{"id":"https://openalex.org/W2007605560","doi":"https://doi.org/10.1109/tcsii.2014.2327333","title":"A Digital Timing Mismatch Calibration Technique in Time-Interleaved ADCs","display_name":"A Digital Timing Mismatch Calibration Technique in Time-Interleaved ADCs","publication_year":2014,"publication_date":"2014-05-29","ids":{"openalex":"https://openalex.org/W2007605560","doi":"https://doi.org/10.1109/tcsii.2014.2327333","mag":"2007605560"},"language":"en","primary_location":{"id":"doi:10.1109/tcsii.2014.2327333","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2014.2327333","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100336850","display_name":"Jing Li","orcid":"https://orcid.org/0000-0001-9980-0224"},"institutions":[{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]},{"id":"https://openalex.org/I4391767659","display_name":"State Key Laboratory of Electronic Thin Films and Integrated Devices","ror":"https://ror.org/01t9yse95","country_code":null,"type":"facility","lineage":["https://openalex.org/I150229711","https://openalex.org/I4391767659"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jing Li","raw_affiliation_strings":["State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I4391767659"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109282331","display_name":"Shuangyi Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]},{"id":"https://openalex.org/I4391767659","display_name":"State Key Laboratory of Electronic Thin Films and Integrated Devices","ror":"https://ror.org/01t9yse95","country_code":null,"type":"facility","lineage":["https://openalex.org/I150229711","https://openalex.org/I4391767659"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuangyi Wu","raw_affiliation_strings":["State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I4391767659"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100356073","display_name":"Yang Liu","orcid":"https://orcid.org/0000-0003-0615-7036"},"institutions":[{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]},{"id":"https://openalex.org/I4391767659","display_name":"State Key Laboratory of Electronic Thin Films and Integrated Devices","ror":"https://ror.org/01t9yse95","country_code":null,"type":"facility","lineage":["https://openalex.org/I150229711","https://openalex.org/I4391767659"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yang Liu","raw_affiliation_strings":["State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I4391767659"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100749757","display_name":"Ning Ning","orcid":"https://orcid.org/0000-0001-7893-1428"},"institutions":[{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]},{"id":"https://openalex.org/I4391767659","display_name":"State Key Laboratory of Electronic Thin Films and Integrated Devices","ror":"https://ror.org/01t9yse95","country_code":null,"type":"facility","lineage":["https://openalex.org/I150229711","https://openalex.org/I4391767659"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ning Ning","raw_affiliation_strings":["State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I4391767659"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100377679","display_name":"Qi Yu","orcid":"https://orcid.org/0000-0002-0490-0749"},"institutions":[{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]},{"id":"https://openalex.org/I4391767659","display_name":"State Key Laboratory of Electronic Thin Films and Integrated Devices","ror":"https://ror.org/01t9yse95","country_code":null,"type":"facility","lineage":["https://openalex.org/I150229711","https://openalex.org/I4391767659"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qi Yu","raw_affiliation_strings":["State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I4391767659"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.6912,"has_fulltext":false,"cited_by_count":49,"citation_normalized_percentile":{"value":0.83046609,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"61","issue":"7","first_page":"486","last_page":"490"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6089699268341064},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.553674042224884},{"id":"https://openalex.org/keywords/nyquist-rate","display_name":"Nyquist rate","score":0.5315475463867188},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5148907899856567},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.5112917423248291},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.49627572298049927},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.4868156611919403},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.4465487003326416},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.42122721672058105},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3707529902458191},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.23603510856628418},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.14156347513198853},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13393351435661316},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.08249065279960632}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6089699268341064},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.553674042224884},{"id":"https://openalex.org/C65914096","wikidata":"https://www.wikidata.org/wiki/Q6273772","display_name":"Nyquist rate","level":4,"score":0.5315475463867188},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5148907899856567},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.5112917423248291},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.49627572298049927},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.4868156611919403},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.4465487003326416},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.42122721672058105},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3707529902458191},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.23603510856628418},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.14156347513198853},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13393351435661316},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.08249065279960632},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsii.2014.2327333","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2014.2327333","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.5099999904632568,"display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G1746894475","display_name":null,"funder_award_id":"61274086","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5761387296","display_name":null,"funder_award_id":"ZYGX2012Z007","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1985794108","https://openalex.org/W2005806893","https://openalex.org/W2051606634","https://openalex.org/W2075886929","https://openalex.org/W2104040946","https://openalex.org/W2104728238","https://openalex.org/W2110413691","https://openalex.org/W2119119508","https://openalex.org/W2122365245","https://openalex.org/W2126190772","https://openalex.org/W2136010026","https://openalex.org/W2137219772","https://openalex.org/W2170331687","https://openalex.org/W6644730657","https://openalex.org/W6663410101","https://openalex.org/W6680609494"],"related_works":["https://openalex.org/W631083485","https://openalex.org/W4313452936","https://openalex.org/W2097026685","https://openalex.org/W3208656470","https://openalex.org/W2952404111","https://openalex.org/W4300513038","https://openalex.org/W2050948649","https://openalex.org/W4392472898","https://openalex.org/W2542059679","https://openalex.org/W2050584995"],"abstract_inverted_index":{"A":[0],"digital":[1],"calibration":[2,107,123],"scheme":[3,18,77,108,127],"is":[4,19,51,60,85,97,109,128],"proposed":[5,104,126],"to":[6,20,29,41,63,78,99,117,131],"minimize":[7],"the":[8,17,22,31,34,38,43,70,100,103,115,118,125],"timing":[9,49,71,105],"mismatch":[10,50,106,116],"in":[11],"time-interleaved":[12],"analog-to-digital":[13],"converters":[14],"(TIADCs).":[15],"First,":[16],"subtract":[21],"outputs":[23],"from":[24],"adjacent":[25],"channel":[26],"ADCs":[27],"and":[28,111,133,137],"utilize":[30],"expectations":[32],"of":[33,37,75,113],"absolute":[35],"value":[36],"subtracted":[39],"results":[40,88],"represent":[42],"actual":[44],"sampling":[45],"time":[46],"interval.":[47],"The":[48,57,73],"recognized":[52],"by":[53],"comparing":[54],"these":[55],"expectations.":[56],"obtained":[58],"information":[59],"fed":[61],"back":[62],"adjust":[64],"variable":[65],"delay":[66],"buffers,":[67],"thus":[68],"reducing":[69,114],"mismatch.":[72],"application":[74],"this":[76],"a":[79],"12-bit":[80],"1.6":[81],"GS/s":[82],"four-channel":[83],"TIADC":[84],"demonstrated.":[86],"Simulation":[87],"show":[89],"that":[90],"with":[91,121],"an":[92],"input":[93],"signal":[94],"whose":[95],"bandwidth":[96],"limited":[98],"Nyquist":[101],"frequency,":[102],"effective":[110],"capable":[112],"minimum.":[119],"Compared":[120],"traditional":[122],"schemes,":[124],"more":[129],"feasible":[130],"implement":[132],"consumes":[134],"less":[135],"power":[136],"chip":[138],"area.":[139]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":9},{"year":2021,"cited_by_count":7},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":6},{"year":2018,"cited_by_count":7},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}