{"id":"https://openalex.org/W1713022355","doi":"https://doi.org/10.1109/tcsii.2014.2312639","title":"Dynamic Performance Characterization of Embedded Single-Ended Mixed-Signal Circuits","display_name":"Dynamic Performance Characterization of Embedded Single-Ended Mixed-Signal Circuits","publication_year":2014,"publication_date":"2014-04-21","ids":{"openalex":"https://openalex.org/W1713022355","doi":"https://doi.org/10.1109/tcsii.2014.2312639","mag":"1713022355"},"language":"en","primary_location":{"id":"doi:10.1109/tcsii.2014.2312639","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2014.2312639","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075157110","display_name":"Byoung\u2010Ho Kim","orcid":"https://orcid.org/0000-0001-8073-8109"},"institutions":[{"id":"https://openalex.org/I1296127346","display_name":"Broadcom (Israel)","ror":"https://ror.org/01jsrac29","country_code":"IL","type":"company","lineage":["https://openalex.org/I1296127346","https://openalex.org/I4210127325"]},{"id":"https://openalex.org/I4210127325","display_name":"Broadcom (United States)","ror":"https://ror.org/035gt5s03","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127325"]}],"countries":["IL","US"],"is_corresponding":false,"raw_author_name":"Byoungho Kim","raw_affiliation_strings":["Broadcom Corporation, Irvine, CA, USA","BROADCOM CORP"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Broadcom Corporation, Irvine, CA, USA","institution_ids":["https://openalex.org/I4210127325"]},{"raw_affiliation_string":"BROADCOM CORP","institution_ids":["https://openalex.org/I1296127346"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068070739","display_name":"Jacob A. Abraham","orcid":"https://orcid.org/0000-0002-5336-5631"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jacob A. Abraham","raw_affiliation_strings":["Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, TX, USA","Dept. of Electr. &, Comput. Eng., Univ. of Texas at Austin, Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]},{"raw_affiliation_string":"Dept. of Electr. &, Comput. Eng., Univ. of Texas at Austin, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.308,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.55782253,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"61","issue":"5","first_page":"329","last_page":"333"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5902988910675049},{"id":"https://openalex.org/keywords/device-under-test","display_name":"Device under test","score":0.569164514541626},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.471168577671051},{"id":"https://openalex.org/keywords/differential","display_name":"Differential (mechanical device)","score":0.4674544930458069},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.43241119384765625},{"id":"https://openalex.org/keywords/automatic-test-equipment","display_name":"Automatic test equipment","score":0.41503453254699707},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4148944616317749},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.40089845657348633},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3248862326145172},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.16730406880378723},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.15221846103668213},{"id":"https://openalex.org/keywords/scattering-parameters","display_name":"Scattering parameters","score":0.07981070876121521}],"concepts":[{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5902988910675049},{"id":"https://openalex.org/C76249512","wikidata":"https://www.wikidata.org/wiki/Q1206780","display_name":"Device under test","level":3,"score":0.569164514541626},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.471168577671051},{"id":"https://openalex.org/C93226319","wikidata":"https://www.wikidata.org/wiki/Q193137","display_name":"Differential (mechanical device)","level":2,"score":0.4674544930458069},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.43241119384765625},{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.41503453254699707},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4148944616317749},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.40089845657348633},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3248862326145172},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.16730406880378723},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.15221846103668213},{"id":"https://openalex.org/C195266298","wikidata":"https://www.wikidata.org/wiki/Q2165620","display_name":"Scattering parameters","level":2,"score":0.07981070876121521},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tcsii.2014.2312639","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2014.2312639","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},{"id":"pmh:oai:repository.hanyang.ac.kr:20.500.11754/91628","is_oa":false,"landing_page_url":"https://ieeexplore.ieee.org/document/6803067/","pdf_url":null,"source":{"id":"https://openalex.org/S4306401328","display_name":"The Royal Society of Chemistry\u2019s Journals, Books and Databases (The Royal Society of Chemistry)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I2751430930","host_organization_name":"Royal Society of Chemistry","host_organization_lineage":["https://openalex.org/I2751430930"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1982835363","https://openalex.org/W2037801071","https://openalex.org/W2038284570","https://openalex.org/W2046095064","https://openalex.org/W2057256399","https://openalex.org/W2058031976","https://openalex.org/W2073335940","https://openalex.org/W2095701786","https://openalex.org/W2105628848","https://openalex.org/W2112392595","https://openalex.org/W2113029408","https://openalex.org/W2124565735","https://openalex.org/W2158561776","https://openalex.org/W2162302201","https://openalex.org/W2166757306","https://openalex.org/W2408080650","https://openalex.org/W6683419078"],"related_works":["https://openalex.org/W2117789795","https://openalex.org/W2110500900","https://openalex.org/W2145792104","https://openalex.org/W2134415747","https://openalex.org/W2529756660","https://openalex.org/W1993656359","https://openalex.org/W1995353968","https://openalex.org/W2083167514","https://openalex.org/W2545270470","https://openalex.org/W2155960244"],"abstract_inverted_index":{"The":[0,32,120,146],"inherent":[1],"fault-masking":[2,37],"characteristic":[3,148],"of":[4,13,39,53,63,75,143],"the":[5,23,36,40,50,54,59,68,72,76,81,94,101,113,117,133,139,155],"traditional":[6],"loopback":[7,24,41,98,104,141],"test":[8,25,30,42,165],"produces":[9],"overly":[10],"pessimistic":[11],"estimates":[12],"device-under-test":[14],"(DUT)":[15],"performance,":[16],"which":[17],"negatively":[18],"impacts":[19],"product":[20],"yield,":[21],"although":[22],"provides":[26],"a":[27,84,128],"promising":[28],"low-cost":[29],"solution.":[31],"proposed":[33,69],"method":[34,70],"overcomes":[35],"shortcomings":[38],"for":[43],"single-ended":[44,85,103,129],"mixed-signal":[45],"circuits":[46],"by":[47],"accurately":[48,168],"characterizing":[49],"performance":[51,171],"parameters":[52],"individual":[55,156],"DUTs,":[56],"based":[57],"on":[58],"imbalance":[60,115],"generation":[61],"technique":[62],"our":[64,97,163],"previous":[65,77],"work.":[66],"Basically,":[67],"is":[71,91],"case":[73],"study":[74],"work":[78],"to":[79,83,93,106,111,127,137,153],"validate":[80],"expansibility":[82],"circuit":[86],"testing.":[87],"A":[88],"sinusoidal":[89],"stimulus":[90],"applied":[92],"DUT,":[95,134],"and":[96,131],"configuration":[99],"converts":[100],"external":[102],"path":[105],"differential":[107,118,122],"mode,":[108],"in":[109,135],"order":[110,136],"generate":[112],"phase":[114],"between":[116],"pair.":[119],"imbalanced":[121],"signals":[123],"then":[124,151],"switch":[125],"back":[126],"mode":[130],"stimulate":[132],"introduce":[138],"DUT":[140,157,170],"responses":[142],"different":[144],"weight.":[145],"nonlinear":[147],"equations":[149],"are":[150],"derived":[152],"characterize":[154],"performances.":[158],"Hardware":[159],"measurements":[160],"show":[161],"that":[162],"cost-effective":[164],"approach":[166],"can":[167],"predict":[169],"parameters.":[172]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2016-06-24T00:00:00"}