{"id":"https://openalex.org/W2921869064","doi":"https://doi.org/10.1109/tcsii.2019.2905639","title":"A Novel Approach to Overcome the Limitations of Reliability Centered Maintenance Implementation on the Smart Grid Distance Protection System","display_name":"A Novel Approach to Overcome the Limitations of Reliability Centered Maintenance Implementation on the Smart Grid Distance Protection System","publication_year":2019,"publication_date":"2019-03-18","ids":{"openalex":"https://openalex.org/W2921869064","doi":"https://doi.org/10.1109/tcsii.2019.2905639","mag":"2921869064"},"language":"en","primary_location":{"id":"doi:10.1109/tcsii.2019.2905639","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2019.2905639","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5015035499","display_name":"Mehdi Rafiei","orcid":"https://orcid.org/0000-0002-3708-6173"},"institutions":[{"id":"https://openalex.org/I204490172","display_name":"Shiraz University of Technology","ror":"https://ror.org/04bxa3v83","country_code":"IR","type":"education","lineage":["https://openalex.org/I204490172"]}],"countries":["IR"],"is_corresponding":true,"raw_author_name":"Mehdi Rafiei","raw_affiliation_strings":["Department of Electrical and Electronics Engineering, Shiraz University of Technology, Shiraz, Iran"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronics Engineering, Shiraz University of Technology, Shiraz, Iran","institution_ids":["https://openalex.org/I204490172"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5106789160","display_name":"Mohammad Hassan Khooban","orcid":"https://orcid.org/0000-0003-0223-4081"},"institutions":[{"id":"https://openalex.org/I204337017","display_name":"Aarhus University","ror":"https://ror.org/01aj84f44","country_code":"DK","type":"education","lineage":["https://openalex.org/I204337017"]}],"countries":["DK"],"is_corresponding":false,"raw_author_name":"Mohammad-Hassan Khooban","raw_affiliation_strings":["Department of Engineering, Aarhus University, Aarhus, Denmark"],"affiliations":[{"raw_affiliation_string":"Department of Engineering, Aarhus University, Aarhus, Denmark","institution_ids":["https://openalex.org/I204337017"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002209845","display_name":"Mosayeb Afshari Igder","orcid":null},"institutions":[{"id":"https://openalex.org/I204490172","display_name":"Shiraz University of Technology","ror":"https://ror.org/04bxa3v83","country_code":"IR","type":"education","lineage":["https://openalex.org/I204490172"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Mosayeb Afshari Igder","raw_affiliation_strings":["Department of Electrical and Electronics Engineering, Shiraz University of Technology, Shiraz, Iran"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronics Engineering, Shiraz University of Technology, Shiraz, Iran","institution_ids":["https://openalex.org/I204490172"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063319463","display_name":"Jalil Boudjadar","orcid":"https://orcid.org/0000-0003-1442-4907"},"institutions":[{"id":"https://openalex.org/I204337017","display_name":"Aarhus University","ror":"https://ror.org/01aj84f44","country_code":"DK","type":"education","lineage":["https://openalex.org/I204337017"]}],"countries":["DK"],"is_corresponding":false,"raw_author_name":"Jalil Boudjadar","raw_affiliation_strings":["Department of Engineering, Aarhus University, Aarhus, Denmark"],"affiliations":[{"raw_affiliation_string":"Department of Engineering, Aarhus University, Aarhus, Denmark","institution_ids":["https://openalex.org/I204337017"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5015035499"],"corresponding_institution_ids":["https://openalex.org/I204490172"],"apc_list":null,"apc_paid":null,"fwci":3.2585,"has_fulltext":false,"cited_by_count":22,"citation_normalized_percentile":{"value":0.90898221,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"67","issue":"2","first_page":"320","last_page":"324"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10917","display_name":"Smart Grid Security and Resilience","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9944000244140625,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7679536938667297},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.764697253704071},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6386539340019226},{"id":"https://openalex.org/keywords/smart-grid","display_name":"Smart grid","score":0.5642958879470825},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5422881245613098},{"id":"https://openalex.org/keywords/grid","display_name":"Grid","score":0.5365768671035767},{"id":"https://openalex.org/keywords/function","display_name":"Function (biology)","score":0.4808662533760071},{"id":"https://openalex.org/keywords/plan","display_name":"Plan (archaeology)","score":0.48080649971961975},{"id":"https://openalex.org/keywords/markov-process","display_name":"Markov process","score":0.43533483147621155},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.32442161440849304},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23995062708854675}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7679536938667297},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.764697253704071},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6386539340019226},{"id":"https://openalex.org/C10558101","wikidata":"https://www.wikidata.org/wiki/Q689855","display_name":"Smart grid","level":2,"score":0.5642958879470825},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5422881245613098},{"id":"https://openalex.org/C187691185","wikidata":"https://www.wikidata.org/wiki/Q2020720","display_name":"Grid","level":2,"score":0.5365768671035767},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.4808662533760071},{"id":"https://openalex.org/C2776505523","wikidata":"https://www.wikidata.org/wiki/Q4785468","display_name":"Plan (archaeology)","level":2,"score":0.48080649971961975},{"id":"https://openalex.org/C159886148","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov process","level":2,"score":0.43533483147621155},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.32442161440849304},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23995062708854675},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C95457728","wikidata":"https://www.wikidata.org/wiki/Q309","display_name":"History","level":0,"score":0.0},{"id":"https://openalex.org/C78458016","wikidata":"https://www.wikidata.org/wiki/Q840400","display_name":"Evolutionary biology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C166957645","wikidata":"https://www.wikidata.org/wiki/Q23498","display_name":"Archaeology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tcsii.2019.2905639","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2019.2905639","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},{"id":"pmh:oai:pure.atira.dk:publications/a0fbe2cb-0071-482d-85fa-ec7379dccdfb","is_oa":false,"landing_page_url":"https://pure.au.dk/portal/en/publications/a0fbe2cb-0071-482d-85fa-ec7379dccdfb","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Rafiei Foroushani, M, Khooban, M H, Afshari-Igder, M & Boudjadar, J 2020, 'A Novel Approach to Overcome the Limitations of Reliability Centered Maintenance Implementation on the Smart Grid Distance Protection System', IEEE Transactions on Circuits and Systems II: Express Briefs, vol. 67, no. 2, 8668570, pp. 320-324. https://doi.org/10.1109/TCSII.2019.2905639","raw_type":"info:eu-repo/semantics/publishedVersion"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W2026394348","https://openalex.org/W2037325790","https://openalex.org/W2084704513","https://openalex.org/W2315140361","https://openalex.org/W2549846102","https://openalex.org/W2564471142","https://openalex.org/W2736211604","https://openalex.org/W2765551348","https://openalex.org/W2765682349","https://openalex.org/W2769145693","https://openalex.org/W2779726817","https://openalex.org/W2803557782","https://openalex.org/W2898478397","https://openalex.org/W2907748186","https://openalex.org/W2911795220"],"related_works":["https://openalex.org/W2751256511","https://openalex.org/W1597785538","https://openalex.org/W2382521298","https://openalex.org/W2491804929","https://openalex.org/W2365075862","https://openalex.org/W2072180474","https://openalex.org/W2317225295","https://openalex.org/W2484643928","https://openalex.org/W1960052459","https://openalex.org/W2005920118"],"abstract_inverted_index":{"This":[0],"brief":[1],"proposes":[2],"a":[3,13,18,106,131],"novel":[4],"approach":[5,41,90],"to":[6,43,78,94,117],"apply":[7],"reliability":[8,46,81,110],"centered":[9],"maintenance":[10,86],"(RCM)":[11],"on":[12,28,67],"distance":[14,100],"protection":[15,38,48,101],"system":[16,65],"in":[17,105,115],"smart":[19,98],"grid.":[20],"In":[21],"the":[22,31,36,45,52,61,80,84,119,125],"proposed":[23,89],"approach,":[24],"instead":[25],"of":[26,47,54,63,97,109],"focusing":[27],"individual":[29],"equipment,":[30],"RCM":[32],"is":[33,127],"implemented":[34],"for":[35],"whole":[37],"system.":[39],"The":[40,88],"helps":[42],"calculate":[44,79],"systems":[49],"by":[50],"overcoming":[51],"limitation":[53],"their":[55],"hidden":[56],"function":[57],"and":[58,71,82,111,122,135],"also":[59],"considering":[60],"effect":[62],"all":[64],"equipment":[66,138],"reliability.":[68],"Markov":[69],"process":[70],"improved":[72],"Jaya":[73],"algorithm":[74],"(IJA)":[75],"are":[76],"used":[77],"find":[83],"optimal":[85],"plan.":[87],"has":[91],"been":[92],"applied":[93],"real":[95],"data":[96],"grid":[99],"systems,":[102],"which":[103],"results":[104],"higher":[107],"level":[108],"less":[112],"cost.":[113],"Furthermore,":[114],"order":[116],"validate":[118],"suggested":[120],"technique":[121],"its":[123],"efficiency,":[124],"simulation":[126],"carried":[128],"out":[129],"using":[130],"real-time":[132],"digital":[133],"simulators":[134],"hardware-in-the-loop":[136],"testing":[137],"known":[139],"as":[140],"opal-RT":[141],"technology.":[142]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":6}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}