{"id":"https://openalex.org/W2902288217","doi":"https://doi.org/10.1109/tcsii.2018.2817504","title":"The Peak-SNR Performances of Voltage-Mode versus Time-Mode Circuits","display_name":"The Peak-SNR Performances of Voltage-Mode versus Time-Mode Circuits","publication_year":2018,"publication_date":"2018-03-20","ids":{"openalex":"https://openalex.org/W2902288217","doi":"https://doi.org/10.1109/tcsii.2018.2817504","mag":"2902288217"},"language":"en","primary_location":{"id":"doi:10.1109/tcsii.2018.2817504","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2018.2817504","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101958914","display_name":"Soheyl Ziabakhsh","orcid":"https://orcid.org/0000-0002-1284-8901"},"institutions":[{"id":"https://openalex.org/I159129438","display_name":"Universit\u00e9 du Qu\u00e9bec \u00e0 Montr\u00e9al","ror":"https://ror.org/002rjbv21","country_code":"CA","type":"education","lineage":["https://openalex.org/I159129438","https://openalex.org/I49663120"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Soheyl Ziabakhsh","raw_affiliation_strings":["Department of Electrical Engineering, Universit\u00e9 du Qu\u00e9bec, Montreal, QC, Canada"],"raw_orcid":"https://orcid.org/0000-0002-1284-8901","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Universit\u00e9 du Qu\u00e9bec, Montreal, QC, Canada","institution_ids":["https://openalex.org/I159129438"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004763968","display_name":"Ghyslain Gagnon","orcid":"https://orcid.org/0000-0001-9484-7218"},"institutions":[{"id":"https://openalex.org/I159129438","display_name":"Universit\u00e9 du Qu\u00e9bec \u00e0 Montr\u00e9al","ror":"https://ror.org/002rjbv21","country_code":"CA","type":"education","lineage":["https://openalex.org/I159129438","https://openalex.org/I49663120"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Ghyslain Gagnon","raw_affiliation_strings":["Department of Electrical Engineering, Universit\u00e9 du Qu\u00e9bec, Montreal, QC, Canada"],"raw_orcid":"https://orcid.org/0000-0001-9484-7218","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Universit\u00e9 du Qu\u00e9bec, Montreal, QC, Canada","institution_ids":["https://openalex.org/I159129438"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5083312864","display_name":"Gordon W. Roberts","orcid":"https://orcid.org/0000-0002-4880-0272"},"institutions":[{"id":"https://openalex.org/I5023651","display_name":"McGill University","ror":"https://ror.org/01pxwe438","country_code":"CA","type":"education","lineage":["https://openalex.org/I5023651"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Gordon W. Roberts","raw_affiliation_strings":["Department of Electrical and Computer Engineering, McGill University, Montreal, QC, Canada"],"raw_orcid":"https://orcid.org/0000-0002-4880-0272","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, McGill University, Montreal, QC, Canada","institution_ids":["https://openalex.org/I5023651"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.6411,"has_fulltext":false,"cited_by_count":30,"citation_normalized_percentile":{"value":0.85037571,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":"65","issue":"12","first_page":"1869","last_page":"1873"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.788716197013855},{"id":"https://openalex.org/keywords/nmos-logic","display_name":"NMOS logic","score":0.7721716165542603},{"id":"https://openalex.org/keywords/pmos-logic","display_name":"PMOS logic","score":0.6629886627197266},{"id":"https://openalex.org/keywords/flicker-noise","display_name":"Flicker noise","score":0.6504856944084167},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5622079372406006},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5351688861846924},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4597040116786957},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.43216073513031006},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4282357394695282},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.41755211353302},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.41524338722229004},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.41373297572135925},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.311662495136261},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27890923619270325},{"id":"https://openalex.org/keywords/noise-figure","display_name":"Noise figure","score":0.18298274278640747}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.788716197013855},{"id":"https://openalex.org/C197162436","wikidata":"https://www.wikidata.org/wiki/Q83908","display_name":"NMOS logic","level":4,"score":0.7721716165542603},{"id":"https://openalex.org/C27050352","wikidata":"https://www.wikidata.org/wiki/Q173605","display_name":"PMOS logic","level":4,"score":0.6629886627197266},{"id":"https://openalex.org/C113873419","wikidata":"https://www.wikidata.org/wiki/Q1410810","display_name":"Flicker noise","level":5,"score":0.6504856944084167},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5622079372406006},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5351688861846924},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4597040116786957},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.43216073513031006},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4282357394695282},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.41755211353302},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.41524338722229004},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.41373297572135925},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.311662495136261},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27890923619270325},{"id":"https://openalex.org/C112806910","wikidata":"https://www.wikidata.org/wiki/Q746825","display_name":"Noise figure","level":4,"score":0.18298274278640747},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tcsii.2018.2817504","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2018.2817504","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},{"id":"pmh:oai:espace2.etsmtl.ca:16604","is_oa":false,"landing_page_url":null,"pdf_url":null,"source":{"id":"https://openalex.org/S4306402392","display_name":"Espace \u00c9TS (ETS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1341030882","host_organization_name":"Educational Testing Service","host_organization_lineage":["https://openalex.org/I1341030882"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Article publi\u00e9 dans une revue, r\u00e9vis\u00e9 par les pairs"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.550000011920929}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1518236483","https://openalex.org/W1564862886","https://openalex.org/W1566916904","https://openalex.org/W2048685716","https://openalex.org/W2096299759","https://openalex.org/W2096434843","https://openalex.org/W2108324407","https://openalex.org/W2112731410","https://openalex.org/W2161066961","https://openalex.org/W2470596919","https://openalex.org/W2560521353","https://openalex.org/W2575785951","https://openalex.org/W6674652224"],"related_works":["https://openalex.org/W4386261925","https://openalex.org/W2048420745","https://openalex.org/W2082944690","https://openalex.org/W2263373136","https://openalex.org/W1914349328","https://openalex.org/W2104885411","https://openalex.org/W2023334077","https://openalex.org/W2005494397","https://openalex.org/W2730314563","https://openalex.org/W2058541779"],"abstract_inverted_index":{"Representing":[0],"signals":[1],"in":[2,20,42,62,87],"the":[3,32,88,95,98],"time":[4,10],"domain,":[5],"as":[6],"pulses":[7],"of":[8,36,97],"variable":[9],"duration,":[11],"is":[12,60,67],"a":[13,37],"promising":[14],"solution":[15],"for":[16],"analog":[17],"signal":[18],"processing":[19],"CMOS":[21,71,91],"technologies":[22],"with":[23],"low":[24],"supply":[25],"voltages.":[26],"This":[27],"brief":[28],"aims":[29],"at":[30],"determining":[31],"peak":[33],"signal-to-noise":[34],"ratio":[35],"pMOS-nMOS":[38],"transistor":[39],"stack":[40],"used":[41],"both":[43,54,63],"voltage-mode":[44],"and":[45,56,74],"time-mode":[46],"circuits.":[47],"A":[48,82],"detailed":[49],"noise":[50,58,79],"analysis":[51,66,80],"which":[52],"includes":[53],"thermal":[55],"flicker":[57],"contributions":[59],"performed":[61],"domains.":[64],"The":[65],"applied":[68],"to":[69,76],"different":[70],"technology":[72],"nodes":[73],"compared":[75],"Spectre":[77],"transient":[78],"tools.":[81],"silicon":[83],"prototype":[84],"was":[85],"fabricated":[86],"IBM":[89],"130-nm":[90],"technology.":[92],"Measurements":[93],"confirm":[94],"accuracy":[96],"proposed":[99],"analysis.":[100]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":2}],"updated_date":"2026-07-02T09:51:11.867554","created_date":"2025-10-10T00:00:00"}