{"id":"https://openalex.org/W2108295664","doi":"https://doi.org/10.1109/tcsii.2010.2087972","title":"A Frequency Model of a Continuously Driven Clocked CMOS Comparator","display_name":"A Frequency Model of a Continuously Driven Clocked CMOS Comparator","publication_year":2010,"publication_date":"2010-12-01","ids":{"openalex":"https://openalex.org/W2108295664","doi":"https://doi.org/10.1109/tcsii.2010.2087972","mag":"2108295664"},"language":"en","primary_location":{"id":"doi:10.1109/tcsii.2010.2087972","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2010.2087972","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5049285154","display_name":"Shunsuke Okura","orcid":"https://orcid.org/0000-0001-6422-3703"},"institutions":[{"id":"https://openalex.org/I98285908","display_name":"Osaka University","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Shunsuke Okura","raw_affiliation_strings":["Graduate School of Engineering, Osaka University, Suita, Japan","Grad. Sch. of Eng., Osaka Univ., Suita, Japan#TAB#"],"affiliations":[{"raw_affiliation_string":"Graduate School of Engineering, Osaka University, Suita, Japan","institution_ids":["https://openalex.org/I98285908"]},{"raw_affiliation_string":"Grad. Sch. of Eng., Osaka Univ., Suita, Japan#TAB#","institution_ids":["https://openalex.org/I98285908"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102837979","display_name":"Hajime Shibata","orcid":"https://orcid.org/0000-0001-5333-4619"},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hajime Shibata","raw_affiliation_strings":["Analog Devices, Inc., Toronto, Canada","Analog Devices, Inc., Toronto, ON, Canada#TAB#"],"affiliations":[{"raw_affiliation_string":"Analog Devices, Inc., Toronto, Canada","institution_ids":[]},{"raw_affiliation_string":"Analog Devices, Inc., Toronto, ON, Canada#TAB#","institution_ids":["https://openalex.org/I117023288"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009591274","display_name":"Tetsuro Okura","orcid":null},"institutions":[{"id":"https://openalex.org/I98285908","display_name":"Osaka University","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tetsuro Okura","raw_affiliation_strings":["Graduate School of Engineering, Osaka University, Suita, Japan","Grad. Sch. of Eng., Osaka Univ., Suita, Japan#TAB#"],"affiliations":[{"raw_affiliation_string":"Graduate School of Engineering, Osaka University, Suita, Japan","institution_ids":["https://openalex.org/I98285908"]},{"raw_affiliation_string":"Grad. Sch. of Eng., Osaka Univ., Suita, Japan#TAB#","institution_ids":["https://openalex.org/I98285908"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019479222","display_name":"Toru Ido","orcid":null},"institutions":[{"id":"https://openalex.org/I98285908","display_name":"Osaka University","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toru Ido","raw_affiliation_strings":["Graduate School of Engineering, Osaka University, Suita, Japan","Grad. Sch. of Eng., Osaka Univ., Suita, Japan#TAB#"],"affiliations":[{"raw_affiliation_string":"Graduate School of Engineering, Osaka University, Suita, Japan","institution_ids":["https://openalex.org/I98285908"]},{"raw_affiliation_string":"Grad. Sch. of Eng., Osaka Univ., Suita, Japan#TAB#","institution_ids":["https://openalex.org/I98285908"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5082049451","display_name":"Kenji Taniguchi","orcid":"https://orcid.org/0000-0001-5980-1943"},"institutions":[{"id":"https://openalex.org/I98285908","display_name":"Osaka University","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kenji Taniguchi","raw_affiliation_strings":["Graduate School of Engineering, Osaka University, Suita, Japan","Grad. Sch. of Eng., Osaka Univ., Suita, Japan#TAB#"],"affiliations":[{"raw_affiliation_string":"Graduate School of Engineering, Osaka University, Suita, Japan","institution_ids":["https://openalex.org/I98285908"]},{"raw_affiliation_string":"Grad. Sch. of Eng., Osaka Univ., Suita, Japan#TAB#","institution_ids":["https://openalex.org/I98285908"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5049285154"],"corresponding_institution_ids":["https://openalex.org/I98285908"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.16321228,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":"57","issue":"12","first_page":"956","last_page":"960"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.8953633308410645},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6965852975845337},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4352053999900818},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.41064804792404175},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.29413914680480957},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.19201263785362244},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19038435816764832}],"concepts":[{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.8953633308410645},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6965852975845337},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4352053999900818},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.41064804792404175},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.29413914680480957},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.19201263785362244},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19038435816764832}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsii.2010.2087972","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2010.2087972","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6299999952316284,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1535865601","https://openalex.org/W1588951598","https://openalex.org/W1592506358","https://openalex.org/W1597620877","https://openalex.org/W2007869592","https://openalex.org/W2033774726","https://openalex.org/W2077381766","https://openalex.org/W2105264385","https://openalex.org/W2112127942","https://openalex.org/W2118530541","https://openalex.org/W2123716779","https://openalex.org/W2128223917","https://openalex.org/W2139324665","https://openalex.org/W2147887812","https://openalex.org/W2149576061","https://openalex.org/W2163099566","https://openalex.org/W2166582703","https://openalex.org/W2988632144","https://openalex.org/W4214744378"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2034349229","https://openalex.org/W2044867305","https://openalex.org/W3161676474","https://openalex.org/W2049207285","https://openalex.org/W1965493748","https://openalex.org/W2922086473","https://openalex.org/W4385452214","https://openalex.org/W2109445684"],"abstract_inverted_index":{"A":[0],"frequency":[1,59],"model":[2,22,27,71,80],"of":[3,13,33,56,69,88],"a":[4,24,54,82],"continuously":[5],"driven":[6],"clocked":[7],"CMOS":[8],"comparator":[9],"with":[10,63],"the":[11,14,30,34,39,42,46,64,70,86],"effect":[12],"input":[15,57],"signal":[16,58],"during":[17],"regeneration":[18,47],"is":[19,53,61,72],"presented.":[20],"The":[21,49,67,79],"utilizes":[23],"small-signal":[25],"linear":[26],"derived":[28],"from":[29,41],"theoretical":[31],"analysis":[32],"comparison":[35,50],"error":[36,51],"caused":[37],"by":[38,74],"transition":[40],"tracking":[43],"mode":[44],"to":[45],"mode.":[48],"voltage":[52],"function":[55],"and":[60],"represented":[62],"transfer":[65],"function.":[66],"correctness":[68],"assured":[73],"several":[75],"transistor-level":[76],"simulation":[77],"results.":[78],"provides":[81],"valuable":[83],"insight":[84],"for":[85],"design":[87],"high-speed":[89],"comparators.":[90]},"counts_by_year":[{"year":2014,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}