{"id":"https://openalex.org/W2151459954","doi":"https://doi.org/10.1109/tcsii.2008.2010168","title":"Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults","display_name":"Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults","publication_year":2009,"publication_date":"2009-01-01","ids":{"openalex":"https://openalex.org/W2151459954","doi":"https://doi.org/10.1109/tcsii.2008.2010168","mag":"2151459954"},"language":"en","primary_location":{"id":"doi:10.1109/tcsii.2008.2010168","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2008.2010168","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113554932","display_name":"Jae\u2010Hoon Song","orcid":"https://orcid.org/0009-0006-9652-3595"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Jaehoon Song","raw_affiliation_strings":["Department of Computer Science and Engineering, Hanyang University, Ansan, Gyeonggi, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, Hanyang University, Ansan, Gyeonggi, South Korea","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101860578","display_name":"Juhee Han","orcid":null},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Juhee Han","raw_affiliation_strings":["Department of Computer Science and Engineering, Hanyang University, Ansan, Gyeonggi, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, Hanyang University, Ansan, Gyeonggi, South Korea","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033133401","display_name":"Hyunbean Yi","orcid":"https://orcid.org/0009-0008-9895-5708"},"institutions":[{"id":"https://openalex.org/I24603500","display_name":"University of Massachusetts Amherst","ror":"https://ror.org/0072zz521","country_code":"US","type":"education","lineage":["https://openalex.org/I24603500"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hyunbean Yi","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA, USA","institution_ids":["https://openalex.org/I24603500"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061481060","display_name":"Taejin Jung","orcid":"https://orcid.org/0000-0001-7413-806X"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Taejin Jung","raw_affiliation_strings":["Department of Computer Science and Engineering, Hanyang University, Ansan, Gyeonggi, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, Hanyang University, Ansan, Gyeonggi, South Korea","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5000375941","display_name":"Sungju Park","orcid":"https://orcid.org/0000-0003-2322-232X"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sungju Park","raw_affiliation_strings":["Department of Computer Science and Engineering, Hanyang University, Ansan, Gyeonggi, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, Hanyang University, Ansan, Gyeonggi, South Korea","institution_ids":["https://openalex.org/I4575257"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5113554932"],"corresponding_institution_ids":["https://openalex.org/I4575257"],"apc_list":null,"apc_paid":null,"fwci":1.3191,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.8224963,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"56","issue":"1","first_page":"56","last_page":"60"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/crosstalk","display_name":"Crosstalk","score":0.8723723292350769},{"id":"https://openalex.org/keywords/interconnection","display_name":"Interconnection","score":0.5610076785087585},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.42466896772384644},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16557016968727112},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.15782493352890015},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.13468563556671143}],"concepts":[{"id":"https://openalex.org/C169822122","wikidata":"https://www.wikidata.org/wiki/Q230187","display_name":"Crosstalk","level":2,"score":0.8723723292350769},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.5610076785087585},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.42466896772384644},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16557016968727112},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.15782493352890015},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.13468563556671143}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsii.2008.2010168","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2008.2010168","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.800000011920929,"id":"https://metadata.un.org/sdg/16","display_name":"Peace, Justice and strong institutions"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1556099140","https://openalex.org/W2032266940","https://openalex.org/W2096691973","https://openalex.org/W2097171064","https://openalex.org/W2098977057","https://openalex.org/W2103047620","https://openalex.org/W2105571234","https://openalex.org/W2106433082","https://openalex.org/W2120252860","https://openalex.org/W2120599201","https://openalex.org/W2121190650","https://openalex.org/W2145515320","https://openalex.org/W2146431073","https://openalex.org/W2150153665","https://openalex.org/W2152076855","https://openalex.org/W2164152101","https://openalex.org/W2166575140","https://openalex.org/W4242674290","https://openalex.org/W6675623549","https://openalex.org/W6681526756"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2622826586","https://openalex.org/W2167472940","https://openalex.org/W2155019192","https://openalex.org/W2390279801","https://openalex.org/W2014709025","https://openalex.org/W2358668433","https://openalex.org/W4280525841","https://openalex.org/W2376932109","https://openalex.org/W1551902604"],"abstract_inverted_index":{"The":[0,79],"effect":[1],"of":[2,53],"crosstalk-induced":[3],"errors":[4],"becomes":[5],"more":[6],"significant":[7],"in":[8],"high-performance":[9],"circuits":[10],"and":[11,25,84],"systems.":[12],"In":[13],"this":[14],"paper,":[15],"compact":[16],"crosstalk":[17,85],"test":[18,80],"patterns":[19,55],"are":[20,56,87],"introduced":[21],"for":[22,82],"a":[23,60],"system-on-a-chip":[24],"board":[26],"level":[27],"interconnects":[28],"considering":[29],"physically":[30],"effective":[31,74],"aggressors.":[32],"By":[33],"being":[34],"able":[35],"to":[36,59],"target":[37],"multiple":[38],"victim":[39],"lines,":[40],"6":[41,63,91],"<i":[42,47,64,69,92],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[43,48,65,70,93],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">n</i>":[44,49],",":[45,67],"where":[46,68],"is":[50],"the":[51,73],"number":[52,62],"nets":[54],"drastically":[57],"reduced":[58],"constant":[61],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">D</i>":[66,71,94],"indicates":[72],"distance":[75],"among":[76],"interconnect":[77],"nets.":[78],"quality":[81],"static":[83],"faults":[86],"completely":[88],"preserved":[89],"with":[90],"patterns.":[95]},"counts_by_year":[{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}