{"id":"https://openalex.org/W2338589871","doi":"https://doi.org/10.1109/tcsii.2016.2554998","title":"Dynamic Data-Dependent Reference to Improve Sense Margin and Speed of Magnetoresistive Random Access Memory","display_name":"Dynamic Data-Dependent Reference to Improve Sense Margin and Speed of Magnetoresistive Random Access Memory","publication_year":2016,"publication_date":"2016-04-15","ids":{"openalex":"https://openalex.org/W2338589871","doi":"https://doi.org/10.1109/tcsii.2016.2554998","mag":"2338589871"},"language":"en","primary_location":{"id":"doi:10.1109/tcsii.2016.2554998","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2016.2554998","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5034197769","display_name":"Xiaoyong Xue","orcid":"https://orcid.org/0000-0001-9001-4569"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xiaoyong Xue","raw_affiliation_strings":["ASIC and System State Key Laboratory, Department of Microelectronics, Fudan University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0001-9001-4569","affiliations":[{"raw_affiliation_string":"ASIC and System State Key Laboratory, Department of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112322511","display_name":"Yarong Fu","orcid":null},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yarong Fu","raw_affiliation_strings":["ASIC and System State Key Laboratory, Department of Microelectronics, Fudan University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ASIC and System State Key Laboratory, Department of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058943894","display_name":"Yanqing Zhao","orcid":"https://orcid.org/0000-0003-0606-9917"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yanqing Zhao","raw_affiliation_strings":["ASIC and System State Key Laboratory, Department of Microelectronics, Fudan University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ASIC and System State Key Laboratory, Department of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102214447","display_name":"Juan Xu","orcid":null},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Juan Xu","raw_affiliation_strings":["ASIC and System State Key Laboratory, Department of Microelectronics, Fudan University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ASIC and System State Key Laboratory, Department of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100972382","display_name":"Jianguo Yang","orcid":null},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianguo Yang","raw_affiliation_strings":["ASIC and System State Key Laboratory, Department of Microelectronics, Fudan University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ASIC and System State Key Laboratory, Department of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103242777","display_name":"Yufeng Xie","orcid":"https://orcid.org/0000-0002-6541-2925"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yufeng Xie","raw_affiliation_strings":["ASIC and System State Key Laboratory, Department of Microelectronics, Fudan University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ASIC and System State Key Laboratory, Department of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100512230","display_name":"Yinyin Lin","orcid":"https://orcid.org/0009-0000-0499-0601"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yinyin Lin","raw_affiliation_strings":["ASIC and System State Key Laboratory, Department of Microelectronics, Fudan University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ASIC and System State Key Laboratory, Department of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110012128","display_name":"Ryan Huang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210142504","display_name":"Semiconductor Manufacturing International (China)","ror":"https://ror.org/03tf9y485","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210142504"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ryan Huang","raw_affiliation_strings":["Technology Development Center, Semiconductor Manufacturing International Corporation, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technology Development Center, Semiconductor Manufacturing International Corporation, Shanghai, China","institution_ids":["https://openalex.org/I4210142504"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058926362","display_name":"Qingtian Zou","orcid":"https://orcid.org/0000-0002-1412-4800"},"institutions":[{"id":"https://openalex.org/I4210142504","display_name":"Semiconductor Manufacturing International (China)","ror":"https://ror.org/03tf9y485","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210142504"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qingtian Zou","raw_affiliation_strings":["Technology Development Center, Semiconductor Manufacturing International Corporation, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technology Development Center, Semiconductor Manufacturing International Corporation, Shanghai, China","institution_ids":["https://openalex.org/I4210142504"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103575392","display_name":"Jingang Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210142504","display_name":"Semiconductor Manufacturing International (China)","ror":"https://ror.org/03tf9y485","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210142504"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jingang Wu","raw_affiliation_strings":["Technology Development Center, Semiconductor Manufacturing International Corporation, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technology Development Center, Semiconductor Manufacturing International Corporation, Shanghai, China","institution_ids":["https://openalex.org/I4210142504"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":10,"corresponding_author_ids":["https://openalex.org/A5034197769"],"corresponding_institution_ids":["https://openalex.org/I24943067","https://openalex.org/I4210132426"],"apc_list":null,"apc_paid":null,"fwci":0.7439,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.74278206,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"64","issue":"2","first_page":"186","last_page":"190"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/margin","display_name":"Margin (machine learning)","score":0.5067339539527893},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.47181761264801025},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3306942880153656},{"id":"https://openalex.org/keywords/information-retrieval","display_name":"Information retrieval","score":0.32262560725212097},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.20060861110687256}],"concepts":[{"id":"https://openalex.org/C774472","wikidata":"https://www.wikidata.org/wiki/Q6760393","display_name":"Margin (machine learning)","level":2,"score":0.5067339539527893},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.47181761264801025},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3306942880153656},{"id":"https://openalex.org/C23123220","wikidata":"https://www.wikidata.org/wiki/Q816826","display_name":"Information retrieval","level":1,"score":0.32262560725212097},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.20060861110687256}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsii.2016.2554998","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2016.2554998","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8399999737739563}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1966939297","https://openalex.org/W2000818868","https://openalex.org/W2025550430","https://openalex.org/W2035257891","https://openalex.org/W2091773052","https://openalex.org/W2159389783","https://openalex.org/W2472395098","https://openalex.org/W4285719527","https://openalex.org/W6642065836","https://openalex.org/W6659307720"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W3125011624","https://openalex.org/W1508631387","https://openalex.org/W2370917603","https://openalex.org/W2390279801","https://openalex.org/W2952760143","https://openalex.org/W2358668433","https://openalex.org/W2017776670","https://openalex.org/W2347897961","https://openalex.org/W2376932109"],"abstract_inverted_index":{"Magnetoresistive":[0],"random":[1],"access":[2],"memory":[3],"(MRAM)":[4],"suffers":[5],"from":[6,122],"low":[7],"magnetoresistance":[8],"ratio":[9],"and":[10,22,40,96,137,184,202],"serious":[11],"variations":[12],"in":[13,109,169,193,199,205,221],"both":[14],"low-resistance":[15],"state":[16,24],"(R":[17,25],"<sub":[18,26,37,42,93,98,134,139,158,163],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[19,27,38,43,94,99,135,140,159,164],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">P</sub>":[20,39,95,136,165],")":[21],"high-resistance":[23],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">AP</sub>":[28,44,100,141,160],").":[29],"The":[30,174,218],"resulting":[31],"narrow":[32],"resistance":[33],"window":[34],"between":[35],"R":[36,41,92,97,133,138,157,162],"makes":[45],"it":[46],"difficult":[47],"to":[48,74],"acquire":[49],"a":[50,61,88,110,129,144],"sufficient":[51],"sense":[52,77,172,176,182,195,200],"margin":[53,177],"for":[54,65,153],"accurate":[55],"read":[56,63,85,116,126,155,186],"operation.":[57],"In":[58],"this":[59],"brief,":[60],"novel":[62],"circuit":[64],"MRAM":[66],"is":[67,107,224],"proposed":[68],"with":[69,212],"dynamic":[70],"data-dependent":[71,111],"reference":[72,105,148,216],"current":[73,106,117,149],"improve":[75,180],"the":[76,82,115,119,123,154,171,181,185,213],"margin.":[78],"Instead":[79],"of":[80,84,87,90,118,125,128,131,156],"using":[81],"average":[83],"currents":[86,127],"pair":[89,130],"dummy":[91,132],"cells":[101],"as":[102],"reference,":[103],"our":[104],"generated":[108],"manner":[112],"by":[113],"subtracting":[114],"selected":[120],"cell":[121],"sum":[124],"cells.":[142],"Thus,":[143],"larger":[145,175],"or":[146,161],"smaller":[147],"can":[150,178],"be":[151],"obtained":[152],"cell,":[166],"respectively,":[167],"helping":[168],"expanding":[170],"margins.":[173],"further":[179],"speed":[183],"yield.":[187],"Evaluation":[188],"shows":[189],"that":[190],"2\u00d7":[191],"increase":[192],"typical":[194],"margin,":[196],"60%":[197],"reduction":[198,204],"time,":[201],"remarkable":[203],"bit":[206],"error":[207],"rate":[208],"are":[209],"achieved":[210],"compared":[211],"conventional":[214],"averaging":[215],"scheme.":[217],"accompanying":[219],"cost":[220],"power":[222],"consumption":[223],"acceptable.":[225]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}