{"id":"https://openalex.org/W7128316030","doi":"https://doi.org/10.1109/tcsi.2026.3658356","title":"An Always-On Event-Triggered DVS Fall Detection Processor With Precision-Adaptive Inference in 40-nm CMOS","display_name":"An Always-On Event-Triggered DVS Fall Detection Processor With Precision-Adaptive Inference in 40-nm CMOS","publication_year":2026,"publication_date":"2026-02-06","ids":{"openalex":"https://openalex.org/W7128316030","doi":"https://doi.org/10.1109/tcsi.2026.3658356"},"language":null,"primary_location":{"id":"doi:10.1109/tcsi.2026.3658356","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2026.3658356","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Ziyi Yang","orcid":"https://orcid.org/0009-0003-9141-0661"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ziyi Yang","raw_affiliation_strings":["State Key Laboratory of Integrated Chips and Systems, College of Future Information Technology, Fudan University, Shanghai, China"],"raw_orcid":"https://orcid.org/0009-0003-9141-0661","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Integrated Chips and Systems, College of Future Information Technology, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112952138","display_name":"Yushi Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yushi Wang","raw_affiliation_strings":["State Key Laboratory of Integrated Chips and Systems, College of Future Information Technology, Fudan University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Integrated Chips and Systems, College of Future Information Technology, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101293698","display_name":"Jinqiao Yang","orcid":null},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinqiao Yang","raw_affiliation_strings":["State Key Laboratory of Integrated Chips and Systems, College of Future Information Technology, Fudan University, Shanghai, China"],"raw_orcid":"https://orcid.org/0009-0007-9015-2938","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Integrated Chips and Systems, College of Future Information Technology, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114185779","display_name":"Quanshu Yan","orcid":null},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Quanshu Yan","raw_affiliation_strings":["State Key Laboratory of Integrated Chips and Systems, College of Future Information Technology, Fudan University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Integrated Chips and Systems, College of Future Information Technology, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114202103","display_name":"Anqin Xiao","orcid":null},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Anqin Xiao","raw_affiliation_strings":["State Key Laboratory of Integrated Chips and Systems, College of Future Information Technology, Fudan University, Shanghai, China"],"raw_orcid":"https://orcid.org/0009-0000-5390-4335","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Integrated Chips and Systems, College of Future Information Technology, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5125349461","display_name":"Li-Rong Zheng","orcid":null},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Li-Rong Zheng","raw_affiliation_strings":["State Key Laboratory of Integrated Chips and Systems, College of Future Information Technology, Fudan University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0001-9588-0239","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Integrated Chips and Systems, College of Future Information Technology, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"last","author":{"id":null,"display_name":"Zhuo Zou","orcid":"https://orcid.org/0000-0002-8546-1329"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhuo Zou","raw_affiliation_strings":["State Key Laboratory of Integrated Chips and Systems, College of Future Information Technology, Fudan University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-8546-1329","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Integrated Chips and Systems, College of Future Information Technology, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I24943067"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.13312723,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"73","issue":"5","first_page":"3296","last_page":"3309"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.34940001368522644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.34940001368522644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.22269999980926514,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.09960000216960907,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6141999959945679},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.33059999346733093},{"id":"https://openalex.org/keywords/signal-processing","display_name":"Signal processing","score":0.3174000084400177},{"id":"https://openalex.org/keywords/circuit-design","display_name":"Circuit design","score":0.31630000472068787},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.30300000309944153},{"id":"https://openalex.org/keywords/digital-filter","display_name":"Digital filter","score":0.26420000195503235}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6371999979019165},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6141999959945679},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4553000032901764},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.33059999346733093},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.3174000084400177},{"id":"https://openalex.org/C190560348","wikidata":"https://www.wikidata.org/wiki/Q3245116","display_name":"Circuit design","level":2,"score":0.31630000472068787},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.30300000309944153},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.28459998965263367},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.2825999855995178},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.2655999958515167},{"id":"https://openalex.org/C36390408","wikidata":"https://www.wikidata.org/wiki/Q1163067","display_name":"Digital filter","level":3,"score":0.26420000195503235},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.25859999656677246},{"id":"https://openalex.org/C2776214188","wikidata":"https://www.wikidata.org/wiki/Q408386","display_name":"Inference","level":2,"score":0.25600001215934753},{"id":"https://openalex.org/C2989121073","wikidata":"https://www.wikidata.org/wiki/Q1309019","display_name":"Transient analysis","level":3,"score":0.2549999952316284},{"id":"https://openalex.org/C74524168","wikidata":"https://www.wikidata.org/wiki/Q1074539","display_name":"Integrated circuit design","level":2,"score":0.2513999938964844}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2026.3658356","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2026.3658356","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3219446551","display_name":null,"funder_award_id":"62476062","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320329902","display_name":"Shanghai Platform for Neuromorphic and AI Chip","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":44,"referenced_works":["https://openalex.org/W1975697167","https://openalex.org/W1980781556","https://openalex.org/W1985940938","https://openalex.org/W2020096355","https://openalex.org/W2066835186","https://openalex.org/W2111854888","https://openalex.org/W2164653071","https://openalex.org/W2332908091","https://openalex.org/W2469278928","https://openalex.org/W2786964764","https://openalex.org/W2904275768","https://openalex.org/W2963510238","https://openalex.org/W2965106304","https://openalex.org/W3010268791","https://openalex.org/W3172672177","https://openalex.org/W3189897383","https://openalex.org/W3203144540","https://openalex.org/W4205262662","https://openalex.org/W4220741568","https://openalex.org/W4231081240","https://openalex.org/W4295832479","https://openalex.org/W4319299997","https://openalex.org/W4320032509","https://openalex.org/W4360605965","https://openalex.org/W4360770687","https://openalex.org/W4379382509","https://openalex.org/W4385338657","https://openalex.org/W4386025949","https://openalex.org/W4391092774","https://openalex.org/W4395017567","https://openalex.org/W4396712846","https://openalex.org/W4399013206","https://openalex.org/W4399146412","https://openalex.org/W4401806108","https://openalex.org/W4402259494","https://openalex.org/W4404091802","https://openalex.org/W4404411631","https://openalex.org/W4405306228","https://openalex.org/W4405717320","https://openalex.org/W4405787453","https://openalex.org/W4406387912","https://openalex.org/W4409057707","https://openalex.org/W4409991155","https://openalex.org/W4412128525"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2026-02-09T00:00:00"}