{"id":"https://openalex.org/W2808414731","doi":"https://doi.org/10.1109/tcsii.2018.2846808","title":"A 0.6-V Minimum-Supply, 23.5 ppm/\u00b0C Subthreshold CMOS Voltage Reference With 0.45% Variation Coefficient","display_name":"A 0.6-V Minimum-Supply, 23.5 ppm/\u00b0C Subthreshold CMOS Voltage Reference With 0.45% Variation Coefficient","publication_year":2018,"publication_date":"2018-06-13","ids":{"openalex":"https://openalex.org/W2808414731","doi":"https://doi.org/10.1109/tcsii.2018.2846808","mag":"2808414731"},"language":"en","primary_location":{"id":"doi:10.1109/tcsii.2018.2846808","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2018.2846808","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102951214","display_name":"C.I. Huang","orcid":"https://orcid.org/0000-0002-9274-3922"},"institutions":[{"id":"https://openalex.org/I3045169105","display_name":"Southern University of Science and Technology","ror":"https://ror.org/049tv2d57","country_code":"CN","type":"education","lineage":["https://openalex.org/I3045169105"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Chenyu Huang","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Southern University of Science and Technology, Shenzhen, China"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Southern University of Science and Technology, Shenzhen, China","institution_ids":["https://openalex.org/I3045169105"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029241233","display_name":"Chenchang Zhan","orcid":"https://orcid.org/0000-0002-4878-4655"},"institutions":[{"id":"https://openalex.org/I3045169105","display_name":"Southern University of Science and Technology","ror":"https://ror.org/049tv2d57","country_code":"CN","type":"education","lineage":["https://openalex.org/I3045169105"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chenchang Zhan","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Southern University of Science and Technology, Shenzhen, China"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Southern University of Science and Technology, Shenzhen, China","institution_ids":["https://openalex.org/I3045169105"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091743513","display_name":"Linjun He","orcid":"https://orcid.org/0000-0002-4255-2538"},"institutions":[{"id":"https://openalex.org/I3045169105","display_name":"Southern University of Science and Technology","ror":"https://ror.org/049tv2d57","country_code":"CN","type":"education","lineage":["https://openalex.org/I3045169105"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Linjun He","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Southern University of Science and Technology, Shenzhen, China"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Southern University of Science and Technology, Shenzhen, China","institution_ids":["https://openalex.org/I3045169105"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101846204","display_name":"Lidan Wang","orcid":"https://orcid.org/0000-0002-3660-1524"},"institutions":[{"id":"https://openalex.org/I3045169105","display_name":"Southern University of Science and Technology","ror":"https://ror.org/049tv2d57","country_code":"CN","type":"education","lineage":["https://openalex.org/I3045169105"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lidan Wang","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Southern University of Science and Technology, Shenzhen, China"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Southern University of Science and Technology, Shenzhen, China","institution_ids":["https://openalex.org/I3045169105"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103840929","display_name":"Nan Yang","orcid":null},"institutions":[{"id":"https://openalex.org/I3045169105","display_name":"Southern University of Science and Technology","ror":"https://ror.org/049tv2d57","country_code":"CN","type":"education","lineage":["https://openalex.org/I3045169105"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yang Nan","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Southern University of Science and Technology, Shenzhen, China"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Southern University of Science and Technology, Shenzhen, China","institution_ids":["https://openalex.org/I3045169105"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5102951214"],"corresponding_institution_ids":["https://openalex.org/I3045169105"],"apc_list":null,"apc_paid":null,"fwci":1.8523,"has_fulltext":false,"cited_by_count":36,"citation_normalized_percentile":{"value":0.84665581,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":99},"biblio":{"volume":"65","issue":"10","first_page":"1290","last_page":"1294"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/power-supply-rejection-ratio","display_name":"Power supply rejection ratio","score":0.9015779495239258},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7476704716682434},{"id":"https://openalex.org/keywords/coefficient-of-variation","display_name":"Coefficient of variation","score":0.6947694420814514},{"id":"https://openalex.org/keywords/subthreshold-conduction","display_name":"Subthreshold conduction","score":0.6520678997039795},{"id":"https://openalex.org/keywords/temperature-coefficient","display_name":"Temperature coefficient","score":0.6119833588600159},{"id":"https://openalex.org/keywords/bandgap-voltage-reference","display_name":"Bandgap voltage reference","score":0.5989640951156616},{"id":"https://openalex.org/keywords/voltage-reference","display_name":"Voltage reference","score":0.5920773148536682},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5828423500061035},{"id":"https://openalex.org/keywords/nmos-logic","display_name":"NMOS logic","score":0.5699477791786194},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.5623835325241089},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5378023982048035},{"id":"https://openalex.org/keywords/pmos-logic","display_name":"PMOS logic","score":0.5206955075263977},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.4922875463962555},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.47521597146987915},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.4657604992389679},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4646000564098358},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3820083737373352},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3371911644935608},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2910754978656769},{"id":"https://openalex.org/keywords/dropout-voltage","display_name":"Dropout voltage","score":0.27634066343307495},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.2211521863937378},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.15962573885917664},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10966143012046814}],"concepts":[{"id":"https://openalex.org/C15892472","wikidata":"https://www.wikidata.org/wiki/Q1482413","display_name":"Power supply rejection ratio","level":4,"score":0.9015779495239258},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7476704716682434},{"id":"https://openalex.org/C89838059","wikidata":"https://www.wikidata.org/wiki/Q623738","display_name":"Coefficient of variation","level":2,"score":0.6947694420814514},{"id":"https://openalex.org/C156465305","wikidata":"https://www.wikidata.org/wiki/Q1658601","display_name":"Subthreshold conduction","level":4,"score":0.6520678997039795},{"id":"https://openalex.org/C16643434","wikidata":"https://www.wikidata.org/wiki/Q898642","display_name":"Temperature coefficient","level":2,"score":0.6119833588600159},{"id":"https://openalex.org/C127033052","wikidata":"https://www.wikidata.org/wiki/Q48635","display_name":"Bandgap voltage reference","level":5,"score":0.5989640951156616},{"id":"https://openalex.org/C44351266","wikidata":"https://www.wikidata.org/wiki/Q1465532","display_name":"Voltage reference","level":3,"score":0.5920773148536682},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5828423500061035},{"id":"https://openalex.org/C197162436","wikidata":"https://www.wikidata.org/wiki/Q83908","display_name":"NMOS logic","level":4,"score":0.5699477791786194},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.5623835325241089},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5378023982048035},{"id":"https://openalex.org/C27050352","wikidata":"https://www.wikidata.org/wiki/Q173605","display_name":"PMOS logic","level":4,"score":0.5206955075263977},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.4922875463962555},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.47521597146987915},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.4657604992389679},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4646000564098358},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3820083737373352},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3371911644935608},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2910754978656769},{"id":"https://openalex.org/C15032970","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Dropout voltage","level":4,"score":0.27634066343307495},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.2211521863937378},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.15962573885917664},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10966143012046814},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsii.2018.2846808","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2018.2846808","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8299999833106995,"id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G5709494180","display_name":null,"funder_award_id":"61604067","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1992889283","https://openalex.org/W2047344047","https://openalex.org/W2093236804","https://openalex.org/W2100518195","https://openalex.org/W2102673651","https://openalex.org/W2139801901","https://openalex.org/W2146031070","https://openalex.org/W2527089532","https://openalex.org/W2531094437","https://openalex.org/W2592861018","https://openalex.org/W2736853361","https://openalex.org/W2744687811","https://openalex.org/W2753855527","https://openalex.org/W2763753390","https://openalex.org/W2763794291","https://openalex.org/W6662398725","https://openalex.org/W6741160349"],"related_works":["https://openalex.org/W2347289947","https://openalex.org/W2388657413","https://openalex.org/W2372624045","https://openalex.org/W1970618459","https://openalex.org/W3128511607","https://openalex.org/W2487240096","https://openalex.org/W1987313072","https://openalex.org/W2366264921","https://openalex.org/W4200432031","https://openalex.org/W3104603356"],"abstract_inverted_index":{"In":[0],"this":[1],"brief,":[2],"a":[3,59,74,93],"low-voltage":[4],"low-temperature-":[5],"coefficient":[6,81],"(TC)":[7],"subthreshold":[8],"CMOS":[9,62],"voltage":[10,69],"reference":[11,68],"(CVR)":[12],"is":[13,56,105,126,138],"presented.":[14],"The":[15,53,102,122,135],"proposed":[16,54],"CVR":[17],"employs":[18],"the":[19,33],"\u0394V":[20],"<sub":[21],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[22],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">GS</sub>":[23],"of":[24,70,76,82,89,96],"different-threshold":[25],"and":[26,35,44,79,110,118],"same-threshold":[27],"nMOS":[28],"transistor":[29],"pairs":[30],"to":[31,99,131],"generate":[32],"complementary-to-absolute-temperature":[34],"proportional-to-absolute-temperature":[36],"voltages,":[37],"respectively.":[38,121],"Low":[39],"TC":[40,88],"with":[41,73],"small":[42],"variations":[43],"high":[45],"power":[46,137],"supply":[47],"ripple":[48],"rejection":[49],"(PSRR)":[50],"are":[51],"achieved.":[52],"design":[55],"fabricated":[57],"in":[58],"standard":[60],"0.18-\u03bcm":[61],"process.":[63],"It":[64,84],"measures":[65],"an":[66,86],"average":[67,87],"218.3":[71],"mV":[72,78],"deviation":[75],"0.97":[77],"variation":[80],"0.45%.":[83],"achieves":[85],"23.5":[90],"ppm/\u00b0C":[91],"for":[92,128],"temperature":[94],"range":[95],"-40":[97],"\u00b0C":[98],"125":[100],"\u00b0C.":[101],"measured":[103,123],"PSRR":[104],"-66.4":[106],"dB,":[107],"-42.4":[108],"dB":[109,112],"-42.3":[111],"at":[113,141],"10":[114,119],"Hz,":[115],"1":[116],"kHz":[117],"MHz,":[120],"line":[124],"sensitivity":[125],"0.40%/V":[127],"0.6":[129],"V":[130,133],"2.0":[132],"supply.":[134,143],"consumed":[136],"30.5":[139],"nW":[140],"0.6-V":[142]},"counts_by_year":[{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":7},{"year":2019,"cited_by_count":6}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}