{"id":"https://openalex.org/W2157692794","doi":"https://doi.org/10.1109/tcsii.2004.827555","title":"A 2.5-V 10-b 120-MSample/s CMOS pipelined ADC based on merged-capacitor switching","display_name":"A 2.5-V 10-b 120-MSample/s CMOS pipelined ADC based on merged-capacitor switching","publication_year":2004,"publication_date":"2004-05-01","ids":{"openalex":"https://openalex.org/W2157692794","doi":"https://doi.org/10.1109/tcsii.2004.827555","mag":"2157692794"},"language":"en","primary_location":{"id":"doi:10.1109/tcsii.2004.827555","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2004.827555","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043660353","display_name":"Sang-Min Yoo","orcid":"https://orcid.org/0000-0002-8429-2666"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]},{"id":"https://openalex.org/I148751991","display_name":"Sogang University","ror":"https://ror.org/056tn4839","country_code":"KR","type":"education","lineage":["https://openalex.org/I148751991"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Sang-Min Yoo","raw_affiliation_strings":["Dept. of Electron. Eng., Sogang Univ., Seoul, South Korea","Samsung Electronics Company Limited, Yongin si, South Korea","Sogang University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Dept. of Electron. Eng., Sogang Univ., Seoul, South Korea","institution_ids":["https://openalex.org/I148751991"]},{"raw_affiliation_string":"Samsung Electronics Company Limited, Yongin si, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Sogang University, Seoul, South Korea","institution_ids":["https://openalex.org/I148751991"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103476496","display_name":"Jong-Bum Park","orcid":null},"institutions":[{"id":"https://openalex.org/I148751991","display_name":"Sogang University","ror":"https://ror.org/056tn4839","country_code":"KR","type":"education","lineage":["https://openalex.org/I148751991"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jong-Bum Park","raw_affiliation_strings":["Dept. of Electron. Eng., Sogang Univ., Seoul, South Korea","Department of Electronic Engineering, Sogang University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Dept. of Electron. Eng., Sogang Univ., Seoul, South Korea","institution_ids":["https://openalex.org/I148751991"]},{"raw_affiliation_string":"Department of Electronic Engineering, Sogang University, Seoul, South Korea","institution_ids":["https://openalex.org/I148751991"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100399228","display_name":"Seung\u2010Hoon Lee","orcid":"https://orcid.org/0000-0002-1937-0074"},"institutions":[{"id":"https://openalex.org/I148751991","display_name":"Sogang University","ror":"https://ror.org/056tn4839","country_code":"KR","type":"education","lineage":["https://openalex.org/I148751991"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seung-Hoon Lee","raw_affiliation_strings":["Dept. of Electron. Eng., Sogang Univ., Seoul, South Korea","Department of Electronic Engineering, Sogang University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Dept. of Electron. Eng., Sogang Univ., Seoul, South Korea","institution_ids":["https://openalex.org/I148751991"]},{"raw_affiliation_string":"Department of Electronic Engineering, Sogang University, Seoul, South Korea","institution_ids":["https://openalex.org/I148751991"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5005450048","display_name":"Un-Ku Moon","orcid":"https://orcid.org/0000-0003-1948-057X"},"institutions":[{"id":"https://openalex.org/I131249849","display_name":"Oregon State University","ror":"https://ror.org/00ysfqy60","country_code":"US","type":"education","lineage":["https://openalex.org/I131249849"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Un-Ku Moon","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Oregon State University, Corvallis, OR, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Oregon State University, Corvallis, OR, USA","institution_ids":["https://openalex.org/I131249849"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5043660353"],"corresponding_institution_ids":["https://openalex.org/I148751991","https://openalex.org/I2250650973"],"apc_list":null,"apc_paid":null,"fwci":1.1446,"has_fulltext":false,"cited_by_count":35,"citation_normalized_percentile":{"value":0.78899401,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"51","issue":"5","first_page":"269","last_page":"275"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spurious-free-dynamic-range","display_name":"Spurious-free dynamic range","score":0.9107675552368164},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7581838369369507},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.7312278747558594},{"id":"https://openalex.org/keywords/nyquist-frequency","display_name":"Nyquist frequency","score":0.5333419442176819},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.5132534503936768},{"id":"https://openalex.org/keywords/least-significant-bit","display_name":"Least significant bit","score":0.48849785327911377},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4854481816291809},{"id":"https://openalex.org/keywords/switched-capacitor","display_name":"Switched capacitor","score":0.4721111059188843},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.44923266768455505},{"id":"https://openalex.org/keywords/12-bit","display_name":"12-bit","score":0.4275554418563843},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.4268905818462372},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.26701003313064575},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2588520646095276},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.223213791847229}],"concepts":[{"id":"https://openalex.org/C119293636","wikidata":"https://www.wikidata.org/wiki/Q657480","display_name":"Spurious-free dynamic range","level":3,"score":0.9107675552368164},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7581838369369507},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.7312278747558594},{"id":"https://openalex.org/C98273374","wikidata":"https://www.wikidata.org/wiki/Q1501757","display_name":"Nyquist frequency","level":3,"score":0.5333419442176819},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.5132534503936768},{"id":"https://openalex.org/C4305246","wikidata":"https://www.wikidata.org/wiki/Q3885225","display_name":"Least significant bit","level":2,"score":0.48849785327911377},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4854481816291809},{"id":"https://openalex.org/C103357873","wikidata":"https://www.wikidata.org/wiki/Q572656","display_name":"Switched capacitor","level":4,"score":0.4721111059188843},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.44923266768455505},{"id":"https://openalex.org/C2776310492","wikidata":"https://www.wikidata.org/wiki/Q3271420","display_name":"12-bit","level":3,"score":0.4275554418563843},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.4268905818462372},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.26701003313064575},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2588520646095276},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.223213791847229},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsii.2004.827555","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsii.2004.827555","pdf_url":null,"source":{"id":"https://openalex.org/S93916849","display_name":"IEEE Transactions on Circuits & Systems II Express Briefs","issn_l":"1549-7747","issn":["1549-7747","1558-3791"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems II: Express Briefs","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8500000238418579,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1508290519","https://openalex.org/W1519675775","https://openalex.org/W1536704551","https://openalex.org/W1560969784","https://openalex.org/W1631370707","https://openalex.org/W1646531973","https://openalex.org/W2062039105","https://openalex.org/W2097559264","https://openalex.org/W2098414328","https://openalex.org/W2101468035","https://openalex.org/W2107148248","https://openalex.org/W2107547890","https://openalex.org/W2118524348","https://openalex.org/W2138305447","https://openalex.org/W2152434001","https://openalex.org/W2171787697","https://openalex.org/W2565173170","https://openalex.org/W4253725874","https://openalex.org/W4254825310"],"related_works":["https://openalex.org/W2054018984","https://openalex.org/W2739351926","https://openalex.org/W4387941295","https://openalex.org/W2542593952","https://openalex.org/W2565946164","https://openalex.org/W2568520569","https://openalex.org/W1980428113","https://openalex.org/W3116897448","https://openalex.org/W4307567705","https://openalex.org/W2783221760"],"abstract_inverted_index":{"This":[0],"work":[1],"describes":[2],"a":[3,44,62,122,139],"10-b":[4],"multibit-per-stage":[5],"pipelined":[6],"CMOS":[7,125],"analog-to-digital":[8],"converter":[9],"(ADC)":[10],"incorporating":[11],"the":[12,22,29,33,52,106],"merged-capacitor":[13],"switching":[14,65],"(MCS)":[15],"technique.":[16,67],"The":[17,47,68,99,118],"proposed":[18,53],"MCS":[19,54],"technique":[20,55],"improves":[21],"signal":[23],"processing":[24],"speed":[25],"and":[26,81,84,102,113,134],"resolution":[27,49],"of":[28,36,105,130],"ADC":[30,48,70,119],"by":[31,39,60],"reducing":[32],"required":[34],"number":[35],"unit":[37],"capacitors":[38],"half":[40],"in":[41,121],"comparison":[42],"to":[43,94],"conventional":[45],"ADC.":[46],"based":[50],"on":[51],"can":[56],"be":[57],"extended":[58],"further":[59],"employing":[61],"commutated":[63],"feedback-capacitor":[64],"(CFCS)":[66],"prototype":[69,107],"achieves":[71],"better":[72],"than":[73],"53-dB":[74],"signal-to-noise-and-distortion":[75],"ratio":[76],"(SNDR)":[77],"at":[78,96],"120":[79],"MSample/s":[80],"54-dB":[82],"SNDR":[83],"68-dB":[85],"spurious-free":[86],"dynamic":[87],"range":[88],"(SFDR)":[89],"for":[90],"input":[91],"frequencies":[92],"up":[93],"Nyquist":[95],"100":[97],"MSample/s.":[98],"measured":[100],"differential":[101],"integral":[103],"nonlinearities":[104],"are":[108],"within":[109],"/spl":[110,114],"plusmn/0.40":[111],"LSB":[112],"plusmn/0.48":[115],"LSB,":[116],"respectively.":[117],"fabricated":[120],"0.25-/spl":[123],"mu/m":[124],"occupies":[126],"3.6":[127],"mm/sup":[128],"2/":[129],"active":[131],"die":[132],"area":[133],"consumes":[135],"208":[136],"mW":[137],"under":[138],"2.5-V":[140],"power":[141],"supply.":[142]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":3},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2012,"cited_by_count":5}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}