{"id":"https://openalex.org/W4226518755","doi":"https://doi.org/10.1109/tcsii.2022.3170317","title":"CMOS Automotive Radar Sensors: mm-Wave Circuit Design Challenges","display_name":"CMOS Automotive Radar Sensors: mm-Wave Circuit Design Challenges","publication_year":2022,"publication_date":"2022-04-26","ids":{"openalex":"https://openalex.org/W4226518755","doi":"https://doi.org/10.1109/tcsii.2022.3170317"},"language":"en","primary_location":{"id":"doi:10.1109/tcsii.2022.3170317","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2022.3170317","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5056497899","display_name":"Egidio Ragonese","orcid":"https://orcid.org/0000-0001-6893-7076"},"institutions":[{"id":"https://openalex.org/I39063666","display_name":"University of Catania","ror":"https://ror.org/03a64bh57","country_code":"IT","type":"education","lineage":["https://openalex.org/I39063666"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Egidio Ragonese","raw_affiliation_strings":["DIEEI, Università di Catania, Catania, Italy"],"raw_orcid":"https://orcid.org/0000-0001-6893-7076","affiliations":[{"raw_affiliation_string":"DIEEI, Università di Catania, Catania, Italy","institution_ids":["https://openalex.org/I39063666"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045736990","display_name":"Giuseppe Papotto","orcid":"https://orcid.org/0000-0002-6930-4948"},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Giuseppe Papotto","raw_affiliation_strings":["Automotive Division Group, STMicroelectronics, Catania, Italy"],"raw_orcid":"https://orcid.org/0000-0002-6930-4948","affiliations":[{"raw_affiliation_string":"Automotive Division Group, STMicroelectronics, Catania, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040977319","display_name":"Claudio Nocera","orcid":"https://orcid.org/0000-0002-0962-1132"},"institutions":[{"id":"https://openalex.org/I39063666","display_name":"University of Catania","ror":"https://ror.org/03a64bh57","country_code":"IT","type":"education","lineage":["https://openalex.org/I39063666"]},{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Claudio Nocera","raw_affiliation_strings":["DIEEI, Università di Catania, Catania, Italy","Automotive Division Group, STMicroelectronics, Catania, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"DIEEI, Università di Catania, Catania, Italy","institution_ids":["https://openalex.org/I39063666"]},{"raw_affiliation_string":"Automotive Division Group, STMicroelectronics, Catania, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070174228","display_name":"Andrea Cavarra","orcid":"https://orcid.org/0000-0002-7313-9316"},"institutions":[{"id":"https://openalex.org/I39063666","display_name":"University of Catania","ror":"https://ror.org/03a64bh57","country_code":"IT","type":"education","lineage":["https://openalex.org/I39063666"]},{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Andrea Cavarra","raw_affiliation_strings":["DIEEI, Università di Catania, Catania, Italy","Automotive Division Group, STMicroelectronics, Catania, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"DIEEI, Università di Catania, Catania, Italy","institution_ids":["https://openalex.org/I39063666"]},{"raw_affiliation_string":"Automotive Division Group, STMicroelectronics, Catania, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5030773202","display_name":"G. Palmisano","orcid":"https://orcid.org/0000-0002-6703-4438"},"institutions":[{"id":"https://openalex.org/I39063666","display_name":"University of Catania","ror":"https://ror.org/03a64bh57","country_code":"IT","type":"education","lineage":["https://openalex.org/I39063666"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Giuseppe Palmisano","raw_affiliation_strings":["DIEEI, Università di Catania, Catania, Italy"],"raw_orcid":"https://orcid.org/0000-0002-6703-4438","affiliations":[{"raw_affiliation_string":"DIEEI, Università di Catania, Catania, Italy","institution_ids":["https://openalex.org/I39063666"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.4929,"has_fulltext":false,"cited_by_count":27,"citation_normalized_percentile":{"value":0.8936062,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"69","issue":"6","first_page":"2610","last_page":"2616"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7801306247711182},{"id":"https://openalex.org/keywords/radar","display_name":"Radar","score":0.6435513496398926},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5700515508651733},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5543778538703918},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.5239174962043762},{"id":"https://openalex.org/keywords/front-and-back-ends","display_name":"Front and back ends","score":0.4877072274684906},{"id":"https://openalex.org/keywords/bicmos","display_name":"BiCMOS","score":0.4847850203514099},{"id":"https://openalex.org/keywords/bottleneck","display_name":"Bottleneck","score":0.48438507318496704},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4533965587615967},{"id":"https://openalex.org/keywords/circuit-design","display_name":"Circuit design","score":0.43662816286087036},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41527071595191956},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.24051439762115479},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.21406713128089905},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.16841238737106323},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.15731072425842285},{"id":"https://openalex.org/keywords/aerospace-engineering","display_name":"Aerospace engineering","score":0.08662194013595581}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7801306247711182},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.6435513496398926},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5700515508651733},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5543778538703918},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.5239174962043762},{"id":"https://openalex.org/C53016008","wikidata":"https://www.wikidata.org/wiki/Q620167","display_name":"Front and back ends","level":2,"score":0.4877072274684906},{"id":"https://openalex.org/C62427370","wikidata":"https://www.wikidata.org/wiki/Q173416","display_name":"BiCMOS","level":4,"score":0.4847850203514099},{"id":"https://openalex.org/C2780513914","wikidata":"https://www.wikidata.org/wiki/Q18210350","display_name":"Bottleneck","level":2,"score":0.48438507318496704},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4533965587615967},{"id":"https://openalex.org/C190560348","wikidata":"https://www.wikidata.org/wiki/Q3245116","display_name":"Circuit design","level":2,"score":0.43662816286087036},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41527071595191956},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.24051439762115479},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.21406713128089905},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.16841238737106323},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.15731072425842285},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.08662194013595581},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsii.2022.3170317","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2022.3170317","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7900000214576721}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":52,"referenced_works":["https://openalex.org/W1565751282","https://openalex.org/W1934187985","https://openalex.org/W1983296537","https://openalex.org/W1987860578","https://openalex.org/W1988396553","https://openalex.org/W1998515001","https://openalex.org/W2017358755","https://openalex.org/W2026327105","https://openalex.org/W2026991888","https://openalex.org/W2034290464","https://openalex.org/W2053910490","https://openalex.org/W2054430484","https://openalex.org/W2057815485","https://openalex.org/W2074147625","https://openalex.org/W2110708255","https://openalex.org/W2111596725","https://openalex.org/W2130899131","https://openalex.org/W2146662309","https://openalex.org/W2183614678","https://openalex.org/W2188438365","https://openalex.org/W2471244034","https://openalex.org/W2522639613","https://openalex.org/W2585039363","https://openalex.org/W2619168741","https://openalex.org/W2769069064","https://openalex.org/W2783416060","https://openalex.org/W2790475025","https://openalex.org/W2886148749","https://openalex.org/W2903516069","https://openalex.org/W2911219185","https://openalex.org/W2920828572","https://openalex.org/W2921235921","https://openalex.org/W2943856544","https://openalex.org/W2975183075","https://openalex.org/W2981256602","https://openalex.org/W2985550022","https://openalex.org/W2990261233","https://openalex.org/W3000291750","https://openalex.org/W3015845666","https://openalex.org/W3041272295","https://openalex.org/W3048187696","https://openalex.org/W3112870264","https://openalex.org/W3113139057","https://openalex.org/W3121566439","https://openalex.org/W3122692835","https://openalex.org/W3130904563","https://openalex.org/W3134095171","https://openalex.org/W3134566067","https://openalex.org/W3162890458","https://openalex.org/W3175482359","https://openalex.org/W3177207121","https://openalex.org/W6633513416"],"related_works":["https://openalex.org/W2595172197","https://openalex.org/W2084856301","https://openalex.org/W2127970246","https://openalex.org/W4382618745","https://openalex.org/W2885125400","https://openalex.org/W1001352512","https://openalex.org/W1989889224","https://openalex.org/W1973775000","https://openalex.org/W2748922771","https://openalex.org/W2765731031"],"abstract_inverted_index":{"This":[0],"brief":[1],"gives":[2],"an":[3],"overview":[4],"of":[5,67,84],"recent":[6],"advancements":[7],"in":[8,49,98],"CMOS":[9,25,103],"automotive":[10],"radar":[11,87,96],"sensors,":[12],"focusing":[13],"on":[14],"the":[15,59,64,85],"most":[16],"critical":[17,81],"circuit":[18,90],"design":[19,73],"at":[20],"mm-wave":[21,86],"frequencies.":[22],"Highly":[23],"scaled":[24],"technologies":[26],"enable":[27],"very":[28,53],"low-power":[29],"consumption,":[30],"reduced":[31],"costs,":[32],"and":[33,38,72],"higher":[34],"data":[35],"processing":[36],"capacity":[37],"integration":[39],"compared":[40],"to":[41,63,80],"state-of-the-art":[42],"SiGe":[43],"BiCMOS":[44],"chip-set":[45],"solutions":[46],"commonly":[47],"adopted":[48],"commercial":[50],"products.":[51],"The":[52],"bottleneck":[54],"is":[55],"still":[56],"represented":[57],"by":[58],"radio":[60],"front-end":[61],"due":[62],"challenging":[65],"requirements":[66],"long-range":[68,95],"radars.":[69],"Circuit":[70],"topologies":[71],"tradeoffs":[74],"are":[75],"here":[76],"discussed":[77],"with":[78],"reference":[79],"building":[82],"blocks":[83],"front-end,":[88],"reporting":[89],"implementations":[91],"for":[92],"a":[93,99],"77-GHz":[94],"sensor":[97],"28-nm":[100],"fully-depleted":[101],"silicon-on-insulator":[102],"technology.":[104]},"counts_by_year":[{"year":2025,"cited_by_count":8},{"year":2024,"cited_by_count":8},{"year":2023,"cited_by_count":10},{"year":2022,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}