{"id":"https://openalex.org/W2119866965","doi":"https://doi.org/10.1109/tcsii.2009.2020948","title":"A Leakage-Compensated PLL in 65-nm CMOS Technology","display_name":"A Leakage-Compensated PLL in 65-nm CMOS Technology","publication_year":2009,"publication_date":"2009-06-16","ids":{"openalex":"https://openalex.org/W2119866965","doi":"https://doi.org/10.1109/tcsii.2009.2020948","mag":"2119866965"},"language":"en","primary_location":{"id":"doi:10.1109/tcsii.2009.2020948","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2009.2020948","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102148648","display_name":"Chao-Ching Hung","orcid":null},"institutions":[{"id":"https://openalex.org/I16733864","display_name":"National Taiwan University","ror":"https://ror.org/05bqach95","country_code":"TW","type":"education","lineage":["https://openalex.org/I16733864"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Chao-Ching Hung","raw_affiliation_strings":["Graduate Institute of Electronics Engineering and the Department of Electrical Engineering, National Taiwan University, Taipei, Taiwan","Dept. of Electr. Eng.. Nat. Taiwan Univ., Taipei, Taiwan"],"affiliations":[{"raw_affiliation_string":"Graduate Institute of Electronics Engineering and the Department of Electrical Engineering, National Taiwan University, Taipei, Taiwan","institution_ids":["https://openalex.org/I16733864"]},{"raw_affiliation_string":"Dept. of Electr. Eng.. Nat. Taiwan Univ., Taipei, Taiwan","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109111769","display_name":"Shen-Iuan Liu","orcid":null},"institutions":[{"id":"https://openalex.org/I16733864","display_name":"National Taiwan University","ror":"https://ror.org/05bqach95","country_code":"TW","type":"education","lineage":["https://openalex.org/I16733864"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Shen-Iuan Liu","raw_affiliation_strings":["Graduate Institute of Electronics Engineering and the Department of Electrical Engineering, National Taiwan University, Taipei, Taiwan","Dept. of Electr. Eng.. Nat. Taiwan Univ., Taipei, Taiwan"],"affiliations":[{"raw_affiliation_string":"Graduate Institute of Electronics Engineering and the Department of Electrical Engineering, National Taiwan University, Taipei, Taiwan","institution_ids":["https://openalex.org/I16733864"]},{"raw_affiliation_string":"Dept. of Electr. Eng.. Nat. Taiwan Univ., Taipei, Taiwan","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5102148648"],"corresponding_institution_ids":["https://openalex.org/I16733864"],"apc_list":null,"apc_paid":null,"fwci":2.6917,"has_fulltext":false,"cited_by_count":20,"citation_normalized_percentile":{"value":0.90380651,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"56","issue":"7","first_page":"525","last_page":"529"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7920761108398438},{"id":"https://openalex.org/keywords/phase-locked-loop","display_name":"Phase-locked loop","score":0.7849969267845154},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.77675461769104},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.6280434727668762},{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.598693311214447},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.509486973285675},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.45729199051856995},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.38133904337882996},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3631021976470947},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.255393385887146}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7920761108398438},{"id":"https://openalex.org/C12707504","wikidata":"https://www.wikidata.org/wiki/Q52637","display_name":"Phase-locked loop","level":3,"score":0.7849969267845154},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.77675461769104},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.6280434727668762},{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.598693311214447},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.509486973285675},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.45729199051856995},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.38133904337882996},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3631021976470947},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.255393385887146},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsii.2009.2020948","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2009.2020948","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.47999998927116394,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320322410","display_name":"MediaTek","ror":"https://ror.org/05g9jck81"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1581600025","https://openalex.org/W2005342100","https://openalex.org/W2007378435","https://openalex.org/W2078542605","https://openalex.org/W2095776198","https://openalex.org/W2113996606","https://openalex.org/W2114953806","https://openalex.org/W2118269375","https://openalex.org/W2151823615","https://openalex.org/W2152478570","https://openalex.org/W2156757728","https://openalex.org/W4250400665","https://openalex.org/W6683250056"],"related_works":["https://openalex.org/W2121182846","https://openalex.org/W2315668284","https://openalex.org/W2155789024","https://openalex.org/W2109491806","https://openalex.org/W3213608175","https://openalex.org/W2058044441","https://openalex.org/W3117675750","https://openalex.org/W2141743053","https://openalex.org/W3095633856","https://openalex.org/W2139484866"],"abstract_inverted_index":{"A":[0],"leakage":[1,12,23],"compensation":[2,24],"technique":[3],"is":[4,30,39,51],"presented":[5],"to":[6,32],"compensate":[7],"the":[8,22,26,36,48],"on-chip":[9],"loop":[10],"filter":[11],"for":[13],"phase-locked":[14],"loops":[15],"in":[16],"65-nm":[17],"complementary":[18],"metal-oxide-semiconductor":[19],"technology.":[20],"Using":[21],"technique,":[25],"measured":[27],"root-mean-square":[28],"jitter":[29],"reduced":[31],"3.10":[33],"ps":[34],"when":[35],"output":[37],"frequency":[38],"950":[40],"MHz.":[41],"This":[42],"chip":[43],"consumes":[44],"10":[45],"mW,":[46],"and":[47],"active":[49],"area":[50],"0.14":[52],"mm":[53],"<sup":[54],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[55],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[56],".":[57]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":5},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}