{"id":"https://openalex.org/W4226176885","doi":"https://doi.org/10.1109/tcsii.2022.3163177","title":"Bit-Aware Fault-Tolerant Hybrid Retraining and Remapping Schemes for RRAM-Based Computing-in-Memory Systems","display_name":"Bit-Aware Fault-Tolerant Hybrid Retraining and Remapping Schemes for RRAM-Based Computing-in-Memory Systems","publication_year":2022,"publication_date":"2022-03-29","ids":{"openalex":"https://openalex.org/W4226176885","doi":"https://doi.org/10.1109/tcsii.2022.3163177"},"language":"en","primary_location":{"id":"doi:10.1109/tcsii.2022.3163177","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2022.3163177","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5005373227","display_name":"Yuxuan Huang","orcid":"https://orcid.org/0000-0002-4842-8781"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yuxuan Huang","raw_affiliation_strings":["Department of Electronic Engineering, Tsinghua University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101585746","display_name":"Yifan He","orcid":"https://orcid.org/0009-0001-8664-037X"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yifan He","raw_affiliation_strings":["Department of Electronic Engineering, Tsinghua University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013493174","display_name":"Jingyu Wang","orcid":"https://orcid.org/0000-0002-7160-4165"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jingyu Wang","raw_affiliation_strings":["Department of Electronic Engineering, Tsinghua University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053627404","display_name":"Jinshan Yue","orcid":"https://orcid.org/0000-0001-8234-7400"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinshan Yue","raw_affiliation_strings":["Chinese Academy of Sciences, Institute of Microelectronics, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences, Institute of Microelectronics, Beijing, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100388556","display_name":"Lu Zhang","orcid":"https://orcid.org/0000-0001-5696-2418"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lu Zhang","raw_affiliation_strings":["Department of Electronic Engineering, Tsinghua University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031365461","display_name":"Kaiwei Zou","orcid":"https://orcid.org/0000-0002-5319-3665"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kaiwei Zou","raw_affiliation_strings":["Department of Electronic Engineering, Tsinghua University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023755254","display_name":"Huazhong Yang","orcid":"https://orcid.org/0000-0003-2421-353X"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huazhong Yang","raw_affiliation_strings":["Department of Electronic Engineering, Tsinghua University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5045721867","display_name":"Yongpan Liu","orcid":"https://orcid.org/0000-0002-4892-2309"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yongpan Liu","raw_affiliation_strings":["Department of Electronic Engineering, Tsinghua University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5005373227"],"corresponding_institution_ids":["https://openalex.org/I99065089"],"apc_list":null,"apc_paid":null,"fwci":0.7364,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.68243303,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":"69","issue":"7","first_page":"3144","last_page":"3148"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7495117783546448},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.6073245406150818},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5338201522827148},{"id":"https://openalex.org/keywords/mnist-database","display_name":"MNIST database","score":0.52491295337677},{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.5238516330718994},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.47612887620925903},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.4665408134460449},{"id":"https://openalex.org/keywords/in-memory-processing","display_name":"In-Memory Processing","score":0.43237724900245667},{"id":"https://openalex.org/keywords/von-neumann-architecture","display_name":"Von Neumann architecture","score":0.4255518615245819},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.39975443482398987},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3945153057575226},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.39294520020484924},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.33060920238494873},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3226979374885559},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.23644787073135376},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.19620397686958313},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.11906939744949341},{"id":"https://openalex.org/keywords/search-engine","display_name":"Search engine","score":0.11341708898544312},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11052024364471436}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7495117783546448},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.6073245406150818},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5338201522827148},{"id":"https://openalex.org/C190502265","wikidata":"https://www.wikidata.org/wiki/Q17069496","display_name":"MNIST database","level":3,"score":0.52491295337677},{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.5238516330718994},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.47612887620925903},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.4665408134460449},{"id":"https://openalex.org/C123593499","wikidata":"https://www.wikidata.org/wiki/Q6008583","display_name":"In-Memory Processing","level":5,"score":0.43237724900245667},{"id":"https://openalex.org/C80469333","wikidata":"https://www.wikidata.org/wiki/Q189088","display_name":"Von Neumann architecture","level":2,"score":0.4255518615245819},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.39975443482398987},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3945153057575226},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.39294520020484924},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.33060920238494873},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3226979374885559},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.23644787073135376},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.19620397686958313},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.11906939744949341},{"id":"https://openalex.org/C97854310","wikidata":"https://www.wikidata.org/wiki/Q19541","display_name":"Search engine","level":2,"score":0.11341708898544312},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11052024364471436},{"id":"https://openalex.org/C164120249","wikidata":"https://www.wikidata.org/wiki/Q995982","display_name":"Web search query","level":3,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C194222762","wikidata":"https://www.wikidata.org/wiki/Q114486","display_name":"Query by Example","level":4,"score":0.0},{"id":"https://openalex.org/C23123220","wikidata":"https://www.wikidata.org/wiki/Q816826","display_name":"Information retrieval","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsii.2022.3163177","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2022.3163177","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.9100000262260437}],"awards":[{"id":"https://openalex.org/G1076488631","display_name":null,"funder_award_id":"62106125","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5582252795","display_name":null,"funder_award_id":"61934005","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7374863921","display_name":null,"funder_award_id":"L211005","funder_id":"https://openalex.org/F4320334977","funder_display_name":"Beijing Municipal Natural Science Foundation"},{"id":"https://openalex.org/G818288671","display_name":null,"funder_award_id":"2018YFA0701500","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320327539","display_name":"Beijing Innovation Center for Future Chip","ror":null},{"id":"https://openalex.org/F4320329777","display_name":"Beijing National Research Center For Information Science And Technology","ror":null},{"id":"https://openalex.org/F4320334977","display_name":"Beijing Municipal Natural Science Foundation","ror":null},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1971319818","https://openalex.org/W2112796928","https://openalex.org/W2194775991","https://openalex.org/W2508602506","https://openalex.org/W2518281301","https://openalex.org/W2591601611","https://openalex.org/W2612375349","https://openalex.org/W2625840880","https://openalex.org/W2768104155","https://openalex.org/W2792893539","https://openalex.org/W2798170643","https://openalex.org/W2827033417","https://openalex.org/W2997869757","https://openalex.org/W3104263540","https://openalex.org/W3138138784","https://openalex.org/W3139521791","https://openalex.org/W3155456425","https://openalex.org/W6637373629","https://openalex.org/W6720242923"],"related_works":["https://openalex.org/W4322580884","https://openalex.org/W3137037072","https://openalex.org/W4308870977","https://openalex.org/W2983750276","https://openalex.org/W2518875864","https://openalex.org/W3164445786","https://openalex.org/W2802367674","https://openalex.org/W3212430008","https://openalex.org/W2960205134","https://openalex.org/W4391088680"],"abstract_inverted_index":{"Non-volatile":[0],"computing-in-memory":[1],"(nvCIM)":[2],"has":[3],"become":[4],"one":[5],"of":[6,34,50,126],"the":[7,20,28,32,45,57,69,83,87,110,123],"most":[8],"efficient":[9],"methods":[10],"to":[11,19,27,67,115,135,139,144],"deal":[12],"with":[13,82,93,146],"increasingly":[14],"complicated":[15],"neural":[16],"networks":[17],"compared":[18],"traditional":[21],"von":[22],"Neumann":[23],"architecture.":[24],"However,":[25],"due":[26],"immature":[29],"fabrication":[30],"issues,":[31],"yield":[33],"resistive":[35],"random":[36],"access":[37],"memory":[38],"(RRAM)":[39],"cells":[40],"is":[41,113,131],"limited,":[42],"which":[43],"causes":[44],"Stuck-At-Faults":[46],"(SAFs)":[47],"and":[48,62,86,96,117,129,141,151],"decrease":[49],"network":[51,70],"classification":[52,71,124],"accuracy.":[53],"In":[54],"this":[55],"brief,":[56],"bit-aware":[58],"fault-tolerant":[59],"hybrid":[60],"retraining":[61],"remapping":[63],"schemes":[64],"are":[65,80,91,105],"proposed":[66],"restore":[68],"accuracy":[72,125],"caused":[73],"by":[74],"SAFs.":[75],"The":[76],"low":[77],"weight":[78,89],"bits":[79,90,102],"retrained":[81],"fault":[84,111],"mask":[85],"high":[88],"remapped":[92],"column":[94],"swap":[95],"zero":[97],"correction":[98],"methods.":[99],"For":[100],"those":[101],"whose":[103],"values":[104],"still":[106],"wrong":[107],"after":[108],"remapping,":[109],"index":[112],"used":[114],"record":[116],"calibrate.":[118],"Experimental":[119],"results":[120],"show":[121],"that":[122],"MNIST,":[127],"CIFAR-10,":[128],"CIFAR-100":[130],"restored":[132],"from":[133,137,142],"12.54%":[134],"98.13%,":[136],"10.29%":[138],"90.60%,":[140],"0.94%":[143],"74.30%":[145],"only":[147],"10.3%":[148],"energy":[149],"consumption":[150],"5.88%":[152],"area":[153],"overhead,":[154],"respectively.":[155]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":2}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}