{"id":"https://openalex.org/W2954184824","doi":"https://doi.org/10.1109/tcsii.2019.2926498","title":"Transition Detector-Based Radiation-Hardened Latch for Both Single- and Multiple-Node Upsets","display_name":"Transition Detector-Based Radiation-Hardened Latch for Both Single- and Multiple-Node Upsets","publication_year":2019,"publication_date":"2019-07-07","ids":{"openalex":"https://openalex.org/W2954184824","doi":"https://doi.org/10.1109/tcsii.2019.2926498","mag":"2954184824"},"language":"en","primary_location":{"id":"doi:10.1109/tcsii.2019.2926498","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2019.2926498","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008126664","display_name":"Saki Tajima","orcid":"https://orcid.org/0000-0003-2325-9763"},"institutions":[{"id":"https://openalex.org/I150744194","display_name":"Waseda University","ror":"https://ror.org/00ntfnx83","country_code":"JP","type":"education","lineage":["https://openalex.org/I150744194"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Saki Tajima","raw_affiliation_strings":["Department of Electronic and Physical Systems, Faculty of Fundamental Science and Engineering, Waseda University, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Department of Electronic and Physical Systems, Faculty of Fundamental Science and Engineering, Waseda University, Tokyo, Japan","institution_ids":["https://openalex.org/I150744194"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061982025","display_name":"Masao Yanagisawa","orcid":"https://orcid.org/0000-0002-5168-3214"},"institutions":[{"id":"https://openalex.org/I150744194","display_name":"Waseda University","ror":"https://ror.org/00ntfnx83","country_code":"JP","type":"education","lineage":["https://openalex.org/I150744194"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masao Yanagisawa","raw_affiliation_strings":["Department of Electronic and Physical Systems, Faculty of Fundamental Science and Engineering, Waseda University, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Department of Electronic and Physical Systems, Faculty of Fundamental Science and Engineering, Waseda University, Tokyo, Japan","institution_ids":["https://openalex.org/I150744194"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5056061175","display_name":"Youhua Shi","orcid":"https://orcid.org/0000-0002-1473-9776"},"institutions":[{"id":"https://openalex.org/I150744194","display_name":"Waseda University","ror":"https://ror.org/00ntfnx83","country_code":"JP","type":"education","lineage":["https://openalex.org/I150744194"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Youhua Shi","raw_affiliation_strings":["Department of Electronic and Physical Systems, Faculty of Fundamental Science and Engineering, Waseda University, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Department of Electronic and Physical Systems, Faculty of Fundamental Science and Engineering, Waseda University, Tokyo, Japan","institution_ids":["https://openalex.org/I150744194"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5008126664"],"corresponding_institution_ids":["https://openalex.org/I150744194"],"apc_list":null,"apc_paid":null,"fwci":1.1923,"has_fulltext":false,"cited_by_count":26,"citation_normalized_percentile":{"value":0.79391759,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"67","issue":"6","first_page":"1114","last_page":"1118"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.6802794337272644},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.6425586342811584},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.6389712691307068},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6299006938934326},{"id":"https://openalex.org/keywords/upset","display_name":"Upset","score":0.5921238660812378},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.533993661403656},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.5138828754425049},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.4484269917011261},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.4460351765155792},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.411256343126297},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3638996481895447},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.32106512784957886},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3062824308872223},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2149573266506195},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20002883672714233},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.14390075206756592},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.11515277624130249},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.0940801203250885}],"concepts":[{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.6802794337272644},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.6425586342811584},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.6389712691307068},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6299006938934326},{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.5921238660812378},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.533993661403656},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.5138828754425049},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.4484269917011261},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.4460351765155792},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.411256343126297},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3638996481895447},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.32106512784957886},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3062824308872223},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2149573266506195},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20002883672714233},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.14390075206756592},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.11515277624130249},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.0940801203250885},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsii.2019.2926498","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2019.2926498","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.49000000953674316}],"awards":[],"funders":[{"id":"https://openalex.org/F4320322638","display_name":"Waseda University","ror":"https://ror.org/00ntfnx83"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1601909182","https://openalex.org/W1986059861","https://openalex.org/W2050431855","https://openalex.org/W2056721615","https://openalex.org/W2103551037","https://openalex.org/W2105407012","https://openalex.org/W2178304595","https://openalex.org/W2735184371","https://openalex.org/W2769731910","https://openalex.org/W2809840675","https://openalex.org/W2904594537","https://openalex.org/W6675612204"],"related_works":["https://openalex.org/W2102538861","https://openalex.org/W1523508240","https://openalex.org/W2622269177","https://openalex.org/W2086616086","https://openalex.org/W2978528242","https://openalex.org/W2165400042","https://openalex.org/W2160088500","https://openalex.org/W3208260600","https://openalex.org/W2012451149","https://openalex.org/W3097930358"],"abstract_inverted_index":{"This":[0],"brief":[1],"presents":[2],"an":[3,14,20],"output":[4,56],"transition":[5,22],"detector-based":[6],"radiation-hardened":[7],"latch":[8,55],"(TDRHL)":[9],"for":[10,24,47],"reliability":[11],"improvement.":[12],"With":[13],"error":[15,72],"recovery":[16,49],"assistant":[17],"logic":[18],"and":[19,29,41,75],"in-situ":[21],"detector,":[23],"any":[25],"radiation":[26],"induced":[27],"single-":[28],"double-node":[30,66],"upsets,":[31],"the":[32,54],"proposed":[33],"TDRHL":[34,63],"can":[35,81],"1)":[36],"provide":[37],"full":[38],"self-recovery":[39],"capability":[40],"2)":[42],"generate":[43],"a":[44],"warning":[45],"signal":[46],"architecture-level":[48],"when":[50],"soft":[51],"errors":[52],"cause":[53],"flipped.":[57],"The":[58],"evaluation":[59],"results":[60],"show":[61],"that":[62],"outperforms":[64],"state-of-the-art":[65],"upset":[67],"tolerant":[68],"designs":[69],"with":[70],"addition":[71],"detection":[73],"capability,":[74],"up":[76],"to":[77],"5.0X":[78],"power-delay-product":[79],"improvement":[80],"be":[82],"achieved.":[83]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":9},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}