{"id":"https://openalex.org/W3204615530","doi":"https://doi.org/10.1109/tcsii.2021.3096987","title":"Open-Circuit Fault Diagnosis for MMC Based on Event-Triggered and Capacitor Current State Observation","display_name":"Open-Circuit Fault Diagnosis for MMC Based on Event-Triggered and Capacitor Current State Observation","publication_year":2021,"publication_date":"2021-07-13","ids":{"openalex":"https://openalex.org/W3204615530","doi":"https://doi.org/10.1109/tcsii.2021.3096987","mag":"3204615530"},"language":"en","primary_location":{"id":"doi:10.1109/tcsii.2021.3096987","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2021.3096987","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101945352","display_name":"Zehao Liu","orcid":"https://orcid.org/0000-0002-4994-0568"},"institutions":[{"id":"https://openalex.org/I9842412","display_name":"Nanjing University of Aeronautics and Astronautics","ror":"https://ror.org/01scyh794","country_code":"CN","type":"education","lineage":["https://openalex.org/I9842412"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zehao Liu","raw_affiliation_strings":["College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China","institution_ids":["https://openalex.org/I9842412"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100607506","display_name":"Lan Xiao","orcid":"https://orcid.org/0000-0002-5823-7241"},"institutions":[{"id":"https://openalex.org/I9842412","display_name":"Nanjing University of Aeronautics and Astronautics","ror":"https://ror.org/01scyh794","country_code":"CN","type":"education","lineage":["https://openalex.org/I9842412"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lan Xiao","raw_affiliation_strings":["College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China","institution_ids":["https://openalex.org/I9842412"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088217811","display_name":"Qin Wang","orcid":"https://orcid.org/0000-0001-6585-2755"},"institutions":[{"id":"https://openalex.org/I9842412","display_name":"Nanjing University of Aeronautics and Astronautics","ror":"https://ror.org/01scyh794","country_code":"CN","type":"education","lineage":["https://openalex.org/I9842412"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qin Wang","raw_affiliation_strings":["College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China","institution_ids":["https://openalex.org/I9842412"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073245337","display_name":"Jinbo Li","orcid":"https://orcid.org/0000-0002-6559-8213"},"institutions":[{"id":"https://openalex.org/I9842412","display_name":"Nanjing University of Aeronautics and Astronautics","ror":"https://ror.org/01scyh794","country_code":"CN","type":"education","lineage":["https://openalex.org/I9842412"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinbo Li","raw_affiliation_strings":["College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China","institution_ids":["https://openalex.org/I9842412"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5004731711","display_name":"Qunfang Wu","orcid":"https://orcid.org/0000-0002-6437-404X"},"institutions":[{"id":"https://openalex.org/I9842412","display_name":"Nanjing University of Aeronautics and Astronautics","ror":"https://ror.org/01scyh794","country_code":"CN","type":"education","lineage":["https://openalex.org/I9842412"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qunfang Wu","raw_affiliation_strings":["College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China","institution_ids":["https://openalex.org/I9842412"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5101945352"],"corresponding_institution_ids":["https://openalex.org/I9842412"],"apc_list":null,"apc_paid":null,"fwci":2.2263,"has_fulltext":false,"cited_by_count":27,"citation_normalized_percentile":{"value":0.88261165,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"69","issue":"2","first_page":"534","last_page":"538"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9833999872207642,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/insulated-gate-bipolar-transistor","display_name":"Insulated-gate bipolar transistor","score":0.918442964553833},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.7607669830322266},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.7294527888298035},{"id":"https://openalex.org/keywords/controller","display_name":"Controller (irrigation)","score":0.572503387928009},{"id":"https://openalex.org/keywords/short-circuit","display_name":"Short circuit","score":0.5102503299713135},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4760817587375641},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4546715021133423},{"id":"https://openalex.org/keywords/event","display_name":"Event (particle physics)","score":0.4324296712875366},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.42295077443122864},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.41165679693222046},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.39989885687828064},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3507809638977051},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.19985246658325195},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08324569463729858}],"concepts":[{"id":"https://openalex.org/C28285623","wikidata":"https://www.wikidata.org/wiki/Q176110","display_name":"Insulated-gate bipolar transistor","level":3,"score":0.918442964553833},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.7607669830322266},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.7294527888298035},{"id":"https://openalex.org/C203479927","wikidata":"https://www.wikidata.org/wiki/Q5165939","display_name":"Controller (irrigation)","level":2,"score":0.572503387928009},{"id":"https://openalex.org/C68583231","wikidata":"https://www.wikidata.org/wiki/Q206907","display_name":"Short circuit","level":3,"score":0.5102503299713135},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4760817587375641},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4546715021133423},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.4324296712875366},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.42295077443122864},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.41165679693222046},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.39989885687828064},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3507809638977051},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.19985246658325195},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08324569463729858},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C6557445","wikidata":"https://www.wikidata.org/wiki/Q173113","display_name":"Agronomy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsii.2021.3096987","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2021.3096987","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G6478631141","display_name":null,"funder_award_id":"61673210","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1915388693","https://openalex.org/W2007244578","https://openalex.org/W2042876774","https://openalex.org/W2044129925","https://openalex.org/W2061146253","https://openalex.org/W2129242370","https://openalex.org/W2174980551","https://openalex.org/W2284778013","https://openalex.org/W2343375316","https://openalex.org/W2553648428","https://openalex.org/W2592429078","https://openalex.org/W2790116484","https://openalex.org/W2800911105","https://openalex.org/W2903369950","https://openalex.org/W2906105668","https://openalex.org/W2915070752","https://openalex.org/W2964196009","https://openalex.org/W2973107558","https://openalex.org/W3030874192"],"related_works":["https://openalex.org/W2318746575","https://openalex.org/W3164416905","https://openalex.org/W2394855236","https://openalex.org/W2387542117","https://openalex.org/W2141322760","https://openalex.org/W2914116022","https://openalex.org/W4380551772","https://openalex.org/W2909285633","https://openalex.org/W2583210122","https://openalex.org/W2170886273"],"abstract_inverted_index":{"The":[0,85,125],"module":[1],"multilevel":[2],"converter":[3],"(MMC)":[4],"is":[5,60,102],"composed":[6],"of":[7,9,36,67,88,122,135,158],"dozens":[8],"the":[10,37,53,56,64,71,79,83,89,94,110,115,119,132,136,148,155],"insulated":[11],"gate":[12],"bipolar":[13],"transistors":[14],"(IGBT)":[15],"and":[16,29,104,108,138,153],"its":[17],"reliability":[18],"should":[19],"be":[20],"seriously":[21],"considered.":[22],"This":[23,100],"brief":[24],"presents":[25],"a":[26],"fault":[27,35,57,111,157],"diagnosis":[28,58],"localization":[30],"(FDI)":[31],"method":[32,128],"for":[33,82,106],"open-circuit":[34,98,156],"IGBT":[38,112,159],"in":[39],"an":[40,97],"MMC,":[41],"which":[42,75],"combines":[43],"event-based":[44],"capacitor":[45,48,65,90,123],"voltage":[46,66],"with":[47,118],"current":[49,86],"state":[50],"observation.":[51],"Under":[52],"event-triggered":[54],"mechanism,":[55],"program":[59],"activated":[61],"only":[62],"when":[63,93],"submodules":[68],"(SMs)":[69],"violated":[70],"designed":[72],"event-triggering":[73],"condition,":[74],"can":[76,129,151],"effectively":[77,130],"reduce":[78,131],"computational":[80],"burden":[81],"controller.":[84],"direction":[87],"will":[91],"change":[92],"submodule":[95],"has":[96],"gault.":[99],"characteristic":[101],"extracted":[103],"used":[105],"diagnose":[107,152],"locate":[109,154],"by":[113],"comparing":[114],"observed":[116],"value":[117,121],"theoretical":[120],"current.":[124],"proposed":[126,149],"FDL":[127,150],"computation":[133],"intensity":[134],"controller":[137],"do":[139],"not":[140],"require":[141],"extra":[142],"hardware.":[143],"Simulation":[144],"results":[145],"show":[146],"that":[147],"accurately":[160],"within":[161],"two":[162],"fundamental":[163],"periods.":[164]},"counts_by_year":[{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":13},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":3}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}