{"id":"https://openalex.org/W2997958323","doi":"https://doi.org/10.1109/tcsii.2019.2962824","title":"Non-Intrusive Online Distributed Pulse Shrinking-Based Interconnect Testing in 2.5D IC","display_name":"Non-Intrusive Online Distributed Pulse Shrinking-Based Interconnect Testing in 2.5D IC","publication_year":2019,"publication_date":"2019-12-31","ids":{"openalex":"https://openalex.org/W2997958323","doi":"https://doi.org/10.1109/tcsii.2019.2962824","mag":"2997958323"},"language":"en","primary_location":{"id":"doi:10.1109/tcsii.2019.2962824","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2019.2962824","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5085987622","display_name":"Tianming Ni","orcid":"https://orcid.org/0000-0001-6272-8660"},"institutions":[{"id":"https://openalex.org/I70908550","display_name":"Anhui Polytechnic University","ror":"https://ror.org/041sj0284","country_code":"CN","type":"education","lineage":["https://openalex.org/I70908550"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Tianming Ni","raw_affiliation_strings":["Key Laboratory of Advanced Perception and Intelligent Control of High-end Equipment, Ministry of Education, College of Electrical Engineering, Anhui Polytechnic University, Wuhu, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Advanced Perception and Intelligent Control of High-end Equipment, Ministry of Education, College of Electrical Engineering, Anhui Polytechnic University, Wuhu, China","institution_ids":["https://openalex.org/I70908550"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101887840","display_name":"Hao Chang","orcid":"https://orcid.org/0000-0002-6106-9613"},"institutions":[{"id":"https://openalex.org/I188935350","display_name":"Anhui University of Finance and Economics","ror":"https://ror.org/0152zzg30","country_code":"CN","type":"education","lineage":["https://openalex.org/I188935350"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hao Chang","raw_affiliation_strings":["Department of Computer Science and Technology, Anhui University of Finance and Economics, Bengbu, China"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Technology, Anhui University of Finance and Economics, Bengbu, China","institution_ids":["https://openalex.org/I188935350"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045664642","display_name":"Tai Song","orcid":"https://orcid.org/0000-0002-7082-4211"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tai Song","raw_affiliation_strings":["School of Electronic Science and Applied Physics, Hefei University of Technology, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic Science and Applied Physics, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031010282","display_name":"Qi Xu","orcid":"https://orcid.org/0000-0002-0375-9800"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qi Xu","raw_affiliation_strings":["School of Electronic Science and Applied Physics, Hefei University of Technology, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic Science and Applied Physics, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073810494","display_name":"Zhengfeng Huang","orcid":"https://orcid.org/0000-0001-8695-4478"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhengfeng Huang","raw_affiliation_strings":["School of Electronic Science and Applied Physics, Hefei University of Technology, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic Science and Applied Physics, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100736309","display_name":"Huaguo Liang","orcid":"https://orcid.org/0000-0002-0307-7236"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huaguo Liang","raw_affiliation_strings":["School of Electronic Science and Applied Physics, Hefei University of Technology, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic Science and Applied Physics, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072439444","display_name":"Aibin Yan","orcid":"https://orcid.org/0000-0003-0024-987X"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Aibin Yan","raw_affiliation_strings":["School of Computer Science and Technology, Anhui University, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of Computer Science and Technology, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084697545","display_name":"Xiaoqing Wen","orcid":"https://orcid.org/0000-0001-8305-604X"},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Xiaoqing Wen","raw_affiliation_strings":["Department of Creative Informatics, and the Graduate School of Computer Science and Systems Engineering, Kyushu Institute of Technology, Fukuoka, Japan"],"affiliations":[{"raw_affiliation_string":"Department of Creative Informatics, and the Graduate School of Computer Science and Systems Engineering, Kyushu Institute of Technology, Fukuoka, Japan","institution_ids":["https://openalex.org/I207014233"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5085987622"],"corresponding_institution_ids":["https://openalex.org/I70908550"],"apc_list":null,"apc_paid":null,"fwci":4.9463,"has_fulltext":false,"cited_by_count":51,"citation_normalized_percentile":{"value":0.95914854,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":95,"max":100},"biblio":{"volume":"67","issue":"11","first_page":"2657","last_page":"2661"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.7557325959205627},{"id":"https://openalex.org/keywords/interconnection","display_name":"Interconnection","score":0.7365527153015137},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6876099109649658},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5881701707839966},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5121469497680664},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.49537861347198486},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.47256794571876526},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.4169689118862152},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3751051723957062},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.35614877939224243},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3457375168800354},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2241380512714386},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.20027723908424377},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.11154404282569885}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.7557325959205627},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.7365527153015137},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6876099109649658},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5881701707839966},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5121469497680664},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.49537861347198486},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.47256794571876526},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.4169689118862152},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3751051723957062},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.35614877939224243},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3457375168800354},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2241380512714386},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.20027723908424377},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.11154404282569885},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsii.2019.2962824","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2019.2962824","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3909525237","display_name":null,"funder_award_id":"61974001","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4507329490","display_name":null,"funder_award_id":"61704001","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4570662887","display_name":null,"funder_award_id":"61904047","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6260214469","display_name":null,"funder_award_id":"61874156","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6403611338","display_name":null,"funder_award_id":"2018YQQ007","funder_id":"https://openalex.org/F4320328637","funder_display_name":"Anhui Polytechnic University"},{"id":"https://openalex.org/G8259609370","display_name":null,"funder_award_id":"1808085QF196","funder_id":"https://openalex.org/F4320334897","funder_display_name":"Natural Science Foundation of Anhui Province"},{"id":"https://openalex.org/G875980750","display_name":null,"funder_award_id":"61904001","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G98675533","display_name":null,"funder_award_id":"1908085QF272","funder_id":"https://openalex.org/F4320334897","funder_display_name":"Natural Science Foundation of Anhui Province"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320328637","display_name":"Anhui Polytechnic University","ror":"https://ror.org/041sj0284"},{"id":"https://openalex.org/F4320334897","display_name":"Natural Science Foundation of Anhui Province","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2029633428","https://openalex.org/W2159971659","https://openalex.org/W2171355521","https://openalex.org/W2463655288","https://openalex.org/W2773038018","https://openalex.org/W2808868355","https://openalex.org/W2914985492","https://openalex.org/W2979746556","https://openalex.org/W4238594667"],"related_works":["https://openalex.org/W3014521742","https://openalex.org/W4283025278","https://openalex.org/W2014709025","https://openalex.org/W61292821","https://openalex.org/W2155019192","https://openalex.org/W2082432309","https://openalex.org/W2617868873","https://openalex.org/W817174743","https://openalex.org/W2081032080","https://openalex.org/W2134733504"],"abstract_inverted_index":{"In":[0],"this":[1],"brief,":[2],"a":[3,24],"non-invasive":[4],"online":[5,55],"solution":[6],"for":[7,73],"2.5D":[8],"IC":[9],"based":[10,27],"on":[11,28,62],"distributed":[12],"pulse":[13],"shrinking":[14],"is":[15,33],"proposed":[16,34,82],"to":[17,37,97],"test":[18],"the":[19,40,46,49,57,81,99,102],"faults":[20,50],"of":[21,48,59],"interconnects.":[22,60],"Furthermore,":[23],"regression":[25],"model":[26],"artificial":[29],"neural":[30],"network":[31],"(ANN)":[32],"in":[35,51],"order":[36],"judge":[38],"whether":[39],"interconnects":[41],"are":[42,65],"faulty":[43],"and":[44,94,101],"quantify":[45],"degree":[47],"real":[52],"time":[53],"by":[54],"monitoring":[56],"delay":[58],"Experiments":[61],"defect":[63],"detection":[64],"presented":[66],"through":[67],"HSPICE":[68],"simulation":[69],"with":[70],"realistic":[71],"models":[72],"45nm":[74],"CMOS":[75],"technology.":[76],"The":[77],"results":[78],"show":[79],"that":[80],"method":[83],"has":[84],"features":[85],"including:":[86],"high":[87,92],"resolution,":[88],"low":[89],"area":[90],"overhead,":[91],"robustness,":[93],"be":[95],"able":[96],"predict":[98],"class":[100],"fault":[103],"size.":[104]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":33},{"year":2020,"cited_by_count":5}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}