{"id":"https://openalex.org/W2942976352","doi":"https://doi.org/10.1109/tcsii.2019.2914588","title":"A CMOS-Imager-Pixel-Based Temperature Sensor for Dark Current Compensation","display_name":"A CMOS-Imager-Pixel-Based Temperature Sensor for Dark Current Compensation","publication_year":2019,"publication_date":"2019-05-02","ids":{"openalex":"https://openalex.org/W2942976352","doi":"https://doi.org/10.1109/tcsii.2019.2914588","mag":"2942976352"},"language":"en","primary_location":{"id":"doi:10.1109/tcsii.2019.2914588","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2019.2914588","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://resolver.tudelft.nl/uuid:92e5089f-2e23-4103-aa5d-09b7beb2cb80","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060440099","display_name":"Shuang Xie","orcid":"https://orcid.org/0000-0003-0360-8428"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Shuang Xie","raw_affiliation_strings":["EI Lab, TU Delft, Delft, The Netherlands"],"affiliations":[{"raw_affiliation_string":"EI Lab, TU Delft, Delft, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048409690","display_name":"A. Abarca Prouza","orcid":null},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Accel Abarca Prouza","raw_affiliation_strings":["EI Lab, TU Delft, Delft, The Netherlands"],"affiliations":[{"raw_affiliation_string":"EI Lab, TU Delft, Delft, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024949637","display_name":"Albert Theuwissen","orcid":"https://orcid.org/0000-0002-2176-6828"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Albert Theuwissen","raw_affiliation_strings":["EI Lab, TU Delft, Delft, The Netherlands","Harvest Imaging, Bree, Belgium"],"affiliations":[{"raw_affiliation_string":"EI Lab, TU Delft, Delft, The Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Harvest Imaging, Bree, Belgium","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5060440099"],"corresponding_institution_ids":["https://openalex.org/I98358874"],"apc_list":null,"apc_paid":null,"fwci":1.1923,"has_fulltext":true,"cited_by_count":19,"citation_normalized_percentile":{"value":0.79156835,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"67","issue":"2","first_page":"255","last_page":"259"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9857000112533569,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dark-current","display_name":"Dark current","score":0.735600471496582},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7189716100692749},{"id":"https://openalex.org/keywords/subthreshold-conduction","display_name":"Subthreshold conduction","score":0.6902390718460083},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.6691421270370483},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.5941778421401978},{"id":"https://openalex.org/keywords/photodiode","display_name":"Photodiode","score":0.5823924541473389},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5176520943641663},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.47832751274108887},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.47756606340408325},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.4717344045639038},{"id":"https://openalex.org/keywords/cmos-sensor","display_name":"CMOS sensor","score":0.4459206461906433},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.44134944677352905},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.41511070728302},{"id":"https://openalex.org/keywords/atmospheric-temperature-range","display_name":"Atmospheric temperature range","score":0.4138072431087494},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.37658506631851196},{"id":"https://openalex.org/keywords/photodetector","display_name":"Photodetector","score":0.31932657957077026},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.27000945806503296},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.2534973621368408},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17703911662101746},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.06938529014587402}],"concepts":[{"id":"https://openalex.org/C180651308","wikidata":"https://www.wikidata.org/wiki/Q1265973","display_name":"Dark current","level":3,"score":0.735600471496582},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7189716100692749},{"id":"https://openalex.org/C156465305","wikidata":"https://www.wikidata.org/wiki/Q1658601","display_name":"Subthreshold conduction","level":4,"score":0.6902390718460083},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.6691421270370483},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.5941778421401978},{"id":"https://openalex.org/C751236","wikidata":"https://www.wikidata.org/wiki/Q175943","display_name":"Photodiode","level":2,"score":0.5823924541473389},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5176520943641663},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.47832751274108887},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.47756606340408325},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4717344045639038},{"id":"https://openalex.org/C155512908","wikidata":"https://www.wikidata.org/wiki/Q210745","display_name":"CMOS sensor","level":3,"score":0.4459206461906433},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.44134944677352905},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.41511070728302},{"id":"https://openalex.org/C39353612","wikidata":"https://www.wikidata.org/wiki/Q5283759","display_name":"Atmospheric temperature range","level":2,"score":0.4138072431087494},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.37658506631851196},{"id":"https://openalex.org/C23125352","wikidata":"https://www.wikidata.org/wiki/Q210765","display_name":"Photodetector","level":2,"score":0.31932657957077026},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.27000945806503296},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2534973621368408},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17703911662101746},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.06938529014587402},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tcsii.2019.2914588","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2019.2914588","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},{"id":"pmh:tud:oai:tudelft.nl:uuid:92e5089f-2e23-4103-aa5d-09b7beb2cb80","is_oa":true,"landing_page_url":"http://resolver.tudelft.nl/uuid:92e5089f-2e23-4103-aa5d-09b7beb2cb80","pdf_url":"http://resolver.tudelft.nl/uuid:92e5089f-2e23-4103-aa5d-09b7beb2cb80","source":{"id":"https://openalex.org/S4306401843","display_name":"Data Archiving and Networked Services (DANS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1322597698","host_organization_name":"Royal Netherlands Academy of Arts and Sciences","host_organization_lineage":["https://openalex.org/I1322597698"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Circuits and Systems Part 2: Express Briefs, 67(2)","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"pmh:tud:oai:tudelft.nl:uuid:92e5089f-2e23-4103-aa5d-09b7beb2cb80","is_oa":true,"landing_page_url":"http://resolver.tudelft.nl/uuid:92e5089f-2e23-4103-aa5d-09b7beb2cb80","pdf_url":"http://resolver.tudelft.nl/uuid:92e5089f-2e23-4103-aa5d-09b7beb2cb80","source":{"id":"https://openalex.org/S4306401843","display_name":"Data Archiving and Networked Services (DANS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1322597698","host_organization_name":"Royal Netherlands Academy of Arts and Sciences","host_organization_lineage":["https://openalex.org/I1322597698"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Circuits and Systems Part 2: Express Briefs, 67(2)","raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[{"score":0.6700000166893005,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":false},"content_urls":{"pdf":"https://content.openalex.org/works/W2942976352.pdf"},"referenced_works_count":14,"referenced_works":["https://openalex.org/W1002676087","https://openalex.org/W1511246636","https://openalex.org/W1639598785","https://openalex.org/W2014689570","https://openalex.org/W2060159464","https://openalex.org/W2274165571","https://openalex.org/W2344791441","https://openalex.org/W2344834436","https://openalex.org/W2781559105","https://openalex.org/W2794038749","https://openalex.org/W2809857781","https://openalex.org/W2890765225","https://openalex.org/W2895608533","https://openalex.org/W6977421811"],"related_works":["https://openalex.org/W4385733096","https://openalex.org/W2160828022","https://openalex.org/W2139639880","https://openalex.org/W7077903","https://openalex.org/W3137255043","https://openalex.org/W2136888551","https://openalex.org/W1966415111","https://openalex.org/W2094128133","https://openalex.org/W2611369832","https://openalex.org/W2312137243"],"abstract_inverted_index":{"This":[0],"brief":[1],"proposes":[2],"employing":[3],"each":[4],"of":[5,46,105,114],"the":[6,28,43,66],"classical":[7],"4":[8,92],"transistor":[9],"(4T)":[10],"pinned":[11],"photodiode":[12],"(PPD)":[13],"CMOS":[14],"image":[15],"sensor":[16],"(CIS)":[17],"pixels,":[18],"for":[19,26,144],"both":[20],"imaging":[21],"and":[22,32,80,129,148,152],"temperature":[23,39,96],"measurement,":[24],"intended":[25],"compensating":[27],"CISs'":[29],"dark":[30,33,146],"current,":[31],"signal":[34],"non-uniformity":[35],"(DSNU).":[36],"The":[37],"proposed":[38],"sensors":[40,90],"rely":[41],"on":[42,91],"thermal":[44,73],"behavior":[45],"MOSFETs":[47],"working":[48],"in":[49],"subthreshold":[50],"region,":[51],"when":[52,117],"biased":[53],"with":[54],"ratiometric":[55],"currents":[56],"sequentially.":[57],"Without":[58],"incurring":[59],"any":[60],"additional":[61],"hardware":[62],"or":[63],"penalty":[64],"to":[65,71,101],"CIS,":[67],"they":[68,140],"are":[69],"measured":[70],"have":[72],"curvature":[74],"errors":[75],"less":[76],"than":[77],"\u00b10.3":[78],"\u00b0C":[79,100],"3":[81],"\u03c3":[82],"process":[83],"variations":[84],"within":[85],"\u00b11.3":[86],"\u00b0C,":[87],"from":[88,98],"108":[89],"chips,":[93],"over":[94],"a":[95,111],"range":[97],"-20":[99],"80":[102],"\u00b0C.":[103],"Each":[104],"them":[106],"consumes":[107],"576":[108],"nJ/conversion":[109],"at":[110],"conversion":[112],"rate":[113],"62":[115],"samples/s,":[116],"quantized":[118],"by":[119,150],"1":[120],"<sup":[121],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[122],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">st</sup>":[123],"-order":[124],"14":[125],"bit":[126],"delta-sigma":[127],"ADCs":[128],"fabricated":[130],"using":[131],"0.18":[132],"\u03bcm":[133],"CIS":[134],"technology.":[135],"Experimental":[136],"results":[137],"show":[138],"that":[139],"facilitate":[141],"digital":[142],"compensation":[143],"average":[145],"current":[147],"DSNU":[149],"78%":[151],"20%,":[153],"respectively.":[154]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}