{"id":"https://openalex.org/W1570681978","doi":"https://doi.org/10.1109/tcsii.2014.2312635","title":"<i>In Situ</i> Power Gating Efficiency Learner for Fine-Grained Self-Adaptive Power Gating","display_name":"<i>In Situ</i> Power Gating Efficiency Learner for Fine-Grained Self-Adaptive Power Gating","publication_year":2014,"publication_date":"2014-04-29","ids":{"openalex":"https://openalex.org/W1570681978","doi":"https://doi.org/10.1109/tcsii.2014.2312635","mag":"1570681978"},"language":"en","primary_location":{"id":"doi:10.1109/tcsii.2014.2312635","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2014.2312635","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028132107","display_name":"Amit Ranjan Trivedi","orcid":"https://orcid.org/0000-0001-5436-7922"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Amit Ranjan Trivedi","raw_affiliation_strings":["Sch. of Electr. &amp; Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA"],"affiliations":[{"raw_affiliation_string":"Sch. of Electr. &amp; Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088783660","display_name":"Wen Yueh","orcid":"https://orcid.org/0000-0003-2229-0566"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Wen Yueh","raw_affiliation_strings":["Sch. of Electr. &amp; Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA"],"affiliations":[{"raw_affiliation_string":"Sch. of Electr. &amp; Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009591041","display_name":"Saibal Mukhopadhyay","orcid":"https://orcid.org/0000-0002-8894-3390"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Saibal Mukhopadhyay","raw_affiliation_strings":["Sch. of Electr. &amp; Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA"],"affiliations":[{"raw_affiliation_string":"Sch. of Electr. &amp; Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5028132107"],"corresponding_institution_ids":["https://openalex.org/I130701444"],"apc_list":null,"apc_paid":null,"fwci":0.4187,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.65412657,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":"61","issue":"5","first_page":"344","last_page":"348"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/power-gating","display_name":"Power gating","score":0.8496965169906616},{"id":"https://openalex.org/keywords/gating","display_name":"Gating","score":0.7912763357162476},{"id":"https://openalex.org/keywords/idle","display_name":"Idle","score":0.6369910836219788},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6288720369338989},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5826707482337952},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.5492168068885803},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.48093360662460327},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.45056408643722534},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4290162920951843},{"id":"https://openalex.org/keywords/in-situ","display_name":"In situ","score":0.41161614656448364},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.28188663721084595},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.24527224898338318},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21518301963806152},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.19587019085884094},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.13027417659759521},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.0876387357711792}],"concepts":[{"id":"https://openalex.org/C2780700455","wikidata":"https://www.wikidata.org/wiki/Q7236515","display_name":"Power gating","level":4,"score":0.8496965169906616},{"id":"https://openalex.org/C194544171","wikidata":"https://www.wikidata.org/wiki/Q21105679","display_name":"Gating","level":2,"score":0.7912763357162476},{"id":"https://openalex.org/C16320812","wikidata":"https://www.wikidata.org/wiki/Q1812200","display_name":"Idle","level":2,"score":0.6369910836219788},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6288720369338989},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5826707482337952},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.5492168068885803},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.48093360662460327},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.45056408643722534},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4290162920951843},{"id":"https://openalex.org/C2777822432","wikidata":"https://www.wikidata.org/wiki/Q216681","display_name":"In situ","level":2,"score":0.41161614656448364},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.28188663721084595},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24527224898338318},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21518301963806152},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.19587019085884094},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13027417659759521},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0876387357711792},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C42407357","wikidata":"https://www.wikidata.org/wiki/Q521","display_name":"Physiology","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsii.2014.2312635","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2014.2312635","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8999999761581421,"display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G4200929446","display_name":null,"funder_award_id":"2084.001","funder_id":"https://openalex.org/F4320306087","funder_display_name":"Semiconductor Research Corporation"},{"id":"https://openalex.org/G4957303940","display_name":null,"funder_award_id":"CNS-1218745","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320306087","display_name":"Semiconductor Research Corporation","ror":"https://ror.org/047z4n946"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W2029663117","https://openalex.org/W2044513734","https://openalex.org/W2077117260","https://openalex.org/W2119060381","https://openalex.org/W2121797451","https://openalex.org/W2124679907","https://openalex.org/W2152770400","https://openalex.org/W2158186945","https://openalex.org/W2158899676","https://openalex.org/W2167141664","https://openalex.org/W3147752412","https://openalex.org/W6669833548","https://openalex.org/W6677925612","https://openalex.org/W6682278970"],"related_works":["https://openalex.org/W2138099459","https://openalex.org/W3092821848","https://openalex.org/W2259094912","https://openalex.org/W2981921644","https://openalex.org/W3201504882","https://openalex.org/W2066397066","https://openalex.org/W4380605435","https://openalex.org/W2015140512","https://openalex.org/W1987649265","https://openalex.org/W2371329481"],"abstract_inverted_index":{"A":[0,23,49],"low-power":[1],"in":[2,19],"situ":[3],"learner":[4,32,57],"circuit":[5,33,58],"is":[6,27,42],"presented":[7],"to":[8,34,62],"characterize":[9],"the":[10,31,45,56],"tradeoff":[11],"between":[12],"leakage":[13,40],"saving":[14,41],"and":[15,59,69],"transition":[16,46],"energy":[17,47],"overhead":[18],"power":[20],"gating":[21],"(PG).":[22],"self-adaptive":[24],"PG":[25,37,64],"scheme":[26],"demonstrated":[28],"that":[29],"utilizes":[30],"adaptively":[35],"invoke":[36],"only":[38],"when":[39],"more":[43],"than":[44],"overhead.":[48],"130-nm":[50],"test":[51],"chip":[52],"demonstrates":[53],"functionality":[54],"of":[55],"its":[60],"application":[61],"adaptive":[63],"under":[65],"varying":[66],"process,":[67],"temperature,":[68],"idle":[70],"signal":[71],"pattern.":[72]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}