{"id":"https://openalex.org/W3196113442","doi":"https://doi.org/10.1109/tcsii.2021.3105558","title":"ACME-2: Improving the Extraction of Essential Bits in Xilinx SRAM-Based FPGAs","display_name":"ACME-2: Improving the Extraction of Essential Bits in Xilinx SRAM-Based FPGAs","publication_year":2021,"publication_date":"2021-08-17","ids":{"openalex":"https://openalex.org/W3196113442","doi":"https://doi.org/10.1109/tcsii.2021.3105558","mag":"3196113442"},"language":"en","primary_location":{"id":"doi:10.1109/tcsii.2021.3105558","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2021.3105558","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5025171789","display_name":"Luis Alberto Aranda","orcid":"https://orcid.org/0000-0003-4458-9761"},"institutions":[{"id":"https://openalex.org/I3020445194","display_name":"Universidad Nebrija","ror":"https://ror.org/03tzyrt94","country_code":"ES","type":"education","lineage":["https://openalex.org/I3020445194"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Luis Alberto Aranda","raw_affiliation_strings":["ARIES Research Center, Universidad Antonio de Nebrija, Madrid, Spain"],"raw_orcid":"https://orcid.org/0000-0003-4458-9761","affiliations":[{"raw_affiliation_string":"ARIES Research Center, Universidad Antonio de Nebrija, Madrid, Spain","institution_ids":["https://openalex.org/I3020445194"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074611037","display_name":"O. Ruano","orcid":"https://orcid.org/0000-0001-8275-1745"},"institutions":[{"id":"https://openalex.org/I3020445194","display_name":"Universidad Nebrija","ror":"https://ror.org/03tzyrt94","country_code":"ES","type":"education","lineage":["https://openalex.org/I3020445194"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Oscar Ruano","raw_affiliation_strings":["ARIES Research Center, Universidad Antonio de Nebrija, Madrid, Spain"],"raw_orcid":"https://orcid.org/0000-0001-8275-1745","affiliations":[{"raw_affiliation_string":"ARIES Research Center, Universidad Antonio de Nebrija, Madrid, Spain","institution_ids":["https://openalex.org/I3020445194"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088891897","display_name":"Francisco Garc\u00eda-Herrero","orcid":"https://orcid.org/0000-0001-6719-9681"},"institutions":[{"id":"https://openalex.org/I3020445194","display_name":"Universidad Nebrija","ror":"https://ror.org/03tzyrt94","country_code":"ES","type":"education","lineage":["https://openalex.org/I3020445194"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Francisco Garcia-Herrero","raw_affiliation_strings":["ARIES Research Center, Universidad Antonio de Nebrija, Madrid, Spain"],"raw_orcid":"https://orcid.org/0000-0001-6719-9681","affiliations":[{"raw_affiliation_string":"ARIES Research Center, Universidad Antonio de Nebrija, Madrid, Spain","institution_ids":["https://openalex.org/I3020445194"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5044495372","display_name":"Juan Antonio Maestro","orcid":"https://orcid.org/0000-0001-7133-9026"},"institutions":[{"id":"https://openalex.org/I121748325","display_name":"Universidad Complutense de Madrid","ror":"https://ror.org/02p0gd045","country_code":"ES","type":"education","lineage":["https://openalex.org/I121748325"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Juan Antonio Maestro","raw_affiliation_strings":["Department of Computer Architecture and Automatics, Computer Science Faculty, Complutense University of Madrid, Madrid, Spain"],"raw_orcid":"https://orcid.org/0000-0001-7133-9026","affiliations":[{"raw_affiliation_string":"Department of Computer Architecture and Automatics, Computer Science Faculty, Complutense University of Madrid, Madrid, Spain","institution_ids":["https://openalex.org/I121748325"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3934,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.59724174,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"69","issue":"3","first_page":"1577","last_page":"1581"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/emulation","display_name":"Emulation","score":0.8761705756187439},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.835829496383667},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.6938046813011169},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6667585372924805},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6503547430038452},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5573394894599915},{"id":"https://openalex.org/keywords/hardware-emulation","display_name":"Hardware emulation","score":0.49306365847587585},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.4853488504886627},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3509071469306946},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.06552067399024963},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.06426998972892761}],"concepts":[{"id":"https://openalex.org/C149810388","wikidata":"https://www.wikidata.org/wiki/Q5374873","display_name":"Emulation","level":2,"score":0.8761705756187439},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.835829496383667},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.6938046813011169},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6667585372924805},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6503547430038452},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5573394894599915},{"id":"https://openalex.org/C94115699","wikidata":"https://www.wikidata.org/wiki/Q5656406","display_name":"Hardware emulation","level":3,"score":0.49306365847587585},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.4853488504886627},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3509071469306946},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.06552067399024963},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.06426998972892761},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C50522688","wikidata":"https://www.wikidata.org/wiki/Q189833","display_name":"Economic growth","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsii.2021.3105558","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2021.3105558","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1598941862","https://openalex.org/W1979951430","https://openalex.org/W2029915748","https://openalex.org/W2094253444","https://openalex.org/W2164363068","https://openalex.org/W2475646144","https://openalex.org/W2964411820","https://openalex.org/W2971478958","https://openalex.org/W3023820769"],"related_works":["https://openalex.org/W2170071008","https://openalex.org/W2291587020","https://openalex.org/W2106791114","https://openalex.org/W2103996454","https://openalex.org/W3029775214","https://openalex.org/W2390650884","https://openalex.org/W2001552871","https://openalex.org/W2118560622","https://openalex.org/W2145233434","https://openalex.org/W2111105659"],"abstract_inverted_index":{"Fault":[0,31],"emulation":[1,32,69],"in":[2,70,73,111,181,191],"field-programmable":[3],"gate":[4],"arrays":[5],"(FPGAs)":[6],"is":[7,33,83],"a":[8,16,201],"popular":[9],"alternative":[10],"to":[11,19,27,49,80,86,146,188],"test":[12,47],"the":[13,44,51,58,61,74,77,87,92,96,116,124,137,140,143,157,163,171,177,182,192,195,204,210,214],"reliability":[14,88,172,196],"of":[15,53,60,67,76,95,119,136,156,162,194,203,213],"design":[17,45,62,147],"due":[18],"its":[20,54],"low":[21],"cost":[22],"and":[23,91],"high":[24],"availability":[25],"compared":[26],"traditional":[28],"radiation-based":[29],"approaches.":[30],"an":[34,120,133,189],"instrumentation":[35],"method":[36],"based":[37],"on":[38,43],"inducing":[39],"artificial":[40],"bit":[41],"flips":[42],"under":[46],"(DUT)":[48],"modify":[50],"content":[52],"memory":[55],"elements":[56],"or":[57],"structure":[59],"itself.":[63],"A":[64],"major":[65],"limitation":[66],"error":[68],"FPGAs":[71,113],"lies":[72],"determination":[75],"proper":[78],"bits":[79,118,149,168],"test,":[81],"which":[82],"directly":[84],"related":[85],"results":[89,173,197],"obtained":[90],"execution":[93],"times":[94],"fault":[97,205],"injection":[98,206],"campaign.":[99],"The":[100],"Automatic":[101],"Configuration":[102],"Memory":[103],"Error-injection":[104],"(ACME)":[105],"tool":[106,138],"helps":[107],"with":[108,153],"this":[109,128,160],"process":[110],"Xilinx":[112],"by":[114],"obtaining":[115],"essential":[117,148],"FPGA":[121,144],"region":[122,145],"where":[123,139],"DUT":[125],"is.":[126],"In":[127,159],"brief,":[129],"we":[130],"present":[131],"ACME-2,":[132],"improved":[134],"version":[135,212],"translation":[141],"from":[142],"has":[150],"been":[151],"modified":[152],"architectural":[154],"information":[155],"FPGA.":[158],"revision":[161],"tool,":[164],"redundant":[165],"input/output":[166],"routing":[167],"that":[169],"distort":[170],"are":[174],"minimized.":[175],"For":[176],"example":[178],"designs":[179],"used":[180],"experiments,":[183],"these":[184],"modifications":[185],"have":[186],"led":[187],"improvement":[190],"precision":[193],"as":[198,200],"well":[199],"reduction":[202],"campaign":[207],"runtime":[208],"over":[209],"previous":[211],"tool.":[215]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}