Department, HunterSun Electronics Company Ltd., Suzhou, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5015765075","display_name":"Qinghua Yang","orcid":"https://orcid.org/0000-0003-4679-1621"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Qinghua Yang","raw_affiliation_strings":["Design Department, HunterSun Electronics Company Ltd., Suzhou, China"],"affiliations":[{"raw_affiliation_string":"Design Department, HunterSun Electronics Company Ltd., Suzhou, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5040846618"],"corresponding_institution_ids":["https://openalex.org/I139759216"],"apc_list":null,"apc_paid":null,"fwci":0.9146,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.72667762,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":98},"biblio":{"volume":"69","issue":"11","first_page":"4563","last_page":"4567"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11160","display_name":"Acoustic Wave Resonator Technologies","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12791","display_name":"Full-Duplex Wireless Communications","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/duplexer","display_name":"Duplexer","score":0.9697560667991638},{"id":"https://openalex.org/keywords/resonator","display_name":"Resonator","score":0.760995626449585},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6300122737884521},{"id":"https://openalex.org/keywords/inductance","display_name":"Inductance","score":0.5468043088912964},{"id":"https://openalex.org/keywords/wafer","display_name":"Wafer","score":0.5351653099060059},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.49862217903137207},{"id":"https://openalex.org/keywords/insertion-loss","display_name":"Insertion loss","score":0.4856961667537689},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4197406470775604},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.38821637630462646},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.37623071670532227},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2219955027103424},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.10945922136306763}],"concepts":[{"id":"https://openalex.org/C47104104","wikidata":"https://www.wikidata.org/wiki/Q1266530","display_name":"Duplexer","level":3,"score":0.9697560667991638},{"id":"https://openalex.org/C97126364","wikidata":"https://www.wikidata.org/wiki/Q349669","display_name":"Resonator","level":2,"score":0.760995626449585},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6300122737884521},{"id":"https://openalex.org/C29210110","wikidata":"https://www.wikidata.org/wiki/Q177897","display_name":"Inductance","level":3,"score":0.5468043088912964},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.5351653099060059},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.49862217903137207},{"id":"https://openalex.org/C90327742","wikidata":"https://www.wikidata.org/wiki/Q947396","display_name":"Insertion loss","level":2,"score":0.4856961667537689},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4197406470775604},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.38821637630462646},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.37623071670532227},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2219955027103424},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.10945922136306763},{"id":"https://openalex.org/C21822782","wikidata":"https://www.wikidata.org/wiki/Q131214","display_name":"Antenna (radio)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsii.2022.3192268","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2022.3192268","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.5600000023841858,"id":"https://metadata.un.org/sdg/9"}],"awards":[{"id":"https://openalex.org/G3582922362","display_name":null,"funder_award_id":"U21A20510","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5063667700","display_name":null,"funder_award_id":"U20A20203","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7180738450","display_name":null,"funder_award_id":"JQ19018","funder_id":"https://openalex.org/F4320322919","funder_display_name":"Natural Science Foundation of Beijing Municipality"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320322919","display_name":"Natural Science Foundation of Beijing Municipality","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W1533838058","https://openalex.org/W2258089215","https://openalex.org/W1558679840","https://openalex.org/W1650416365","https://openalex.org/W2161150522","https://openalex.org/W2012623581","https://openalex.org/W2139490960","https://openalex.org/W2790806938","https://openalex.org/W2109739913","https://openalex.org/W2624506604"],"abstract_inverted_index":{"This":[0],"brief":[1],"presents":[2],"a":[3,8],"complete":[4],"design":[5,44,70],"flow":[6,71],"for":[7,80,99],"compact":[9],"low-loss":[10],"high-selectivity":[11],"excellent-isolation":[12],"LTE":[13],"Band3":[14],"(B3)":[15],"duplexer":[16,28],"(TX:":[17],"1710":[18],"MHz-1785":[19],"MHz,":[20],"RX:":[21],"1805":[22],"MHz-1880":[23],"MHz).":[24],"The":[25],"proposed":[26],"chip":[27],"is":[29],"based":[30],"on":[31,54,68],"the":[32,42,46,56,69,81,88,93,107],"thin":[33],"film":[34],"bulk":[35],"acoustic":[36],"resonator":[37,51],"(FBAR).":[38],"In":[39],"addition":[40],"to":[41],"general":[43],"method,":[45],"effects":[47],"of":[48,59,77,84,124],"temperature":[49],"drift,":[50],"performance":[52],"distribution":[53,67],"wafer,":[55],"quality":[57],"factor":[58],"inductance,":[60],"device":[61],"yield,":[62],"and":[63,126,135],"dissipated":[64],"power":[65],"density":[66],"are":[72,76,97,138],"described.":[73],"These":[74],"aspects":[75],"great":[78],"significance":[79],"batch":[82],"production":[83],"FBAR":[85],"duplexers":[86],"in":[87,113,119,132],"industry.":[89],"Samples":[90],"that":[91],"pass":[92],"above":[94],"industrial":[95],"process":[96],"selected":[98],"testing.":[100],"Measured":[101],"results":[102],"show":[103],"reasonable":[104],"consistency":[105],"with":[106,140],"co-simulation":[108],"results.":[109],"1.2/1.0-dB":[110],"minimum":[111],"IL":[112],"TX":[114,134],"/RX":[115],"band,":[116],"20-dB":[117],"rejection":[118],"3.5":[120],"GHz":[121],"(second":[122],"harmonic":[123],"TX),":[125],"more":[127],"than":[128],"50":[129],"dB":[130],"isolation":[131],"both":[133],"RX":[136],"frequency":[137],"achieved":[139],"less":[141],"massload":[142],"simultaneously.":[143]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}