{"id":"https://openalex.org/W2025734321","doi":"https://doi.org/10.1109/tcsii.2015.2415714","title":"A Variation-Tolerant Subthreshold to Superthreshold Level Shifter for Heterogeneous Interfaces","display_name":"A Variation-Tolerant Subthreshold to Superthreshold Level Shifter for Heterogeneous Interfaces","publication_year":2015,"publication_date":"2015-03-23","ids":{"openalex":"https://openalex.org/W2025734321","doi":"https://doi.org/10.1109/tcsii.2015.2415714","mag":"2025734321"},"language":"en","primary_location":{"id":"doi:10.1109/tcsii.2015.2415714","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2015.2415714","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103611856","display_name":"Yingchieh Ho","orcid":null},"institutions":[{"id":"https://openalex.org/I33096239","display_name":"National Dong Hwa University","ror":"https://ror.org/00mng9617","country_code":"TW","type":"education","lineage":["https://openalex.org/I33096239"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Yingchieh Ho","raw_affiliation_strings":["Department of Electrical Engineering, National Dong Hwa University, Hualien, Taiwan","NATIONAL Dong Hwa University"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Dong Hwa University, Hualien, Taiwan","institution_ids":["https://openalex.org/I33096239"]},{"raw_affiliation_string":"NATIONAL Dong Hwa University","institution_ids":["https://openalex.org/I33096239"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109193444","display_name":"Shu-Yu Hsu","orcid":null},"institutions":[{"id":"https://openalex.org/I33096239","display_name":"National Dong Hwa University","ror":"https://ror.org/00mng9617","country_code":"TW","type":"education","lineage":["https://openalex.org/I33096239"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Shu-Yu Hsu","raw_affiliation_strings":["Department of Electrical Engineering, National Dong Hwa University, Hualien, Taiwan","NATIONAL Dong Hwa University"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Dong Hwa University, Hualien, Taiwan","institution_ids":["https://openalex.org/I33096239"]},{"raw_affiliation_string":"NATIONAL Dong Hwa University","institution_ids":["https://openalex.org/I33096239"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101838014","display_name":"Chen\u2010Yi Lee","orcid":"https://orcid.org/0000-0002-6795-0874"},"institutions":[{"id":"https://openalex.org/I33096239","display_name":"National Dong Hwa University","ror":"https://ror.org/00mng9617","country_code":"TW","type":"education","lineage":["https://openalex.org/I33096239"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chen-Yi Lee","raw_affiliation_strings":["Department of Electrical Engineering, National Dong Hwa University, Hualien, Taiwan","Institute of Electronics"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Dong Hwa University, Hualien, Taiwan","institution_ids":["https://openalex.org/I33096239"]},{"raw_affiliation_string":"Institute of Electronics","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5103611856"],"corresponding_institution_ids":["https://openalex.org/I33096239"],"apc_list":null,"apc_paid":null,"fwci":0.5919,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.72063537,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"63","issue":"2","first_page":"161","last_page":"165"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/subthreshold-conduction","display_name":"Subthreshold conduction","score":0.795722246170044},{"id":"https://openalex.org/keywords/duty-cycle","display_name":"Duty cycle","score":0.7411918640136719},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.632535994052887},{"id":"https://openalex.org/keywords/logic-level","display_name":"Logic level","score":0.5817491412162781},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5560422539710999},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.5501459836959839},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.49389225244522095},{"id":"https://openalex.org/keywords/bootstrapping","display_name":"Bootstrapping (finance)","score":0.4903281033039093},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.472074031829834},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.4678187072277069},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4431937336921692},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.43170562386512756},{"id":"https://openalex.org/keywords/variance","display_name":"Variance (accounting)","score":0.4225902855396271},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.37980422377586365},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3678431510925293},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.30526190996170044},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.28078022599220276},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1820724606513977},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1682836413383484},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.16187036037445068},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.10236051678657532}],"concepts":[{"id":"https://openalex.org/C156465305","wikidata":"https://www.wikidata.org/wiki/Q1658601","display_name":"Subthreshold conduction","level":4,"score":0.795722246170044},{"id":"https://openalex.org/C199822604","wikidata":"https://www.wikidata.org/wiki/Q557120","display_name":"Duty cycle","level":3,"score":0.7411918640136719},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.632535994052887},{"id":"https://openalex.org/C146569638","wikidata":"https://www.wikidata.org/wiki/Q173378","display_name":"Logic level","level":3,"score":0.5817491412162781},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5560422539710999},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.5501459836959839},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.49389225244522095},{"id":"https://openalex.org/C207609745","wikidata":"https://www.wikidata.org/wiki/Q4944086","display_name":"Bootstrapping (finance)","level":2,"score":0.4903281033039093},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.472074031829834},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.4678187072277069},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4431937336921692},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.43170562386512756},{"id":"https://openalex.org/C196083921","wikidata":"https://www.wikidata.org/wiki/Q7915758","display_name":"Variance (accounting)","level":2,"score":0.4225902855396271},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.37980422377586365},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3678431510925293},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.30526190996170044},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.28078022599220276},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1820724606513977},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1682836413383484},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.16187036037445068},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.10236051678657532},{"id":"https://openalex.org/C121955636","wikidata":"https://www.wikidata.org/wiki/Q4116214","display_name":"Accounting","level":1,"score":0.0},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.0},{"id":"https://openalex.org/C149782125","wikidata":"https://www.wikidata.org/wiki/Q160039","display_name":"Econometrics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsii.2015.2415714","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2015.2415714","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6299999952316284,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320322795","display_name":"Ministry of Science and Technology, Taiwan","ror":"https://ror.org/02kv4zf79"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1661368752","https://openalex.org/W1965484872","https://openalex.org/W2020875745","https://openalex.org/W2021825321","https://openalex.org/W2030764000","https://openalex.org/W2060888327","https://openalex.org/W2078175791","https://openalex.org/W2116288681","https://openalex.org/W2152583886","https://openalex.org/W2156818146","https://openalex.org/W2157204696","https://openalex.org/W2160587789","https://openalex.org/W3151852370","https://openalex.org/W6655872142","https://openalex.org/W6666034420","https://openalex.org/W6682960904"],"related_works":["https://openalex.org/W2512653194","https://openalex.org/W2152583886","https://openalex.org/W2075642405","https://openalex.org/W1487227640","https://openalex.org/W4239145761","https://openalex.org/W2808730134","https://openalex.org/W2111372718","https://openalex.org/W2615230521","https://openalex.org/W3023368799","https://openalex.org/W2309322547"],"abstract_inverted_index":{"This":[0],"brief":[1],"presents":[2],"a":[3,98],"subthreshold":[4,18],"to":[5,20,66,72,81,116,148],"superthreshold":[6,21],"level":[7,113],"shifter":[8],"(LS)":[9],"for":[10],"linking":[11],"heterogeneous":[12],"interfaces.":[13],"As":[14],"conventional":[15],"LSs":[16],"convert":[17],"signals":[19],"ones,":[22],"different":[23],"device":[24],"characteristics":[25],"result":[26],"in":[27,97],"an":[28,120],"imbalance":[29,56],"of":[30,41,57,122],"driving":[31,59,82],"capability.":[32],"However,":[33],"process":[34,67],"and":[35,68,86,136],"temperature":[36,69,144],"variations":[37],"make":[38],"the":[39,46,103,111,132],"yield":[40],"LS":[42],"much":[43],"worse.":[44],"With":[45],"proposed":[47],"bootstrapping":[48],"technique,":[49],"this":[50],"work":[51],"not":[52],"only":[53,94],"eliminates":[54],"tremendous":[55],"MOS":[58],"capability":[60],"but":[61],"also":[62],"reduces":[63],"degradation":[64],"due":[65],"variations.":[70],"According":[71],"Monte":[73],"Carlo":[74],"simulations,":[75],"our":[76,108],"design":[77],"shows":[78],"high":[79,140],"concentration":[80,141],"current,":[83],"delay":[84,90,125,134],"time,":[85],"duty":[87,137],"cycle.":[88],"The":[89],"variation":[91],"coefficient":[92],"is":[93],"14%.":[95],"Implemented":[96],"65-nm":[99],"CMOS":[100],"SPRVT":[101],"process,":[102],"measured":[104,133],"results":[105],"show":[106],"that":[107],"proposal":[109],"shifts":[110],"voltage":[112],"from":[114,146],"0.2":[115],"1.0":[117],"V":[118],"with":[119],"average":[121],"12.9":[123],"ns":[124],"time":[126,135],"at":[127],"5":[128],"MHz.":[129],"In":[130],"addition,":[131],"cycle":[138],"have":[139],"even":[142],"when":[143],"varies":[145],"-20\u00b0C":[147],"120\u00b0C.":[149]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2018,"cited_by_count":2},{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}