{"id":"https://openalex.org/W7125602799","doi":"https://doi.org/10.1109/tcsi.2026.3652827","title":"An 8-ppm/\u00b0C 100-MHz RC Oscillator With Implicit Temperature Compensation and Resistor Aging Characterization","display_name":"An 8-ppm/\u00b0C 100-MHz RC Oscillator With Implicit Temperature Compensation and Resistor Aging Characterization","publication_year":2026,"publication_date":"2026-01-21","ids":{"openalex":"https://openalex.org/W7125602799","doi":"https://doi.org/10.1109/tcsi.2026.3652827"},"language":null,"primary_location":{"id":"doi:10.1109/tcsi.2026.3652827","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tcsi.2026.3652827","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://doi.org/10.1109/tcsi.2026.3652827","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5021747082","display_name":"Ruhao Xia","orcid":"https://orcid.org/0000-0003-3694-0160"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ruhao Xia","raw_affiliation_strings":["Department of Electrical and Computer Engineering (ECE), University of Illinois Urbana–Champaign, Urbana, IL, USA"],"raw_orcid":"https://orcid.org/0000-0003-3694-0160","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering (ECE), University of Illinois Urbana–Champaign, Urbana, IL, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064808352","display_name":"Kyu-Sang Park","orcid":"https://orcid.org/0000-0003-2515-4682"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kyu-Sang Park","raw_affiliation_strings":["Department of Electrical and Computer Engineering (ECE), University of Illinois Urbana–Champaign, Urbana, IL, USA"],"raw_orcid":"https://orcid.org/0000-0003-2515-4682","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering (ECE), University of Illinois Urbana–Champaign, Urbana, IL, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058351738","display_name":"Ahmed Abdelrahman","orcid":"https://orcid.org/0000-0002-1260-7155"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ahmed E. Abdelrahman","raw_affiliation_strings":["Department of Electrical and Computer Engineering (ECE), University of Illinois Urbana–Champaign, Urbana, IL, USA"],"raw_orcid":"https://orcid.org/0000-0002-1260-7155","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering (ECE), University of Illinois Urbana–Champaign, Urbana, IL, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022341159","display_name":"Nilanjan Pal","orcid":"https://orcid.org/0000-0003-1691-8986"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nilanjan Pal","raw_affiliation_strings":["Department of Electrical and Computer Engineering (ECE), University of Illinois Urbana–Champaign, Urbana, IL, USA"],"raw_orcid":"https://orcid.org/0000-0003-1691-8986","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering (ECE), University of Illinois Urbana–Champaign, Urbana, IL, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086760414","display_name":"Mostafa G. Ahmed","orcid":"https://orcid.org/0000-0002-2636-4713"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mostafa Gamal Ahmed","raw_affiliation_strings":["Department of Electrical and Computer Engineering (ECE), University of Illinois Urbana–Champaign, Urbana, IL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering (ECE), University of Illinois Urbana–Champaign, Urbana, IL, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040013872","display_name":"Mohamed Badr Younis","orcid":"https://orcid.org/0009-0008-7531-1360"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mohamed Badr Younis","raw_affiliation_strings":["Department of Electrical and Computer Engineering (ECE), University of Illinois Urbana–Champaign, Urbana, IL, USA"],"raw_orcid":"https://orcid.org/0009-0008-7531-1360","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering (ECE), University of Illinois Urbana–Champaign, Urbana, IL, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5123779018","display_name":"Yongxin Li","orcid":null},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yongxin Li","raw_affiliation_strings":["Department of Electrical and Computer Engineering (ECE), University of Illinois Urbana–Champaign, Urbana, IL, USA"],"raw_orcid":"https://orcid.org/0000-0003-3812-9793","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering (ECE), University of Illinois Urbana–Champaign, Urbana, IL, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Ji Shi","orcid":"https://orcid.org/0000-0003-4622-1223"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ji Shi","raw_affiliation_strings":["Department of Electrical and Computer Engineering (ECE), University of Illinois Urbana–Champaign, Urbana, IL, USA"],"raw_orcid":"https://orcid.org/0000-0003-4622-1223","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering (ECE), University of Illinois Urbana–Champaign, Urbana, IL, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5123776565","display_name":"Pavan Kumar Hanumolu","orcid":null},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Pavan Kumar Hanumolu","raw_affiliation_strings":["Department of Electrical and Computer Engineering (ECE), University of Illinois Urbana–Champaign, Urbana, IL, USA"],"raw_orcid":"https://orcid.org/0000-0001-7424-1075","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering (ECE), University of Illinois Urbana–Champaign, Urbana, IL, USA","institution_ids":["https://openalex.org/I157725225"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I157725225"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.07893476,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"73","issue":"6","first_page":"3962","last_page":"3974"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.4106999933719635,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.4106999933719635,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.35199999809265137,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.03229999914765358,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.7353000044822693},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.5662999749183655},{"id":"https://openalex.org/keywords/rc-circuit","display_name":"RC circuit","score":0.5562999844551086},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.5044999718666077},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.39660000801086426},{"id":"https://openalex.org/keywords/rc-oscillator","display_name":"RC oscillator","score":0.38339999318122864},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.37220001220703125},{"id":"https://openalex.org/keywords/equivalent-circuit","display_name":"Equivalent circuit","score":0.35670000314712524},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.33559998869895935}],"concepts":[{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.7353000044822693},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.5662999749183655},{"id":"https://openalex.org/C39394816","wikidata":"https://www.wikidata.org/wiki/Q939318","display_name":"RC circuit","level":4,"score":0.5562999844551086},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5224999785423279},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.5044999718666077},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.42800000309944153},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.39660000801086426},{"id":"https://openalex.org/C77366373","wikidata":"https://www.wikidata.org/wiki/Q255596","display_name":"RC oscillator","level":5,"score":0.38339999318122864},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.37220001220703125},{"id":"https://openalex.org/C23572009","wikidata":"https://www.wikidata.org/wiki/Q964981","display_name":"Equivalent circuit","level":3,"score":0.35670000314712524},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.33559998869895935},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3325999975204468},{"id":"https://openalex.org/C78457404","wikidata":"https://www.wikidata.org/wiki/Q1836061","display_name":"RL circuit","level":5,"score":0.3240000009536743},{"id":"https://openalex.org/C108811297","wikidata":"https://www.wikidata.org/wiki/Q214518","display_name":"Admittance","level":3,"score":0.3176000118255615},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.30550000071525574},{"id":"https://openalex.org/C32946077","wikidata":"https://www.wikidata.org/wiki/Q618079","display_name":"Network analysis","level":2,"score":0.29980000853538513},{"id":"https://openalex.org/C8590192","wikidata":"https://www.wikidata.org/wiki/Q1054694","display_name":"Frequency response","level":2,"score":0.2946999967098236},{"id":"https://openalex.org/C131782439","wikidata":"https://www.wikidata.org/wiki/Q1455581","display_name":"Frequency compensation","level":4,"score":0.29100000858306885},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.2822999954223633},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.27950000762939453},{"id":"https://openalex.org/C51297928","wikidata":"https://www.wikidata.org/wiki/Q7001207","display_name":"Network synthesis filters","level":2,"score":0.272599995136261},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.26840001344680786},{"id":"https://openalex.org/C16643434","wikidata":"https://www.wikidata.org/wiki/Q898642","display_name":"Temperature coefficient","level":2,"score":0.263700008392334},{"id":"https://openalex.org/C196796808","wikidata":"https://www.wikidata.org/wiki/Q132629","display_name":"Electrical network","level":2,"score":0.2635999917984009},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2632000148296356},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.25999999046325684},{"id":"https://openalex.org/C178076193","wikidata":"https://www.wikidata.org/wiki/Q6124455","display_name":"Immittance","level":2,"score":0.2599000036716461},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25040000677108765},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.25029999017715454}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2026.3652827","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tcsi.2026.3652827","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/tcsi.2026.3652827","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tcsi.2026.3652827","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.7643170356750488,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2026-01-25T00:00:00"}