{"id":"https://openalex.org/W4225852914","doi":"https://doi.org/10.1109/tcsii.2022.3170460","title":"Preselection Methods to Achieve Very Low BER in SRAM-Based PUFs\u2014A Tutorial","display_name":"Preselection Methods to Achieve Very Low BER in SRAM-Based PUFs\u2014A Tutorial","publication_year":2022,"publication_date":"2022-04-26","ids":{"openalex":"https://openalex.org/W4225852914","doi":"https://doi.org/10.1109/tcsii.2022.3170460"},"language":"en","primary_location":{"id":"doi:10.1109/tcsii.2022.3170460","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2022.3170460","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006858727","display_name":"Yizhak Shifman","orcid":"https://orcid.org/0000-0003-1089-1081"},"institutions":[{"id":"https://openalex.org/I13955877","display_name":"Bar-Ilan University","ror":"https://ror.org/03kgsv495","country_code":"IL","type":"education","lineage":["https://openalex.org/I13955877"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Yizhak Shifman","raw_affiliation_strings":["Alexander Kofkin Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel"],"raw_orcid":"https://orcid.org/0000-0003-1089-1081","affiliations":[{"raw_affiliation_string":"Alexander Kofkin Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel","institution_ids":["https://openalex.org/I13955877"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038423749","display_name":"Joseph Shor","orcid":"https://orcid.org/0000-0002-9184-8642"},"institutions":[{"id":"https://openalex.org/I13955877","display_name":"Bar-Ilan University","ror":"https://ror.org/03kgsv495","country_code":"IL","type":"education","lineage":["https://openalex.org/I13955877"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Joseph Shor","raw_affiliation_strings":["Alexander Kofkin Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel"],"raw_orcid":"https://orcid.org/0000-0002-9184-8642","affiliations":[{"raw_affiliation_string":"Alexander Kofkin Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel","institution_ids":["https://openalex.org/I13955877"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I13955877"],"apc_list":null,"apc_paid":null,"fwci":1.958,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.84630237,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"69","issue":"6","first_page":"2551","last_page":"2556"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9775999784469604,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.795840859413147},{"id":"https://openalex.org/keywords/exploit","display_name":"Exploit","score":0.5864141583442688},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5557027459144592},{"id":"https://openalex.org/keywords/physical-unclonable-function","display_name":"Physical unclonable function","score":0.46172255277633667},{"id":"https://openalex.org/keywords/latency","display_name":"Latency (audio)","score":0.4548221230506897},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4463726282119751},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.4384026825428009},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.416179895401001},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4141748547554016},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.404948353767395},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3277452290058136},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2847086489200592},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.20774397253990173},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08157312870025635}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.795840859413147},{"id":"https://openalex.org/C165696696","wikidata":"https://www.wikidata.org/wiki/Q11287","display_name":"Exploit","level":2,"score":0.5864141583442688},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5557027459144592},{"id":"https://openalex.org/C8643368","wikidata":"https://www.wikidata.org/wiki/Q4046262","display_name":"Physical unclonable function","level":3,"score":0.46172255277633667},{"id":"https://openalex.org/C82876162","wikidata":"https://www.wikidata.org/wiki/Q17096504","display_name":"Latency (audio)","level":2,"score":0.4548221230506897},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4463726282119751},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.4384026825428009},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.416179895401001},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4141748547554016},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.404948353767395},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3277452290058136},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2847086489200592},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.20774397253990173},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08157312870025635},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsii.2022.3170460","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2022.3170460","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W609951012","https://openalex.org/W1965555277","https://openalex.org/W2000171858","https://openalex.org/W2012336980","https://openalex.org/W2088455835","https://openalex.org/W2113322447","https://openalex.org/W2343755845","https://openalex.org/W2791198567","https://openalex.org/W2899983232","https://openalex.org/W2907642298","https://openalex.org/W2942647760","https://openalex.org/W2964420546","https://openalex.org/W2965673716","https://openalex.org/W2969691719","https://openalex.org/W2999571526","https://openalex.org/W3033257916","https://openalex.org/W3090578905","https://openalex.org/W3097636983","https://openalex.org/W3105907146","https://openalex.org/W3108373283","https://openalex.org/W3133994200","https://openalex.org/W4237236484","https://openalex.org/W4312314448"],"related_works":["https://openalex.org/W17155033","https://openalex.org/W3207760230","https://openalex.org/W1496222301","https://openalex.org/W1590307681","https://openalex.org/W2536018345","https://openalex.org/W4312814274","https://openalex.org/W4285370786","https://openalex.org/W2296488620","https://openalex.org/W2775062502","https://openalex.org/W2302863414"],"abstract_inverted_index":{"The":[0],"most":[1],"prevalent":[2],"industrial":[3],"PUFs":[4,60],"(physical":[5],"unclonable":[6],"functions)":[7],"utilize":[8],"SRAM-based":[9,59],"designs.":[10],"Bit":[11],"stability":[12],"is":[13,42,71,115,140],"one":[14],"of":[15,81],"the":[16,40,47,87,93,112,127,136],"fundamental":[17],"problems":[18],"in":[19,79],"PUF":[20,22,48,94,138],"design.":[21],"circuits,":[23],"which":[24],"rely":[25],"on":[26],"silicon":[27],"manufacturing":[28],"mismatches":[29],"to":[30,37,124,129],"produce":[31],"a":[32,56,122],"random":[33],"key,":[34],"are":[35,106,119],"vulnerable":[36],"cases":[38],"where":[39],"mismatch":[41,99],"insufficient":[43],"and":[44,84,100,121],"noise":[45],"affects":[46],"response,":[49],"rendering":[50],"it":[51],"unstable.":[52],"This":[53,69],"brief":[54],"provides":[55],"tutorial":[57],"about":[58],"stable":[61,133],"bits":[62,134],"preselection,":[63],"utilizing":[64],"an":[65],"embedded":[66],"tilt":[67],"test.":[68],"method":[70,114,123],"more":[72,131],"efficient":[73],"than":[74],"existing":[75,137],"error":[76],"correction":[77],"codes":[78],"terms":[80],"power,":[82],"area":[83],"latency.":[85],"During":[86],"test,":[88],"external,":[89],"controlled":[90],"mismatch,":[91],"tilts":[92],"cells":[95,101],"against":[96],"their":[97,104],"manufactured":[98],"that":[102],"retain":[103],"response":[105],"considered":[107],"stable.":[108],"In":[109],"this":[110],"tutorial,":[111],"preselection":[113],"explained,":[116],"implementation":[117],"examples":[118],"presented,":[120],"further":[125],"exploit":[126],"test":[128],"obtain":[130],"uncorrelated":[132],"from":[135],"structure":[139],"introduced.":[141]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}