{"id":"https://openalex.org/W2955735210","doi":"https://doi.org/10.1109/tcsii.2019.2924983","title":"Bandwidth and Slew Rate Enhanced OTA With Sustainable Dynamic Bias","display_name":"Bandwidth and Slew Rate Enhanced OTA With Sustainable Dynamic Bias","publication_year":2019,"publication_date":"2019-06-26","ids":{"openalex":"https://openalex.org/W2955735210","doi":"https://doi.org/10.1109/tcsii.2019.2924983","mag":"2955735210"},"language":"en","primary_location":{"id":"doi:10.1109/tcsii.2019.2924983","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2019.2924983","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5073222609","display_name":"Cheuk Ho Hung","orcid":null},"institutions":[{"id":"https://openalex.org/I177725633","display_name":"Chinese University of Hong Kong","ror":"https://ror.org/00t33hh48","country_code":"CN","type":"education","lineage":["https://openalex.org/I177725633"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Cheuk Ho Hung","raw_affiliation_strings":["Department of Electronic Engineering, Chinese University of Hong Kong, Hong Kong"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Chinese University of Hong Kong, Hong Kong","institution_ids":["https://openalex.org/I177725633"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054848259","display_name":"Yanqi Zheng","orcid":"https://orcid.org/0000-0001-9501-2466"},"institutions":[{"id":"https://openalex.org/I90610280","display_name":"South China University of Technology","ror":"https://ror.org/0530pts50","country_code":"CN","type":"education","lineage":["https://openalex.org/I90610280"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yanqi Zheng","raw_affiliation_strings":["School of Electronic and Information Engineering, South China University of Technology, Guangzhou, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, South China University of Technology, Guangzhou, China","institution_ids":["https://openalex.org/I90610280"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054976374","display_name":"Jianping Guo","orcid":"https://orcid.org/0000-0002-0211-8606"},"institutions":[{"id":"https://openalex.org/I157773358","display_name":"Sun Yat-sen University","ror":"https://ror.org/0064kty71","country_code":"CN","type":"education","lineage":["https://openalex.org/I157773358"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianping Guo","raw_affiliation_strings":["School of Electronics and Information Technology, Sun Yat-sen University, Guangzhou, China"],"affiliations":[{"raw_affiliation_string":"School of Electronics and Information Technology, Sun Yat-sen University, Guangzhou, China","institution_ids":["https://openalex.org/I157773358"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5010016181","display_name":"Ka Nang Leung","orcid":"https://orcid.org/0000-0002-9921-3211"},"institutions":[{"id":"https://openalex.org/I177725633","display_name":"Chinese University of Hong Kong","ror":"https://ror.org/00t33hh48","country_code":"CN","type":"education","lineage":["https://openalex.org/I177725633"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ka Nang Leung","raw_affiliation_strings":["Department of Electronic Engineering, Chinese University of Hong Kong, Hong Kong"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Chinese University of Hong Kong, Hong Kong","institution_ids":["https://openalex.org/I177725633"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5073222609"],"corresponding_institution_ids":["https://openalex.org/I177725633"],"apc_list":null,"apc_paid":null,"fwci":1.0759,"has_fulltext":false,"cited_by_count":25,"citation_normalized_percentile":{"value":0.7512887,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"67","issue":"4","first_page":"635","last_page":"639"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/slew-rate","display_name":"Slew rate","score":0.900973916053772},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.6880295276641846},{"id":"https://openalex.org/keywords/settling-time","display_name":"Settling time","score":0.6596852540969849},{"id":"https://openalex.org/keywords/operational-transconductance-amplifier","display_name":"Operational transconductance amplifier","score":0.6082336902618408},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.5821783542633057},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5132303237915039},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.4629306495189667},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4454463720321655},{"id":"https://openalex.org/keywords/overshoot","display_name":"Overshoot (microwave communication)","score":0.4348580539226532},{"id":"https://openalex.org/keywords/transconductance","display_name":"Transconductance","score":0.42448002099990845},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.42417484521865845},{"id":"https://openalex.org/keywords/operational-amplifier","display_name":"Operational amplifier","score":0.35682588815689087},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3552365303039551},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3498745262622833},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.31147414445877075},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27892494201660156},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.22090014815330505}],"concepts":[{"id":"https://openalex.org/C82517063","wikidata":"https://www.wikidata.org/wiki/Q1591315","display_name":"Slew rate","level":3,"score":0.900973916053772},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.6880295276641846},{"id":"https://openalex.org/C14781684","wikidata":"https://www.wikidata.org/wiki/Q3983320","display_name":"Settling time","level":3,"score":0.6596852540969849},{"id":"https://openalex.org/C58117264","wikidata":"https://www.wikidata.org/wiki/Q1239595","display_name":"Operational transconductance amplifier","level":5,"score":0.6082336902618408},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.5821783542633057},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5132303237915039},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.4629306495189667},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4454463720321655},{"id":"https://openalex.org/C2780323453","wikidata":"https://www.wikidata.org/wiki/Q7113957","display_name":"Overshoot (microwave communication)","level":2,"score":0.4348580539226532},{"id":"https://openalex.org/C2779283907","wikidata":"https://www.wikidata.org/wiki/Q1632964","display_name":"Transconductance","level":4,"score":0.42448002099990845},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.42417484521865845},{"id":"https://openalex.org/C145366948","wikidata":"https://www.wikidata.org/wiki/Q178947","display_name":"Operational amplifier","level":4,"score":0.35682588815689087},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3552365303039551},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3498745262622833},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.31147414445877075},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27892494201660156},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.22090014815330505},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.0},{"id":"https://openalex.org/C160030872","wikidata":"https://www.wikidata.org/wiki/Q2142864","display_name":"Step response","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsii.2019.2924983","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2019.2924983","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1566916904","https://openalex.org/W1638544099","https://openalex.org/W1673818769","https://openalex.org/W2078318212","https://openalex.org/W2095140427","https://openalex.org/W2113851294","https://openalex.org/W2163227093","https://openalex.org/W2164530563","https://openalex.org/W2885358920"],"related_works":["https://openalex.org/W4377820486","https://openalex.org/W2132353065","https://openalex.org/W4377825843","https://openalex.org/W2889951799","https://openalex.org/W2626571124","https://openalex.org/W2783539788","https://openalex.org/W2381304112","https://openalex.org/W2962749641","https://openalex.org/W2134780641","https://openalex.org/W4235119538"],"abstract_inverted_index":{"A":[0],"bandwidth":[1,53],"and":[2,18,43,55,67,78,129,154],"slew":[3],"rate":[4],"(SR)":[5],"enhanced":[6],"operational":[7],"transconductance":[8],"amplifier":[9,42],"(OTA)":[10],"with":[11,70,82,107,123,137,140],"proposed":[12,29,89,135],"sustainable":[13],"dynamic":[14],"bias,":[15],"transient":[16],"detector":[17],"passive":[19],"on-chip":[20],"high-pass":[21],"filter":[22],"is":[23,31,91,97],"presented":[24],"in":[25,113,147],"this":[26,148],"brief.":[27],"The":[28],"design":[30,90,136,139],"able":[32,98],"to":[33,37,49,61,99,117,150],"detect":[34],"large-signal":[35],"applied":[36],"the":[38,41,58,88,134],"input":[39],"of":[40,75,133],"dynamically":[44],"adjust":[45],"its":[46,101,114,152],"bias":[47,79],"current":[48],"enhance":[50],"both":[51],"unity-gain":[52],"(UGB)":[54],"SR":[56,102],"at":[57],"same":[59],"time":[60,121],"achieve":[62],"fast-settling":[63],"behavior":[64],"without":[65],"overshoot":[66],"undershoot,":[68],"along":[69],"high":[71],"immunity":[72],"against":[73],"variations":[74],"supply":[76],"voltage":[77],"current.":[80],"Fabricated":[81],"a":[83,124,141],"commercial":[84],"130-nm":[85],"CMOS":[86],"technology,":[87],"verified":[92],"by":[93,103],"measurements":[94],"that":[95],"it":[96],"increase":[100],"over":[104],"15":[105],"times,":[106],"more":[108],"than":[109],"7.5":[110],"times":[111],"reduction":[112],"power":[115],"consumption":[116],"attain":[118],"fast":[119],"settling":[120],"compared":[122],"conventional":[125],"design.":[126],"Design":[127],"considerations":[128],"an":[130],"architectural":[131],"comparison":[132],"another":[138],"different":[142],"approach":[143],"are":[144],"also":[145],"included":[146],"brief":[149],"verify":[151],"performance":[153],"viability.":[155]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}