{"id":"https://openalex.org/W1991756600","doi":"https://doi.org/10.1109/tcsii.2012.2208676","title":"Implementing Concurrent Error Detection in Infinite-Impulse-Response Filters","display_name":"Implementing Concurrent Error Detection in Infinite-Impulse-Response Filters","publication_year":2012,"publication_date":"2012-08-01","ids":{"openalex":"https://openalex.org/W1991756600","doi":"https://doi.org/10.1109/tcsii.2012.2208676","mag":"1991756600"},"language":"en","primary_location":{"id":"doi:10.1109/tcsii.2012.2208676","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2012.2208676","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5080322790","display_name":"Pedro Reviriego","orcid":"https://orcid.org/0000-0003-2540-5234"},"institutions":[{"id":"https://openalex.org/I3020445194","display_name":"Universidad Nebrija","ror":"https://ror.org/03tzyrt94","country_code":"ES","type":"education","lineage":["https://openalex.org/I3020445194"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Pedro Reviriego","raw_affiliation_strings":["Universidad Antonio de Nebrija, Madrid, Spain","Univ. Antonio de Nebrija, Madrid, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universidad Antonio de Nebrija, Madrid, Spain","institution_ids":["https://openalex.org/I3020445194"]},{"raw_affiliation_string":"Univ. Antonio de Nebrija, Madrid, Spain","institution_ids":["https://openalex.org/I3020445194"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074611037","display_name":"O. Ruano","orcid":"https://orcid.org/0000-0001-8275-1745"},"institutions":[{"id":"https://openalex.org/I3020445194","display_name":"Universidad Nebrija","ror":"https://ror.org/03tzyrt94","country_code":"ES","type":"education","lineage":["https://openalex.org/I3020445194"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Oscar Ruano","raw_affiliation_strings":["Universidad Antonio de Nebrija, Madrid, Spain","Univ. Antonio de Nebrija, Madrid, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universidad Antonio de Nebrija, Madrid, Spain","institution_ids":["https://openalex.org/I3020445194"]},{"raw_affiliation_string":"Univ. Antonio de Nebrija, Madrid, Spain","institution_ids":["https://openalex.org/I3020445194"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5044495372","display_name":"Juan Antonio Maestro","orcid":"https://orcid.org/0000-0001-7133-9026"},"institutions":[{"id":"https://openalex.org/I3020445194","display_name":"Universidad Nebrija","ror":"https://ror.org/03tzyrt94","country_code":"ES","type":"education","lineage":["https://openalex.org/I3020445194"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Juan Antonio Maestro","raw_affiliation_strings":["Universidad Antonio de Nebrija, Madrid, Spain","Univ. Antonio de Nebrija, Madrid, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universidad Antonio de Nebrija, Madrid, Spain","institution_ids":["https://openalex.org/I3020445194"]},{"raw_affiliation_string":"Univ. Antonio de Nebrija, Madrid, Spain","institution_ids":["https://openalex.org/I3020445194"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I3020445194"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.0679282,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":"59","issue":"9","first_page":"583","last_page":"586"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/infinite-impulse-response","display_name":"Infinite impulse response","score":0.9004966020584106},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6492996215820312},{"id":"https://openalex.org/keywords/finite-impulse-response","display_name":"Finite impulse response","score":0.5987507700920105},{"id":"https://openalex.org/keywords/digital-filter","display_name":"Digital filter","score":0.5676929950714111},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.5012905597686768},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.47223588824272156},{"id":"https://openalex.org/keywords/impulse","display_name":"Impulse (physics)","score":0.45250970125198364},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4480670392513275},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.44789889454841614},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.4351111948490143},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.42297452688217163},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.2875540256500244},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.19256144762039185},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18182066082954407},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1647854745388031},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.11532050371170044},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.0703904926776886}],"concepts":[{"id":"https://openalex.org/C183816354","wikidata":"https://www.wikidata.org/wiki/Q665617","display_name":"Infinite impulse response","level":4,"score":0.9004966020584106},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6492996215820312},{"id":"https://openalex.org/C198386975","wikidata":"https://www.wikidata.org/wiki/Q117785","display_name":"Finite impulse response","level":2,"score":0.5987507700920105},{"id":"https://openalex.org/C36390408","wikidata":"https://www.wikidata.org/wiki/Q1163067","display_name":"Digital filter","level":3,"score":0.5676929950714111},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.5012905597686768},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.47223588824272156},{"id":"https://openalex.org/C70836080","wikidata":"https://www.wikidata.org/wiki/Q837940","display_name":"Impulse (physics)","level":2,"score":0.45250970125198364},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4480670392513275},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.44789889454841614},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.4351111948490143},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.42297452688217163},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2875540256500244},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.19256144762039185},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18182066082954407},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1647854745388031},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.11532050371170044},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.0703904926776886},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsii.2012.2208676","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2012.2208676","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","score":0.5600000023841858,"display_name":"Peace, Justice and strong institutions"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320320366","display_name":"European Cooperation in Science and Technology","ror":"https://ror.org/01bstzn19"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1497850294","https://openalex.org/W1950019833","https://openalex.org/W1996708669","https://openalex.org/W2011632282","https://openalex.org/W2017284812","https://openalex.org/W2042544282","https://openalex.org/W2062470986","https://openalex.org/W2115722171","https://openalex.org/W2120000030","https://openalex.org/W2125139996","https://openalex.org/W2130686068","https://openalex.org/W2130688260","https://openalex.org/W2137808865","https://openalex.org/W2152652532","https://openalex.org/W2156339821","https://openalex.org/W2160451204","https://openalex.org/W2169250333","https://openalex.org/W2170346295","https://openalex.org/W2478884216","https://openalex.org/W2541459823"],"related_works":["https://openalex.org/W4312785053","https://openalex.org/W2142009384","https://openalex.org/W3140661709","https://openalex.org/W2021631062","https://openalex.org/W3138047207","https://openalex.org/W2810377961","https://openalex.org/W2031892245","https://openalex.org/W3208746183","https://openalex.org/W2898725502","https://openalex.org/W2058863651"],"abstract_inverted_index":{"Advanced":[0],"electronic":[1,36],"circuits":[2],"suffer":[3,25],"errors":[4,51],"caused":[5],"by":[6],"multiple":[7],"sources.":[8],"For":[9],"example,":[10],"radiation":[11],"can":[12,19,107,140],"induce":[13],"transient":[14],"errors,":[15],"and":[16,46,92],"manufacturing":[17],"variations":[18],"cause":[20],"some":[21],"devices":[22],"to":[23,79],"sporadically":[24],"errors.":[26,110,143],"Fault":[27],"tolerance":[28],"is":[29,90,97,113,130],"therefore":[30],"an":[31],"important":[32],"issue":[33],"in":[34,43,84],"advanced":[35],"circuits.":[37],"Digital":[38],"filters":[39,59,86],"are":[40],"commonly":[41],"used":[42],"many":[44],"applications,":[45],"therefore,":[47],"their":[48],"protection":[49,95],"against":[50],"has":[52],"been":[53],"widely":[54],"studied.":[55],"However,":[56],"infinite-impulse-response":[57],"(IIR)":[58],"have":[60],"received":[61],"little":[62],"attention":[63],"as":[64],"most":[65],"of":[66,135],"the":[67,116,127],"existing":[68],"works":[69],"focus":[70],"on":[71],"finite-impulse-response":[72],"filters.":[73],"In":[74],"this":[75],"brief,":[76],"a":[77,120,136],"technique":[78],"implement":[80],"concurrent":[81],"error":[82],"detection":[83],"IIR":[85],"with":[87],"programmable":[88],"coefficients":[89],"proposed":[91],"evaluated.":[93],"The":[94,111,123],"effectiveness":[96],"assessed":[98],"through":[99],"fault":[100],"injection":[101],"experiments":[102],"that":[103,105,126,134,139],"show":[104,125],"it":[106],"efficiently":[108],"detect":[109,142],"cost":[112],"estimated":[114],"using":[115],"synthesis":[117],"results":[118,124],"for":[119],"45-nm":[121],"library.":[122],"area":[128],"overhead":[129],"much":[131],"lower":[132],"than":[133],"duplicated":[137],"system":[138],"also":[141]},"counts_by_year":[{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}