{"id":"https://openalex.org/W2048162222","doi":"https://doi.org/10.1109/tcsii.2013.2281746","title":"A 0.45-V MOSFETs-Based Temperature Sensor Front-End in 90 nm CMOS With a Noncalibrated $\\pm \\hbox{3.5} \\ ^{\\circ}\\hbox{C} \\ \\hbox{3}\\sigma$ Relative Inaccuracy From $-\\hbox{55} \\ ^{\\circ}\\hbox{C}$ to 105 $^{\\circ}\\hbox{C}$","display_name":"A 0.45-V MOSFETs-Based Temperature Sensor Front-End in 90 nm CMOS With a Noncalibrated $\\pm \\hbox{3.5} \\ ^{\\circ}\\hbox{C} \\ \\hbox{3}\\sigma$ Relative Inaccuracy From $-\\hbox{55} \\ ^{\\circ}\\hbox{C}$ to 105 $^{\\circ}\\hbox{C}$","publication_year":2013,"publication_date":"2013-10-03","ids":{"openalex":"https://openalex.org/W2048162222","doi":"https://doi.org/10.1109/tcsii.2013.2281746","mag":"2048162222"},"language":"en","primary_location":{"id":"doi:10.1109/tcsii.2013.2281746","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2013.2281746","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009390861","display_name":"Li Lu","orcid":"https://orcid.org/0000-0002-4361-012X"},"institutions":[{"id":"https://openalex.org/I12315562","display_name":"Texas Tech University","ror":"https://ror.org/0405mnx93","country_code":"US","type":"education","lineage":["https://openalex.org/I12315562"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Li Lu","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Texas Tech University, Lubbock, TX, USA","[Dept. of Electr. & Comput. Eng., Texas Tech. Univ., Lubbock, TX, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Texas Tech University, Lubbock, TX, USA","institution_ids":["https://openalex.org/I12315562"]},{"raw_affiliation_string":"[Dept. of Electr. & Comput. Eng., Texas Tech. Univ., Lubbock, TX, USA]","institution_ids":["https://openalex.org/I12315562"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046417247","display_name":"Scott T. Block","orcid":null},"institutions":[{"id":"https://openalex.org/I12315562","display_name":"Texas Tech University","ror":"https://ror.org/0405mnx93","country_code":"US","type":"education","lineage":["https://openalex.org/I12315562"]},{"id":"https://openalex.org/I84218800","display_name":"University of California, Davis","ror":"https://ror.org/05rrcem69","country_code":"US","type":"education","lineage":["https://openalex.org/I84218800"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Scott T. Block","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of California, Davis, CA, USA","[Dept. of Electr. & Comput. Eng., Texas Tech. Univ., Lubbock, TX, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of California, Davis, CA, USA","institution_ids":["https://openalex.org/I84218800"]},{"raw_affiliation_string":"[Dept. of Electr. & Comput. Eng., Texas Tech. Univ., Lubbock, TX, USA]","institution_ids":["https://openalex.org/I12315562"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101664947","display_name":"D. Duarte","orcid":"https://orcid.org/0000-0001-8846-0324"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"David E. Duarte","raw_affiliation_strings":["Intel Corporation, Hillsboro, OR, USA","Intel Corporation, , Hillsboro, OR, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intel Corporation, Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Intel Corporation, , Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025738581","display_name":"Changzhi Li","orcid":"https://orcid.org/0000-0003-2188-4506"},"institutions":[{"id":"https://openalex.org/I12315562","display_name":"Texas Tech University","ror":"https://ror.org/0405mnx93","country_code":"US","type":"education","lineage":["https://openalex.org/I12315562"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Changzhi Li","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Texas Tech University, Lubbock, TX, USA","[Dept. of Electr. & Comput. Eng., Texas Tech. Univ., Lubbock, TX, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Texas Tech University, Lubbock, TX, USA","institution_ids":["https://openalex.org/I12315562"]},{"raw_affiliation_string":"[Dept. of Electr. & Comput. Eng., Texas Tech. Univ., Lubbock, TX, USA]","institution_ids":["https://openalex.org/I12315562"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.6803,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.8576252,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"60","issue":"11","first_page":"771","last_page":"775"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/subthreshold-conduction","display_name":"Subthreshold conduction","score":0.834140419960022},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5264987349510193},{"id":"https://openalex.org/keywords/sigma","display_name":"Sigma","score":0.5223380327224731},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.5163651704788208},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5043169260025024},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5003299713134766},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.4947206676006317},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4765634834766388},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4708554148674011},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.46805188059806824},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.45239442586898804},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.45079898834228516},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.44933199882507324},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3846234083175659},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.32516932487487793},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1463361382484436}],"concepts":[{"id":"https://openalex.org/C156465305","wikidata":"https://www.wikidata.org/wiki/Q1658601","display_name":"Subthreshold conduction","level":4,"score":0.834140419960022},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5264987349510193},{"id":"https://openalex.org/C2778049214","wikidata":"https://www.wikidata.org/wiki/Q7512234","display_name":"Sigma","level":2,"score":0.5223380327224731},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.5163651704788208},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5043169260025024},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5003299713134766},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.4947206676006317},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4765634834766388},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4708554148674011},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.46805188059806824},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.45239442586898804},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.45079898834228516},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.44933199882507324},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3846234083175659},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.32516932487487793},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1463361382484436},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsii.2013.2281746","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2013.2281746","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8600000143051147}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1965838897","https://openalex.org/W1987839639","https://openalex.org/W2055944305","https://openalex.org/W2090351433","https://openalex.org/W2092954710","https://openalex.org/W2120598409","https://openalex.org/W2149291081","https://openalex.org/W2197404263","https://openalex.org/W4247586331"],"related_works":["https://openalex.org/W2010066109","https://openalex.org/W2791897932","https://openalex.org/W2009852498","https://openalex.org/W2166758606","https://openalex.org/W2545707786","https://openalex.org/W2340131852","https://openalex.org/W1999741645","https://openalex.org/W1991521745","https://openalex.org/W3004587385","https://openalex.org/W4220771873"],"abstract_inverted_index":{"This":[0],"brief":[1],"presents":[2],"a":[3,13,92,119],"low-voltage":[4],"subthreshold":[5,22],"MOSFETs-based":[6],"scattered":[7],"relative":[8,99,136],"temperature":[9,122],"sensor":[10,55],"that":[11,77],"uses":[12],"simple":[14],"regulated":[15],"current":[16],"mirror":[17],"structure.":[18],"NMOSFETs":[19],"in":[20,91],"the":[21,45,64,67,78,109],"region":[23],"instead":[24],"of":[25],"bipolar":[26],"junction":[27],"transistors":[28],"are":[29,60,70,138],"used":[30],"as":[31],"sensing":[32],"devices":[33],"for":[34],"low":[35],"voltage":[36,82],"purpose.":[37],"Dynamic":[38],"element":[39],"matching":[40],"is":[41],"implemented":[42],"to":[43,89],"minimize":[44],"errors":[46],"induced":[47],"by":[48],"device":[49],"mismatches.":[50],"The":[51,96],"3":[52,54],"\u00d7":[53],"nodes":[56],"with":[57,127,140],"small":[58],"size":[59],"remotely":[61],"distributed":[62],"across":[63],"chip,":[65],"whereas":[66],"other":[68],"parts":[69],"centralized":[71],"and":[72,118,134],"shared.":[73],"Experimental":[74],"results":[75],"show":[76],"minimum":[79],"analog":[80],"supply":[81],"can":[83],"be":[84],"0.45":[85],"V":[86],"from":[87],"-55\u00b0C":[88],"105\u00b0C":[90],"90-nm":[93],"process":[94],"implementation.":[95,143],"measured":[97],"3\u03c3":[98],"inaccuracy":[100],"was":[101,124],"less":[102],"than":[103],"\u00b13.5\u00b0C":[104],"without":[105],"any":[106],"calibration.":[107],"Furthermore,":[108],"multilocation":[110],"thermal":[111],"monitoring":[112],"function":[113],"has":[114],"been":[115],"experimentally":[116],"demonstrated,":[117],"2.2\u00b0C/mm":[120],"on-chip":[121],"gradient":[123],"detected.":[125],"Compared":[126],"our":[128],"previous":[129],"design,":[130],"superior":[131],"line":[132],"sensitivity":[133],"comparable":[135],"accuracy":[137],"realized":[139],"simpler":[141],"circuit":[142]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":6},{"year":2014,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}